Invention Application
- Patent Title: X-RAY TRANSMISSION SPECTROMETER SYSTEM
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Application No.: US15663831Application Date: 2017-07-31
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Publication No.: US20170336334A1Publication Date: 2017-11-23
- Inventor: Wenbing Yun , Srivatsan Seshadri , Janos Kirz , Sylvia Jia Yun Lewis
- Applicant: Sigray, Inc.
- Applicant Address: US CA Concord
- Assignee: Sigray, Inc.
- Current Assignee: Sigray, Inc.
- Current Assignee Address: US CA Concord
- Main IPC: G01N23/207
- IPC: G01N23/207 ; G01N23/087

Abstract:
An x-ray transmission spectrometer system to be used with a compact x-ray source to measure x-ray absorption with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness x-ray source, an optical system with a low pass spectral filter property to focus the x-rays through an object to be examined, and a spectrometer comprising a crystal analyzer (and, in some embodiments, a mosaic crystal) to disperse the transmitted beam, and in some instances an array detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 15 degrees, and be coupled to an optical system that collects and focuses the high flux x-rays to micron-scale spots, leading to high flux density. The x-ray optical system may also act as a “low-pass” filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.
Public/Granted literature
- US10295485B2 X-ray transmission spectrometer system Public/Granted day:2019-05-21
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