Invention Application
- Patent Title: VARIABLE RESISTANCE MEMORY DEVICE AND OPERATING METHOD THEREOF
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Application No.: US15968038Application Date: 2018-05-01
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Publication No.: US20180342297A1Publication Date: 2018-11-29
- Inventor: Gun Hwan KIM , Young Kuk LEE , Taek Mo CHUNG , Bo Keun PARK , Jeong Hwan HAN , Ji Woon CHOI
- Applicant: KOREA RESEARCH INSTITUTE OF CHEMICAL TECHNOLOGY
- Applicant Address: KR Daejeon
- Assignee: KOREA RESEARCH INSTITUTE OF CHEMICAL TECHNOLOGY
- Current Assignee: KOREA RESEARCH INSTITUTE OF CHEMICAL TECHNOLOGY
- Current Assignee Address: KR Daejeon
- Priority: KR10-2017-0064484 20170525
- Main IPC: G11C13/00
- IPC: G11C13/00 ; G11C11/56

Abstract:
There are provided a variable resistance memory device and an operating method thereof. In a method for operating a variable resistance memory device, the method includes programming multi-bit data in a multi-bit variable resistance memory cell of the variable resistance memory device, wherein the programming includes: generating sequentially increased program voltage pulses, based on the multi-bit data; and applying the program voltage pulses to the multi-bit variable resistance memory cell, wherein a current-voltage curve of the multi-bit variable resistance memory cell exhibits a self-compliance characteristic, wherein the program voltage pulses are included in a voltage section having the self-compliance characteristic.
Public/Granted literature
- US10770139B2 Variable resistance memory device and operating method thereof Public/Granted day:2020-09-08
Information query