- 专利标题: MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE
-
申请号: US15603465申请日: 2017-05-24
-
公开(公告)号: US20180342394A1公开(公告)日: 2018-11-29
- 发明人: Zhi Qiang Mu , Chow Yee Lim , Hui Yang , YONG BIN FAN , JIANJUN YANG , Chih-Chien Chang
- 申请人: UNITED MICROELECTRONICS CORP.
- 主分类号: H01L21/28
- IPC分类号: H01L21/28 ; H01L21/02 ; H01L29/49 ; H01L29/51
摘要:
A manufacturing method of a semiconductor structure includes the following steps. A first polysilicon layer is formed on a substrate. A planarization process to the first polysilicon layer is performed. A first etching back process to the first polysilicon layer is performed after the planarization process. A second etching back process to the first polysilicon layer is performed after the first etching back process. A first wet clean process to the first polysilicon layer is performed after the first etching back process and before the second etching back process.
公开/授权文献
- US10141194B1 Manufacturing method of semiconductor structure 公开/授权日:2018-11-27
信息查询
IPC分类: