Invention Application
- Patent Title: ESTIMATING AN ERROR RATE ASSOCIATED WITH MEMORY
-
Application No.: US16752859Application Date: 2020-01-27
-
Publication No.: US20200159616A1Publication Date: 2020-05-21
- Inventor: Sivagnanam Parthasarathy , Mustafa N. Kaynak , Patrick R. Khayat , Nicholas J. Richardson
- Applicant: Micron Technology, Inc.
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G11C29/00 ; G06F11/08 ; G06F11/07 ; G11C29/56 ; G11C29/52 ; H03M13/00 ; H03M13/37 ; G11C11/56 ; H03M13/11

Abstract:
The present disclosure includes apparatuses and methods for estimating an error rate associated with memory. A number of embodiments include sensing data stored in a memory, performing an error detection operation on the sensed data, determining a quantity of parity violations associated with the error detection operation, and estimating an error rate associated with the memory based on the determined quantity of parity violations.
Public/Granted literature
- US11334413B2 Estimating an error rate associated with memory Public/Granted day:2022-05-17
Information query