Invention Application
- Patent Title: Sample Processing Improvements For Microscopy
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Application No.: US17696704Application Date: 2022-03-16
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Publication No.: US20220206282A1Publication Date: 2022-06-30
- Inventor: Alan Marc Fine , Hershel Macaulay , Noah Hymes-Vandermeulen
- Applicant: Alentic Microscience Inc.
- Applicant Address: CA Halifax
- Assignee: Alentic Microscience Inc.
- Current Assignee: Alentic Microscience Inc.
- Current Assignee Address: CA Halifax
- Main IPC: G02B21/34
- IPC: G02B21/34 ; G01N21/59 ; G01N1/40 ; G01N15/06 ; G01N1/28 ; G01N15/14 ; G01N33/49

Abstract:
Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains at least part of the sample. There is a mechanism configured to move the second surface from an initial position into the predefined position to form the sample space. When the sample is in place on the first surface, the motion of the second surface includes a trajectory that is not solely a linear motion of the second surface towards the first surface.
Public/Granted literature
- US11874452B2 Sample processing improvements for microscopy Public/Granted day:2024-01-16
Information query
IPC分类:
G | 物理 |
G02 | 光学 |
G02B | 光学元件、系统或仪器 |
G02B21/00 | 显微镜 |
G02B21/34 | .显微镜载物片,例如,在载物片上安装试样 |