Invention Application
- Patent Title: FILM FORMING METHOD AND FILM FORMING APPARATUS
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Application No.: US17577656Application Date: 2022-01-18
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Publication No.: US20220235462A1Publication Date: 2022-07-28
- Inventor: Hirokazu UEDA , Hideki YUASA , Yutaka FUJINO , Yoshiyuki KONDO , Hiroyuki IKUTA
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Priority: JP2021-009876 20210125
- Main IPC: C23C16/455
- IPC: C23C16/455 ; H01L21/02 ; H01J37/32 ; C23C16/34 ; C23C16/36 ; C23C16/511

Abstract:
A film forming method includes: placing a substrate on which a pattern, which includes a plurality of convex and concave portions, is formed on a stage disposed inside a chamber; and selectively forming a silicon-containing film on the plurality of convex portions of the pattern by applying a bias power to the stage and introducing microwaves into the chamber while supplying a processing gas containing a silicon-containing gas and a nitrogen-containing gas into the chamber to generate plasma, wherein the selectively forming the silicon-containing film includes a first film formation of forming a silicon-containing film around upper sides of the plurality of convex portions and a second film formation of forming a silicon-containing film on upper portions of the plurality of convex portions.
Public/Granted literature
- US12060641B2 Film forming method and film forming apparatus Public/Granted day:2024-08-13
Information query
IPC分类: