Invention Application
- Patent Title: Bottom Lateral Expansion of Contact Plugs Through Implantation
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Application No.: US17814981Application Date: 2022-07-26
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Publication No.: US20220359286A1Publication Date: 2022-11-10
- Inventor: Meng-Han Chou , Su-Hao Liu , Kuo-Ju Chen , Liang-Yin Chen , Huicheng Chang , Yee-Chia Yeo
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/532 ; H01L29/08 ; H01L29/417 ; H01L29/45 ; H01L21/285 ; H01L21/311 ; H01L21/3213 ; H01L21/3215 ; H01L29/66 ; H01L23/535 ; H01L29/78

Abstract:
A method includes forming a metallic feature, forming an etch stop layer over the metallic feature, implanting the metallic feature with a dopant, forming a dielectric layer over the etch stop layer, performing a first etching process to etch the dielectric layer and the etch stop layer to form a first opening, performing a second etching process to etch the metallic feature and to form a second opening in the metallic feature, wherein the second opening is joined with the first opening, and filling the first opening and the second opening with a metallic material to form a contact plug.
Public/Granted literature
- US12183632B2 Bottom lateral expansion of contact plugs through implantation Public/Granted day:2024-12-31
Information query
IPC分类: