A test and measurement instrument has a user interface, one or more probes to allow the instrument to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: receive one or more user inputs through the user interface, at least one of the user inputs to identify at least one analysis to be performed on the DUT, receive waveform data from the DUT when the DUT is activated by application of power from a power supply, and application of one of a first and second pulse or multiple pulses from a source instrument, perform the at least one analysis on the waveform data, and display the waveform data and analysis on the user interface. A method of automatically performing a double pulse test and analysis on a device under test (DUT) includes receiving a user input through a user interface on a test and measurement instrument, the user input to identify at least one analysis to be performed on waveform data received from the DUT, receiving the waveform data from the DUT when the DUT is activated by application of power from a power supply, and application of one of a first and a second pulse or multiple pulses from a source instrument, performing the analysis on the waveform data, and displaying the waveform data and analysis on the user interface.