-
公开(公告)号：US20230133047A1
公开(公告)日：2023-05-04
申请号：US17976644
申请日：2022-10-28
申请人： Tektronix, Inc.
发明人： Vivek Shivaram , Niranjan R Hegde , Parjanya Adiga , Krishna N H Sri , Tsuyoshi Miyazaki , Yogesh M. Pai , Venkatraj Melinamane
IPC分类号： G01R31/28
摘要： A test and measurement instrument has a user interface, one or more probes to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: receive waveform data from the DUT after activation of the DUT by application of power from a power supply, and application of at least a first and second pulse from a source instrument, locate one or more reverse recovery regions in the waveform data, determine a reverse recovery time for the DUT from the reverse recovery region, and display a reverse recovery plot of the one or more reverse recovery regions on the user interface, the reverse recovery plot being automatically configured to display one or more of the reverse recovery regions, and including at least one characteristic for the one or more reverser recovery regions annotated on the reverse recovery plot. A method of providing reverse recovery measurements for a device under test (DUT) includes receiving waveform data through the probes from the DUT after activation of the DUT by application of power from a power supply, and application of a first and second pulse from a source instrument, locating one or more reverse recovery regions in the waveform data, determining a reverse recovery time for the DUT for the one or more reverse recovery regions, and displaying a reverse recovery plot of the one or more reverse recovery regions on the user interface, the reverse recovery plot being automatically configured to display the one or more reverse recovery regions, and including at least one characteristic of the one or more reverse recovery regions annotated on the reverse recovery plot.
-
公开(公告)号：US12020855B2
公开(公告)日：2024-06-25
申请号：US17315022
申请日：2021-05-07
申请人： Tektronix, Inc.
CPC分类号： H01F27/346 , G01R33/14 , H01F3/10 , H01F27/24 , H01F27/42 , H01F2003/106 , H01F2027/348
摘要： A test and measurement instrument for determining magnetic core losses of a device under test during in circuit operation. The test and measurement instrument receives a primary current signal from a primary winding of a device under test and receives a primary voltage signal measured across a magnetic core of the device under test. Based on the primary electric current signal and the primary voltage signal, the test and measurement instrument determines a magnetic loss of the device under test. In some examples, the test and measurement instrument can use primary and secondary voltage and current inputs to determine the magnetic loss of the device under test. The magnetic loss of the device under test can be displayed on a display of the test and measurement instrument. The magnetic loss can include a total magnetic loss, a hysteresis loss, a copper loss, and/or other losses.
-
公开(公告)号：US11275131B1
公开(公告)日：2022-03-15
申请号：US16599067
申请日：2019-10-10
申请人： Tektronix, Inc.
摘要： A test and measurement instrument, including at least one port configured to receive a signal from a device under test (DUT), the signal including a current signal acquired across a magnetic core of the DUT and a voltage signal acquired across the magnetic core of the DUT, and one or more processors. The one or more processors are configured to determine a hysteresis loop based on the current signal and the voltage signal, determine a magnetic flux of the magnetic core based on the voltage signal and the current signal for a number of sample points for each cycle, and determine a maximum magnetic flux for all cycles and a hysteresis loop cycle that corresponds to the maximum magnetic flux. A display configured to display at least one of the hysteresis loop, the signal received from the DUT, and the hysteresis loop cycle that corresponds to the maximum magnetic flux.
-
公开(公告)号：US20240345166A1
公开(公告)日：2024-10-17
申请号：US18629865
申请日：2024-04-08
申请人： Tektronix, Inc.
IPC分类号： G01R31/34
CPC分类号： G01R31/343
摘要： A test and measurement instrument includes one or more processors to acquire first, second, and third phase drive signals applied to a three-phase motor. A motor drive analyzer performs a direct-quadrature-zero, DQZ, transformation on the acquired first, second, and third phase drive signals to produce direct (D), quadrature (Q), and zero (Z) components, and generates an overlapped DQ phasor plot illustrating the D and Q components along with frequency domain representations of the D and Q components. The motor driver analyzer displays, on a user interface, the generated overlapped DQ phasor plot and an overlapped DQ spectra plot from the frequency domain representations of the D and Q components to enable a user to detect motor defects through visual characteristics of the overlapped DQ phasor and DQ spectra plots. The motor driver analyzer removes an offset and filters the D and Q components prior generating the overlapped DQ phasor plot.
-
公开(公告)号：US20230133743A1
公开(公告)日：2023-05-04
申请号：US17976617
申请日：2022-10-28
申请人： Tektronix, Inc.
发明人： Vivek Shivaram , Niranjan R Hegde , Parjanya Adiga , Krishna N H Sri , Tsuyoshi Miyazaki , Yogesh M. Pai , Venkatraj Melinamane
IPC分类号： G01R31/28
摘要： A test and measurement instrument has a user interface, one or more probes to allow the instrument to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: receive one or more user inputs through the user interface, at least one of the user inputs to identify at least one analysis to be performed on the DUT, receive waveform data from the DUT when the DUT is activated by application of power from a power supply, and application of one of a first and second pulse or multiple pulses from a source instrument, perform the at least one analysis on the waveform data, and display the waveform data and analysis on the user interface. A method of automatically performing a double pulse test and analysis on a device under test (DUT) includes receiving a user input through a user interface on a test and measurement instrument, the user input to identify at least one analysis to be performed on waveform data received from the DUT, receiving the waveform data from the DUT when the DUT is activated by application of power from a power supply, and application of one of a first and a second pulse or multiple pulses from a source instrument, performing the analysis on the waveform data, and displaying the waveform data and analysis on the user interface.
-
公开(公告)号：US20210358685A1
公开(公告)日：2021-11-18
申请号：US17315022
申请日：2021-05-07
申请人： Tektronix, Inc.
摘要： A test and measurement instrument for determining magnetic core losses of a device under test during in circuit operation. The test and measurement instrument receives a primary current signal from a primary winding of a device under test and receives a primary voltage signal measured across a magnetic core of the device under test. Based on the primary electric current signal and the primary voltage signal, the test and measurement instrument determines a magnetic loss of the device under test. In some examples, the test and measurement instrument can use primary and secondary voltage and current inputs to determine the magnetic loss of the device under test. The magnetic loss of the device under test can be displayed on a display of the test and measurement instrument. The magnetic loss can include a total magnetic loss, a hysteresis loss, a copper loss, and/or other losses.
-
-
-
-
-
搜索结果
6 条记录 (耗时 0.014 秒)
