公开(公告)号：US20240044968A1

公开(公告)日：2024-02-08

申请号：US18361672

申请日：2023-07-28

Applicant: Tektronix, Inc.

Inventor： Vivek Shivaram ,  Niranjan R. Hegde ,  Krishna N H Sri ,  Abhishek Naik ,  Shubha B ,  Yogesh M. Pai ,  Venkatraj Melinamane

IPC: G01R31/26 ,  G01R31/28 ,  G01R1/067

CPC classification number: G01R31/2603 ,  G01R31/2889 ,  G01R1/06788

Abstract: A test and measurement instrument includes a user interface, one or more probes to connect to a device under test (DUT), and one or more processors to take measurements during application of a double pulse test to the DUT to create measurement data, identify a measurement start point, find a measurement stop point, use the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and display the output charge to a user. A method of determining output charge of a device under test (DUT) includes taking measurements during application of a double pulse test to create measurement data, identifying a measurement start point, finding a measurement stop point, using the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and displaying the output charge.

公开(公告)号：US20230251699A1

公开(公告)日：2023-08-10

申请号：US18105736

申请日：2023-02-03

Applicant: Tektronix, Inc.

Inventor： Madhusudan Acharya ,  Yogesh M. Pai ,  Krishna N H Sri ,  Anthony B. Ambrose ,  Blair Battye ,  Dallas J. Mohler

IPC: G06F1/30 ,  G06F1/28

CPC classification number: G06F1/305 ,  G06F1/28

Abstract: A test and measurement instrument includes components and methods for measuring noise at an output of a power supply, measuring jitter of a serial data signal produced by a data generating circuit coupled to the power supply and correlating the noise measured from the power supply to the jitter of the serial data signal. The correlation may be performed in the frequency domain. Spectral plots of the measured noise and the measured jitter may be generated and presented to the user.

公开(公告)号：US20240353470A1

公开(公告)日：2024-10-24

申请号：US18641314

申请日：2024-04-19

Applicant: Tektronix, Inc.

Inventor： Niranjan R. Hegde ,  Daniel G. Knierim ,  Vivek Shivaram ,  Krishna N H Sri ,  Joshua J. O'Brien ,  Shubha B ,  Yogesh M. Pai

IPC: G01R31/26

CPC classification number: G01R31/2621

Abstract: A test and measurement system includes a device under test (DUT) interface structured to couple to at least one DUT and a measurement instrument coupled to the interface. The instrument includes one or more processors configured to, when testing the DUT, accept a measurement signal at a first input channel and generate a first sample waveform from the measurement signal using a first set of parameters, accept the measurement signal at a second input channel and generate a second sample from the measurement signal using a second set of parameters, and generate a measurement waveform from a combination of the first sample waveform and the second sample waveform. Additionally, the measurement instrument is structured to determine settling errors in the first pulse of a double-pulse test, and then compensate measurements made in subsequent pulses for the settling errors.

公开(公告)号：US20230133047A1

公开(公告)日：2023-05-04

申请号：US17976644

申请日：2022-10-28

Applicant: Tektronix, Inc.

Inventor： Vivek Shivaram ,  Niranjan R Hegde ,  Parjanya Adiga ,  Krishna N H Sri ,  Tsuyoshi Miyazaki ,  Yogesh M. Pai ,  Venkatraj Melinamane

IPC: G01R31/28

Abstract: A test and measurement instrument has a user interface, one or more probes to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: receive waveform data from the DUT after activation of the DUT by application of power from a power supply, and application of at least a first and second pulse from a source instrument, locate one or more reverse recovery regions in the waveform data, determine a reverse recovery time for the DUT from the reverse recovery region, and display a reverse recovery plot of the one or more reverse recovery regions on the user interface, the reverse recovery plot being automatically configured to display one or more of the reverse recovery regions, and including at least one characteristic for the one or more reverser recovery regions annotated on the reverse recovery plot. A method of providing reverse recovery measurements for a device under test (DUT) includes receiving waveform data through the probes from the DUT after activation of the DUT by application of power from a power supply, and application of a first and second pulse from a source instrument, locating one or more reverse recovery regions in the waveform data, determining a reverse recovery time for the DUT for the one or more reverse recovery regions, and displaying a reverse recovery plot of the one or more reverse recovery regions on the user interface, the reverse recovery plot being automatically configured to display the one or more reverse recovery regions, and including at least one characteristic of the one or more reverse recovery regions annotated on the reverse recovery plot.

公开(公告)号：US20230133743A1

公开(公告)日：2023-05-04

申请号：US17976617

申请日：2022-10-28

Applicant: Tektronix, Inc.

Inventor： Vivek Shivaram ,  Niranjan R Hegde ,  Parjanya Adiga ,  Krishna N H Sri ,  Tsuyoshi Miyazaki ,  Yogesh M. Pai ,  Venkatraj Melinamane

IPC: G01R31/28

Abstract: A test and measurement instrument has a user interface, one or more probes to allow the instrument to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: receive one or more user inputs through the user interface, at least one of the user inputs to identify at least one analysis to be performed on the DUT, receive waveform data from the DUT when the DUT is activated by application of power from a power supply, and application of one of a first and second pulse or multiple pulses from a source instrument, perform the at least one analysis on the waveform data, and display the waveform data and analysis on the user interface. A method of automatically performing a double pulse test and analysis on a device under test (DUT) includes receiving a user input through a user interface on a test and measurement instrument, the user input to identify at least one analysis to be performed on waveform data received from the DUT, receiving the waveform data from the DUT when the DUT is activated by application of power from a power supply, and application of one of a first and a second pulse or multiple pulses from a source instrument, performing the analysis on the waveform data, and displaying the waveform data and analysis on the user interface.

公开(公告)号：US20220413051A1

公开(公告)日：2022-12-29

申请号：US17849577

申请日：2022-06-24

Applicant: Tektronix, Inc.

Inventor： Parjanya Adiga ,  Niranjan R. Hegde ,  Krishna N H. Sri ,  Gary J. Waldo ,  Yogesh M. Pai

IPC: G01R31/34 ,  H02P6/18 ,  H02P21/18 ,  H02P25/026 ,  H02P27/08

Abstract: A test and measurement instrument includes one or more sensors configured to measure a mechanical position of a synchronous machine driven by analog three-phase signals, a converter to determine an instantaneous electrical angle from the measured mechanical position, a transform configured to generate DQ0 signals based on the instantaneous electrical angle, and a vector generator structured to produce a resultant vector from the DQ0 signals. Methods are also described.

公开(公告)号：US12092693B2

公开(公告)日：2024-09-17

申请号：US17849577

申请日：2022-06-24

Applicant: Tektronix, Inc.

Inventor： Parjanya Adiga ,  Niranjan R. Hegde ,  Krishna N H. Sri ,  Gary J. Waldo ,  Yogesh M. Pai

IPC: G01R31/34 ,  H02P6/18 ,  H02P21/18 ,  H02P25/026 ,  H02P27/08

CPC classification number: G01R31/343 ,  H02P6/18 ,  H02P21/18 ,  H02P25/026 ,  H02P27/08 ,  H02P2207/05

Abstract: A test and measurement instrument includes one or more sensors configured to measure a mechanical position of a synchronous machine driven by analog three-phase signals, a converter to determine an instantaneous electrical angle from the measured mechanical position, a transform configured to generate DQ0 signals based on the instantaneous electrical angle, and a vector generator structured to produce a resultant vector from the DQ0 signals. Methods are also described.

公开(公告)号：US20240036143A1

公开(公告)日：2024-02-01

申请号：US18359789

申请日：2023-07-26

Applicant: Tektronix, Inc.

Inventor： Shubha B ,  Krishna N H Sri ,  Sathish Kumar K ,  Yogesh M. Pai

IPC: G01R35/00 ,  G01R31/26

CPC classification number: G01R35/005 ,  G01R31/2601

Abstract: A system for measuring characteristics of wide bandgap Devices Under Test (DUTs) includes a testing fixture including one or more wide bandgap DUTs, and a measurement instrument having one or more processors configured to apply a stimulus to provoke a response of one or more wide bandgap DUTs, measure the response, graph the response on one or more displays, each display having a vertical scale, and automatically adjusting the vertical scale of the one or more displays until no clipping occurs in the one or more displays. Methods of dynamically configuring a test and measurement instrument based on a particular testing setup are also described.

公开(公告)号：US20240027513A1

公开(公告)日：2024-01-25

申请号：US18220222

申请日：2023-07-10

Applicant: Tektronix, Inc.

Inventor： Vivek Shivaram ,  Niranjan R. Hedge ,  Shubha B ,  Krishna N H Sri ,  Yogesh M. Pai ,  Venkatraj Melinamane

IPC: G01R31/26

CPC classification number: G01R31/2608

Abstract: A system for determining an amount of time skew between two measurement probes includes a first probe and a second probe and one or more processors configured to measure a current signal from a Device Under Test (DUT) through the first probe, measure a voltage signal from the DUT through the second probe, generate a modeled voltage signal from the measured current signal, compare the modeled voltage signal to the measured voltage signal, and determine the amount of time skew between the first and the second probe from the compared signals. Methods are also described.