- 专利标题: Cooling fin connected to a cooling unit and a pusher of the testing apparatus
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申请号: US10716613申请日: 2003-11-20
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公开(公告)号: US06919734B2公开(公告)日: 2005-07-19
- 发明人: Noboru Saito , Hiroyuki Takahashi , Noriyuki Igarashi , Keiichi Fukumoto , Hiroto Nakamura , Yutaka Watanabe , Kenichi Shimada
- 申请人: Noboru Saito , Hiroyuki Takahashi , Noriyuki Igarashi , Keiichi Fukumoto , Hiroto Nakamura , Yutaka Watanabe , Kenichi Shimada
- 申请人地址: JP Tokyo
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 优先权: JP10-333864 19981125; JP10-351357 19981210; JP10-364356 19981222
- 主分类号: G01R31/26
- IPC分类号: G01R31/26 ; G01R1/04 ; G01R31/00 ; G01R31/01 ; G01R31/02 ; G01R31/28 ; G01R31/303
摘要:
A device testing apparatus including a connection terminal to which an electronic device under test is detachably attached, a pusher for pushing the electronic device in the direction of the connection terminal so as to connect the electronic device to the connection terminal, and a cooling unit for cooling the electronic device. As the cooling unit, an element cooling the device using electricity is for example used. The cooling unit includes a cooling medium blower for blowing a cooling medium around the electronic device and heat exchange projections or depressions for raising the cooling efficiency by blowing a cooling medium. In the device testing apparatus, even if the electronic device generates heat on its own during testing, the electronic device is cooled through the pusher, connection terminals, or socket, so the effect of the heat generated by the electronic device is canceled out and the electronic device can be tested at the predetermined temperature as prescribed in the specification.
公开/授权文献
- US20040070416A1 Device testing apparatus 公开/授权日:2004-04-15