公开(公告)号：US07362117B2

公开(公告)日：2008-04-22

申请号：US11483075

申请日：2006-07-10

申请人： Noboru Saito ,  Hiroyuki Takahashi ,  Noriyuki Igarashi ,  Keiichi Fukumoto ,  Hiroto Nakamura ,  Yutaka Watanabe ,  Kenichi Shimada

发明人： Noboru Saito ,  Hiroyuki Takahashi ,  Noriyuki Igarashi ,  Keiichi Fukumoto ,  Hiroto Nakamura ,  Yutaka Watanabe ,  Kenichi Shimada

IPC分类号： G01R31/02

CPC分类号： G01R31/01 ,  G01R1/0458 ,  G01R31/2806 ,  G01R31/2862 ,  G01R31/2863 ,  G01R31/2868 ,  G01R31/2877

摘要： A device testing apparatus including a connection terminal to which an electronic device under test is detachably attached, a pusher for pushing the electronic device in the direction of the connection terminal so as to connect the electronic device to the connection terminal, and a cooling unit for cooling the electronic device. As the cooling unit, an element cooling the device using electricity is for example used. The cooling unit includes a cooling medium blower for blowing a cooling medium around the electronic device and heat exchange projections or depressions for raising the cooling efficiency by blowing a cooling medium. In the device testing apparatus, even if the electronic device generates heat on its own during testing, the electronic device is cooled through the pusher, connection terminals, or socket, so the effect of the heat generated by the electronic device is canceled out and the electronic device can be tested at the predetermined temperature as prescribed in the specification.

摘要翻译： 一种装置测试装置，包括可拆卸地安装有被测试的电子设备的连接端子，用于沿着连接端子的方向推动电子设备以将电子设备连接到连接端子的推动器，以及用于 冷却电子设备。 作为冷却单元，例如使用电力冷却装置的元件。 冷却单元包括用于吹送电子设备周围的冷却介质的冷却介质鼓风机和通过吹送冷却介质而提高冷却效率的热交换突起或凹部。 在设备测试装置中，即使电子设备在测试期间自身产生热量，电子设备通过推动器，连接端子或插座被冷却，因此电子设备产生的热量的影响被消除，并且 电子设备可以按照说明书中规定的预定温度进行测试。

公开(公告)号：US20050225346A1

公开(公告)日：2005-10-13

申请号：US11148386

申请日：2005-06-09

申请人： Noboru Saito ,  Hiroyuki Takahashi ,  Noriyuki Igarashi ,  Keiichi Fukumoto ,  Hiroto Nakamura ,  Yutaka Watanabe ,  Kenichi Shimada

发明人： Noboru Saito ,  Hiroyuki Takahashi ,  Noriyuki Igarashi ,  Keiichi Fukumoto ,  Hiroto Nakamura ,  Yutaka Watanabe ,  Kenichi Shimada

IPC分类号： G01R31/26 ,  G01R1/04 ,  G01R31/00 ,  G01R31/01 ,  G01R31/02 ,  G01R31/28 ,  G01R31/303

CPC分类号： G01R31/01 ,  G01R1/0458 ,  G01R31/2806 ,  G01R31/2862 ,  G01R31/2863 ,  G01R31/2868 ,  G01R31/2877

摘要： A device testing apparatus including a connection terminal to which an electronic device under test is detachably attached, a pusher for pushing the electronic device in the direction of the connection terminal so as to connect the electronic device to the connection terminal, and a cooling unit for cooling the electronic device. As the cooling unit, an element cooling the device using electricity is for example used. The cooling unit includes a cooling medium blower for blowing a cooling medium around the electronic device and heat exchange projections or depressions for raising the cooling efficiency by blowing a cooling medium. In the device testing apparatus, even if the electronic device generates heat on its own during testing, the electronic device is cooled through the pusher, connection terminals, or socket, so the effect of the heat generated by the electronic device is canceled out and the electronic device can be tested at the predetermined temperature as prescribed in the specification.

摘要翻译： 一种装置测试装置，包括可拆卸地安装有被测试的电子设备的连接端子，用于沿着连接端子的方向推动电子设备以将电子设备连接到连接端子的推动器，以及用于 冷却电子设备。 作为冷却单元，例如使用电力冷却装置的元件。 冷却单元包括用于吹送电子设备周围的冷却介质的冷却介质鼓风机和通过吹送冷却介质而提高冷却效率的热交换突起或凹部。 在设备测试装置中，即使电子设备在测试期间自身产生热量，电子设备通过推动器，连接端子或插座被冷却，因此电子设备产生的热量的影响被消除，并且 电子设备可以按照说明书中规定的预定温度进行测试。

公开(公告)号：US06919734B2

公开(公告)日：2005-07-19

申请号：US10716613

申请日：2003-11-20

申请人： Noboru Saito ,  Hiroyuki Takahashi ,  Noriyuki Igarashi ,  Keiichi Fukumoto ,  Hiroto Nakamura ,  Yutaka Watanabe ,  Kenichi Shimada

发明人： Noboru Saito ,  Hiroyuki Takahashi ,  Noriyuki Igarashi ,  Keiichi Fukumoto ,  Hiroto Nakamura ,  Yutaka Watanabe ,  Kenichi Shimada

IPC分类号： G01R31/26 ,  G01R1/04 ,  G01R31/00 ,  G01R31/01 ,  G01R31/02 ,  G01R31/28 ,  G01R31/303

CPC分类号： G01R31/01 ,  G01R1/0458 ,  G01R31/2806 ,  G01R31/2862 ,  G01R31/2863 ,  G01R31/2868 ,  G01R31/2877

摘要： A device testing apparatus including a connection terminal to which an electronic device under test is detachably attached, a pusher for pushing the electronic device in the direction of the connection terminal so as to connect the electronic device to the connection terminal, and a cooling unit for cooling the electronic device. As the cooling unit, an element cooling the device using electricity is for example used. The cooling unit includes a cooling medium blower for blowing a cooling medium around the electronic device and heat exchange projections or depressions for raising the cooling efficiency by blowing a cooling medium. In the device testing apparatus, even if the electronic device generates heat on its own during testing, the electronic device is cooled through the pusher, connection terminals, or socket, so the effect of the heat generated by the electronic device is canceled out and the electronic device can be tested at the predetermined temperature as prescribed in the specification.

公开(公告)号：US20060255822A1

公开(公告)日：2006-11-16

申请号：US11483075

申请日：2006-07-10

申请人： Noboru Saito ,  Hiroyuki Takahashi ,  Noriyuki Igarashi ,  Keiichi Fukumoto ,  Hiroto Nakamura ,  Yutaka Watanabe ,  Kenichi Shimada

发明人： Noboru Saito ,  Hiroyuki Takahashi ,  Noriyuki Igarashi ,  Keiichi Fukumoto ,  Hiroto Nakamura ,  Yutaka Watanabe ,  Kenichi Shimada

IPC分类号： G01R31/02

CPC分类号： G01R31/01 ,  G01R1/0458 ,  G01R31/2806 ,  G01R31/2862 ,  G01R31/2863 ,  G01R31/2868 ,  G01R31/2877

摘要： A device testing apparatus including a connection terminal to which an electronic device under test is detachably attached, a pusher for pushing the electronic device in the direction of the connection terminal so as to connect the electronic device to the connection terminal, and a cooling unit for cooling the electronic device. As the cooling unit, an element cooling the device using electricity is for example used. The cooling unit includes a cooling medium blower for blowing a cooling medium around the electronic device and heat exchange projections or depressions for raising the cooling efficiency by blowing a cooling medium. In the device testing apparatus, even if the electronic device generates heat on its own during testing, the electronic device is cooled through the pusher, connection terminals, or socket, so the effect of the heat generated by the electronic device is canceled out and the electronic device can be tested at the predetermined temperature as prescribed in the specification.

摘要翻译： 一种装置测试装置，包括可拆卸地安装有被测试的电子设备的连接端子，用于沿着连接端子的方向推动电子设备以将电子设备连接到连接端子的推动器，以及用于 冷却电子设备。 作为冷却单元，例如使用电力冷却装置的元件。 冷却单元包括用于吹送电子设备周围的冷却介质的冷却介质鼓风机和通过吹送冷却介质而提高冷却效率的热交换突起或凹部。 在设备测试装置中，即使电子设备在测试期间自身产生热量，电子设备通过推动器，连接端子或插座被冷却，因此电子设备产生的热量的影响被消除，并且 电子设备可以按照说明书中规定的预定温度进行测试。

公开(公告)号：US06445203B1

公开(公告)日：2002-09-03

申请号：US09456408

申请日：1999-12-08

申请人： Tsuyoshi Yamashita ,  Yoshihito Kobayashi ,  Toshiyuki Kiyokawa ,  Hiroto Nakamura ,  Noriyuki Igarashi ,  Kenichi Shimada

发明人： Tsuyoshi Yamashita ,  Yoshihito Kobayashi ,  Toshiyuki Kiyokawa ,  Hiroto Nakamura ,  Noriyuki Igarashi ,  Kenichi Shimada

IPC分类号： G01R3102

CPC分类号： G01R31/2874 ,  G01R31/2806 ,  G01R31/2856 ,  G01R31/2863

摘要： An electric device testing apparatus comprises a connection terminal to which an IC chip to be tested is removably connected, a pusher for pushing the IC chip in the direction of the connection terminal in order to connect the IC chip to the connection terminal, and temperature adjusted air supply for blowing a temperature adjusted air to around the IC chip during a test on the IC chip via a through hole formed on the pushed.

摘要翻译： 一种电气设备测试装置，包括：被测试的IC芯片可拆卸地连接到的连接端子，用于沿着连接端子的方向推动IC芯片的推动器，以将IC芯片连接到连接端子，并且温度调节 用于在通过形成在所述推动件上的通孔对IC芯片进行测试期间将温度调节的空气吹送到IC芯片周围。

公开(公告)号：US6111246A

公开(公告)日：2000-08-29

申请号：US832774

申请日：1997-04-04

申请人： Yutaka Watanabe ,  Hiroto Nakamura ,  Toshio Yabe ,  Michirou Chiba

发明人： Yutaka Watanabe ,  Hiroto Nakamura ,  Toshio Yabe ,  Michirou Chiba

IPC分类号： G01R31/26 ,  G01R31/28 ,  G01R31/319 ,  G01V8/12 ,  G01V8/20 ,  H01L23/32 ,  H01J40/14

CPC分类号： G01R31/2834 ,  G01R31/2887 ,  G01R31/31907 ,  G01R31/31912

摘要： A semiconductor device testing apparatus in which ICs to be tested are transferred to a test tray TST in a loader section, the test tray is transported into a test section to test the ICs, after the completion of the test, the tested ICs on the test tray are transferred from the test tray onto a general-purpose tray in an unloader section, and the test tray which has been emptied of the tested ICs is transported to the loader section, and the above operation is repeated, and which can detect whether there is an IC on the test tray or not is provided. An IC detecting sensor for monitoring whether an IC exists on the test tray or not is provided at at least one of the positions between the unloader section and the loader section, the loader section and the test section, and the test section and the unloader section. A through-hole is provided in the bottom portion of each IC carrier mounted to the test tray, and whether an IC carrier mounted to the test tray is empty or not is determined by detecting light transmitted through the through-hole by the IC detecting sensor.

摘要翻译： 将要测试的IC转移到装载器部分中的测试托盘TST的半导体器件测试装置，在测试完成之后将测试托盘运送到测试部分以测试IC，测试的IC在测试中 托盘从测试托盘转移到卸载机部分的通用托盘中，并且已经将被测试的IC排空的测试托盘被运送到加载器部分，并且重复上述操作，并且可以检测是否存在 是否提供了测试托盘上的IC。 在卸载部与装载部之间，装载部和试验部以及试验部和卸载部之间的至少一个位置设置有用于监视IC上是否存在IC的IC检测传感器 。 通过检测通过IC检测传感器透过通孔的光来确定安装在测试托盘上的每个IC载体的底部以及安装在测试盘上的IC载体是否为空的通孔 。

公开(公告)号：US07601417B2

公开(公告)日：2009-10-13

申请号：US10469282

申请日：2002-12-18

申请人： Hiroto Nakamura ,  Akio Owatari ,  Masataka Kamijo ,  Yasuko Hirano

发明人： Hiroto Nakamura ,  Akio Owatari ,  Masataka Kamijo ,  Yasuko Hirano

IPC分类号： B32B3/02 ,  B32B3/00

CPC分类号： B41M3/148 ,  B41M3/14 ,  B42D25/29 ,  B42D2033/18 ,  G01N21/21 ,  G01N2021/216 ,  G07D7/128 ,  G07D7/205 ,  G09F3/0292 ,  Y10S428/916 ,  Y10T428/24372 ,  Y10T428/24802 ,  Y10T428/24893 ,  Y10T428/252

摘要： An object is to provide a recorded article or sticker whereby counterfeited articles and genuine articles can be visually distinguished in simple fashion in the market and wherein it is not possible to identify in the market the location and type of the anti-counterfeiting measures that have been taken. Both an overt region 3 (which can be recognized visually in the market) are printing using a color-change ink or liquid-crystal ink, for example, and a covert region 5 formed by for example optical retro-reflective printing (which cannot be recognized without using a special tool) are provided on the surface of the same recording medium. The overt region 3 and the covert region 4 may be arranged at different locations or may overlap, or may be positionally aligned. The overt letter/design pattern and the covert letter/design pattern may be the same or different. An overt recording that is printed using liquid-crystal ink may also function as a covert recording by employing a genuineness inspection method using a circularly polarized plate. A sticker may be provided with one or a plurality of cuts such that the sticker is broken when peeled off, so that it cannot be re-used.

摘要翻译： 目的是提供一种记录的文章或贴纸，其中可以在市场上以简单的方式在视觉上辨别伪造的物品和真品，并且其中不可能在市场上识别已经被使用的防伪措施的位置和类型 被采取。 例如，可以使用变色墨水或液晶墨水以及通过例如光学反光印刷形成的隐蔽区域5（其不能是在视觉上可以在市场上可视地识别）的明显区域3 在不使用特殊工具的情况下识别）设置在同一记录介质的表面上。 突出区域3和隐蔽区域4可以布置在不同的位置处或者可以重叠或者可以是位置对准的。 公开信/设计模式和隐蔽信/设计模式可能相同或不同。 使用液晶墨打印的公开记录也可以通过使用圆偏振板的真实性检查方法作为隐蔽记录。 贴纸可以设置有一个或多个切口，使得当剥离时贴纸被破坏，使得它不能被再次使用。

公开(公告)号：US07048194B2

公开(公告)日：2006-05-23

申请号：US10400059

申请日：2003-03-27

申请人： Toshiyasu Minami ,  Hiroto Nakamura

发明人： Toshiyasu Minami ,  Hiroto Nakamura

IPC分类号： G06K19/06

CPC分类号： G06K19/04

摘要： A printing paper 70 has memory elements 80 arranged on an upper left corner and a lower right corner on the surface thereof. Each of the memory elements 80 stores printing information used for printing, such as a paper size and a paper type, and transmits the printing information by radio wave, when receiving radio wave of a preset wavelength. A printer 20 has two information collection units 50 attached to a left end and a right end on a rear side of a carriage mechanism 30. Each of the information collection units 50 transmits the radio wave of the preset wavelength and receives the printing information transmitted from the memory element 80 in response to reception of this transmitted radio wave. The printing paper 70 is set in the printer 20 and is used for printing. The printer 20 carries out printing with settings of a paper size, a paper type, and a paper direction, based on the printing information received by the information collection unit 50.

摘要翻译： 打印纸70具有布置在其表面上的左上角和右下角的存储元件80。 每个存储元件80存储用于打印的打印信息，例如纸张尺寸和纸张类型，并且当接收到预设波长的电波时，通过无线电波发送打印信息。 打印机20具有附接到滑架机构30的后侧的左端和右端的两个信息收集单元50。 每个信息收集单元50发送预设波长的无线电波，并且响应于该发送的无线电波的接收而接收从存储元件80发送的打印信息。 打印纸70设置在打印机20中并用于打印。 打印机20基于由信息收集单元50接收到的打印信息，执行纸张尺寸，纸张类型和纸张方向的设置的打印。

公开(公告)号：US20060104692A1

公开(公告)日：2006-05-18

申请号：US11290827

申请日：2005-12-01

申请人： Hiroto Nakamura

发明人： Hiroto Nakamura

IPC分类号： B41J3/36

CPC分类号： G01R31/2862 ,  G01R31/01 ,  G01R31/2808 ,  G01R31/2817 ,  H01L21/67242 ,  H01L21/6734

摘要： In a handler 1 capable of handling strip formats 2, a plurality of strip formats 2 are held in a magazine 3 and conveyed to inside a constant temperature chamber 15, and the strip formats 2 held in the magazine 3 are applied with a predetermined temperature. According to the handler 1 as above, the constant temperature chamber 15 can be downsized and simplified and the maintainability can be improved.

摘要翻译： 在能够处理条形格式2的处理机1中，多个条形格式2被保持在盒3中并被传送到恒温室15内部，并且保持在盒3中的条形格2被施加预定温度。 根据如上所述的处理器1，恒温室15可以被小型化和简化，并且可以提高可维护性。

公开(公告)号：US20060083903A1

公开(公告)日：2006-04-20

申请号：US11286208

申请日：2005-11-23

申请人： Hiroto Nakamura ,  Akio Owatari ,  Masataka Kamijo ,  Yasuko Hirano

发明人： Hiroto Nakamura ,  Akio Owatari ,  Masataka Kamijo ,  Yasuko Hirano

IPC分类号： B41M5/00

CPC分类号： B41M3/148 ,  B41M3/14 ,  B42D25/29 ,  B42D2033/18 ,  G01N21/21 ,  G01N2021/216 ,  G07D7/128 ,  G07D7/205 ,  G09F3/0292 ,  Y10S428/916 ,  Y10T428/24372 ,  Y10T428/24802 ,  Y10T428/24893 ,  Y10T428/252

摘要： An object is to provide a recorded article or sticker whereby counterfeited articles and genuine articles can be visually distinguished in simple fashion in the market and wherein it is not possible to identify in the market the location and type of the anti-counterfeiting measures that have been taken. Both an overt region 3 (which can be recognized visually in the market) are printing using a color-change ink or liquid-crystal ink, for example, and a covert region 5 formed by for example optical retro-reflective printing (which cannot be recognized without using a special tool) are provided on the surface of the same recording medium. The overt region 3 and the covert region 4 may be arranged at different locations or may overlap, or may be positionally aligned. The overt letter/design pattern and the covert letter/design pattern may be the same or different. An overt recording that is printed using liquid-crystal ink may also function as a covert recording by employing a genuineness inspection method using a circularly polarized plate. A sticker may be provided with one or a plurality of cuts such that the sticker is broken when peeled off, so that it cannot be re-used.