Invention Grant
- Patent Title: System and method for detecting flow in a mass flow controller
- Patent Title (中): 用于检测质量流量控制器中流量的系统和方法
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Application No.: US11456055Application Date: 2006-07-06
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Publication No.: US07255128B2Publication Date: 2007-08-14
- Inventor: Gurtej Singh Sandhu , Sujit Sharan , Neal R. Rueger , Allen P. Mardian
- Applicant: Gurtej Singh Sandhu , Sujit Sharan , Neal R. Rueger , Allen P. Mardian
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman, Lundberg, Woessner & Kluth, P.A.
- Main IPC: H01L21/66
- IPC: H01L21/66 ; F17D3/00 ; F16K37/00 ; G01B7/00

Abstract:
Systems and methods are provided for detecting flow in a mass flow controller (MFC). The position of a gate in the MFC is sensed or otherwise determined to monitor flow through the MFC and to immediately or nearly immediately detect a flow failure. In one embodiment of the present invention, a novel MFC is provided. The MFC includes an orifice, a mass flow control gate, an actuator and a gate position sensor. The actuator moves the control gate to control flow through the orifice. The gate position sensor determines the gate position and/or gate movement to monitor flow and immediately or nearly immediately detect a flow failure. According to one embodiment of the present invention, the gate position sensor includes a transmitter for transmitting a signal and a receiver for receiving the signal such that the receiver provides an indication of the position of the gate based on the signal received. Other embodiments of the gate position sensor are described herein, as well as systems and methods that incorporate the novel MFC within a semiconductor manufacturing process.
Public/Granted literature
- US20060236513A1 SYSTEM AND METHOD FOR DETECTING FLOW IN A MASS FLOW CONTROLLER Public/Granted day:2006-10-26
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