发明授权
- 专利标题: Method of fabricating heterojunction bipolar transistor
- 专利标题(中): 异质结双极晶体管的制造方法
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申请号: US11227503申请日: 2005-09-15
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公开(公告)号: US07273789B2公开(公告)日: 2007-09-25
- 发明人: Byoung Gue Min , Jong Min Lee , Seong Il Kim , Chul Won Ju , Kyung Ho Lee
- 申请人: Byoung Gue Min , Jong Min Lee , Seong Il Kim , Chul Won Ju , Kyung Ho Lee
- 申请人地址: KR Daejeon
- 专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人地址: KR Daejeon
- 代理机构: Ladas & Parry LLP
- 优先权: KR10-2004-0090673 20041109
- 主分类号: H01L21/331
- IPC分类号: H01L21/331
摘要:
Provided is a method of fabricating a heterojunction bipolar transistor (HBT). The method includes: sequentially depositing a sub-collector layer, a collector layer, a base layer, an emitter layer, and an emitter capping layer on a substrate; forming an emitter electrode on the emitter capping layer; forming a mesa type emitter to expose the base layer by sequentially etching the emitter capping layer and the emitter layer using the emitter electrode as an etch mask in vertical and negative-sloped directions to the substrate, respectively; and forming a base electrode on the exposed base layer using the emitter electrode as a mask in self-alignment with the emitter electrode. In this method, a distance between the mesa type emitter and the base electrode can be minimized and reproducibly controlled. Also, a self-aligned device with an excellent high-frequency characteristic can be embodied.
公开/授权文献
- US20060099767A1 Method of fabricating heterojunction bipolar transistor 公开/授权日:2006-05-11
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