发明授权
US07752510B2 Integrated device for simplified parallel testing, test board for testing a plurality of integrated devices, and test system and tester unit
失效
用于简化并行测试的集成设备，用于测试多个集成设备的测试板，以及测试系统和测试仪单元
- 专利标题： Integrated device for simplified parallel testing, test board for testing a plurality of integrated devices, and test system and tester unit
- 专利标题（中）： 用于简化并行测试的集成设备，用于测试多个集成设备的测试板，以及测试系统和测试仪单元
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申请号： US11684533申请日： 2007-03-09
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公开(公告)号： US07752510B2公开(公告)日： 2010-07-06
- 发明人: Manfred Proell , Stephan Schroeder , Wolfgang Ruf , Hermann Haas
- 申请人： Manfred Proell , Stephan Schroeder , Wolfgang Ruf , Hermann Haas
- 申请人地址： DE Munich
- 专利权人： Qimonda AG
- 当前专利权人： Qimonda AG
- 当前专利权人地址： DE Munich
- 代理机构： Patterson & Sheridan, L.L.P.
- 优先权： DE102006010944 20060309
- 主分类号： G01R31/28
- IPC分类号： G01R31/28 ; G01R31/26 ; G11C29/00
摘要：
An integrated device comprises a functional circuit, a test circuit for testing the functional circuit and for providing an error data item and a register element for storing the error data item and for outputting the error data item at an error data output of the integrated device responsive to an output signal. The register element is connected to a data input of the integrated device in order to accept a data item, which is applied to the data input, responsive to the output signal.
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