Invention Grant
US07943290B2 Method of forming fine pattern using azobenzene-functionalized polymer and method of manufacturing nitride-based semiconductor light emitting device using the method of forming fine pattern
失效
使用偶氮苯官能化聚合物形成精细图案的方法和使用形成精细图案的方法制造氮化物基半导体发光器件的方法
- Patent Title: Method of forming fine pattern using azobenzene-functionalized polymer and method of manufacturing nitride-based semiconductor light emitting device using the method of forming fine pattern
- Patent Title (中): 使用偶氮苯官能化聚合物形成精细图案的方法和使用形成精细图案的方法制造氮化物基半导体发光器件的方法
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Application No.: US11683096Application Date: 2007-03-07
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Publication No.: US07943290B2Publication Date: 2011-05-17
- Inventor: Jae-hee Cho , Cheol-soo Sone , Dong-yu Kim , Hyun-gi Hong , Seok-soon Kim
- Applicant: Jae-hee Cho , Cheol-soo Sone , Dong-yu Kim , Hyun-gi Hong , Seok-soon Kim
- Applicant Address: KR
- Assignee: Samsung LED Co., Ltd.
- Current Assignee: Samsung LED Co., Ltd.
- Current Assignee Address: KR
- Agency: Cantor Colburn LLP
- Priority: KR10-2006-0042385 20060511
- Main IPC: G03F7/26
- IPC: G03F7/26

Abstract:
Provided is a method of forming a fine pattern having a pattern dimension of 1 μm or less, repeatedly with reproducibility. The method of forming the fine pattern includes: forming an azobenzene-functionalized polymer film on an etched layer; irradiating the azobenzene-functionalized polymer film using an interference laser beam to form a patterned azobenzene-functionalized polymer film having fine-patterned surface relief gratings by a photophysical mass transporting of the azobenzene-functionalized polymer; etching the etched layer using the azobenzene-functionalized polymer film having the surface relief grating patterns as an etching mask; and removing the patterned azobenzene-functionalized polymer film.
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