Invention Grant
US07943964B2 AlxGayIn1−x−yN crystal substrate, semiconductor device, and method of manufacturing the same
有权
AlxGayIn1-x-yN晶体基板,半导体器件及其制造方法
- Patent Title: AlxGayIn1−x−yN crystal substrate, semiconductor device, and method of manufacturing the same
- Patent Title (中): AlxGayIn1-x-yN晶体基板,半导体器件及其制造方法
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Application No.: US12096986Application Date: 2006-10-16
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Publication No.: US07943964B2Publication Date: 2011-05-17
- Inventor: Shinsuke Fujiwara , Tomoki Uemura , Takuji Okahisa , Koji Uematsu , Manabu Okui , Muneyuki Nishioka , Shin Hashimoto
- Applicant: Shinsuke Fujiwara , Tomoki Uemura , Takuji Okahisa , Koji Uematsu , Manabu Okui , Muneyuki Nishioka , Shin Hashimoto
- Applicant Address: JP Osaka-shi, Osaka
- Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee Address: JP Osaka-shi, Osaka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2005-360621 20051214
- International Application: PCT/JP2006/320549 WO 20061016
- International Announcement: WO2007/069388 WO 20070621
- Main IPC: H01L33/30
- IPC: H01L33/30

Abstract:
An AlxGayIn1-x-yN crystal substrate of the present invention has a main plane having an area of at least 10 cm2. The main plane has an outer region located within 5 mm from an outer periphery of the main plane, and an inner region corresponding to a region other than the outer region. The inner region has a total dislocation density of at least 1×102 cm−2 and at most 1×106 cm−2. It is thereby possible to provide an AlxGayIn1-x-yN crystal substrate having a large size and a suitable dislocation density for serving as a substrate for a semiconductor device, a semiconductor device including the AlxGayIn1-x-yN crystal substrate, and a method of manufacturing the same.
Public/Granted literature
- US20090194847A1 A1xGa yIn 1-x-yN CRYSTAL SUBSTRATE, SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2009-08-06
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