Invention Grant
US07951331B2 Analysis system and method for analyzing a sample on an analytical test element
有权
用于分析分析测试元素上的样本的分析系统和方法
- Patent Title: Analysis system and method for analyzing a sample on an analytical test element
- Patent Title (中): 用于分析分析测试元素上的样本的分析系统和方法
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Application No.: US11776379Application Date: 2007-07-11
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Publication No.: US07951331B2Publication Date: 2011-05-31
- Inventor: Bernd Roesicke , Stefan Kalveram , Frederic Wehowski , Michael Goetz
- Applicant: Bernd Roesicke , Stefan Kalveram , Frederic Wehowski , Michael Goetz
- Applicant Address: US IN Indianapolis
- Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee Address: US IN Indianapolis
- Agency: Roche Diagnostics Operations, Inc.
- Agent Justin L. Sage
- Priority: EP06117020 20060712
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N15/06 ; G01J1/48 ; G01N35/00 ; G01N27/26

Abstract:
The invention relates to embodiments of an analysis system and to a method for analyzing a sample on an analytical test element, with the analysis system comprising a test element receptacle for receiving and positioning a test element in an analysis position. In an exemplary embodiment, the test element receptacle contains a guide part and a lock part, the guide part having means for guiding a test element into and out of the analysis position, the lock part comprising a frame and a bolt element, which frame and bolt element are connected to one another by a hinge. The bolt element can be pivoted about the hinge between a first position and a second position with respect to the frame. The bolt element comprises a latching lug for engaging in a recess in test element when the bolt element is in the first position and when the test element is positioned in the analysis position.
Public/Granted literature
- US20080053201A1 ANALYSIS SYSTEM AND METHOD FOR ANALYZING A SAMPLE ON AN ANALYTICAL TEST ELEMENT Public/Granted day:2008-03-06
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