发明授权
- 专利标题: High read speed memory with gate isolation
- 专利标题(中): 具有门隔离的高速读存储器
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申请号: US13600527申请日: 2012-08-31
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公开(公告)号: US08520437B2公开(公告)日: 2013-08-27
- 发明人: Richard Fastow , Hagop Nazarian , Lei Xue
- 申请人: Richard Fastow , Hagop Nazarian , Lei Xue
- 申请人地址: US CA Sunnyvale
- 专利权人: Spansion LLC
- 当前专利权人: Spansion LLC
- 当前专利权人地址: US CA Sunnyvale
- 代理机构: Turocy & Watson, LLP
- 主分类号: G11C11/34
- IPC分类号: G11C11/34 ; G11C16/04 ; G11C5/06
摘要:
Providing for a serial array memory transistor architecture that achieves high read speeds compared with conventional serial array memory is described herein. By way of example, the serial array memory can be connected to and can drive a gate voltage of a small capacitance pass transistor, to facilitate sensing memory transistors of the serial array. The pass transistor modulates current flow or voltage at an adjacent metal bitline, which can be utilized to sense a program or erase state(s) of the memory transistors. Due to the small capacitance of the pass transistor, read latency for the serial array can be significantly lower than conventional serial array memory (e.g., NAND memory). Further, various mechanisms for forming an amplifier region of the serial array memory comprising discrete pass transistor are described to facilitate efficient fabrication of the serial array memory transistor architecture.
公开/授权文献
- US20120327717A1 HIGH READ SPEED MEMORY WITH GATE ISOLATION 公开/授权日:2012-12-27
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