发明授权
- 专利标题: Connector, probe, and method of manufacturing probe
- 专利标题(中): 连接器,探头和探头制造方法
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申请号: US13353377申请日: 2012-01-19
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公开(公告)号: US08901920B2公开(公告)日: 2014-12-02
- 发明人: Koki Takahashi , Koki Sato , Mitsuru Kobayashi
- 申请人: Koki Takahashi , Koki Sato , Mitsuru Kobayashi
- 申请人地址: JP Tokyo
- 专利权人: Fujitsu Component Limited
- 当前专利权人: Fujitsu Component Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: IPUSA, PLLC
- 优先权: JP2011-019165 20110131
- 主分类号: G01R1/06
- IPC分类号: G01R1/06 ; G01R31/20 ; H01R13/24 ; H01R43/16 ; G01R1/067 ; G01R1/073
摘要:
A connector includes multiple probes and a first insulator part and a second insulator part joined to cover the probes. Each of the probes has a monolithic structure of a single bent metal plate. Each of the probes includes an end part configured to come into contact with an electrode terminal; a spring part having a meandering shape and connected to the end part; a housing part bent to enclose the spring part; and a bent part provided between the spring part and the housing part. The end parts of the probes are at least partially projecting outward from first openings provided in the first insulator part, and the bent parts of the probes are at least partially projecting outward from second openings provided in the second insulator part.
公开/授权文献
- US20120194173A1 CONNECTOR, PROBE, AND METHOD OF MANUFACTURING PROBE 公开/授权日:2012-08-02
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