Connector
    1.
    发明授权
    Connector 失效
    连接器

    公开(公告)号:US08668499B2

    公开(公告)日:2014-03-11

    申请号:US13365613

    申请日:2012-02-03

    IPC分类号: H01R12/00

    CPC分类号: H01R12/721 H01R12/716

    摘要: A connector to be mounted on a substrate includes a first pad and a second pad formed on the surface, including a first contact including a first contacting portion to be in contact with the first pad when the connector is mounted on the substrate; and a second contact including a second contacting portion to be in contact with the second pad when the connector is mounted on the substrate, the first contact and the second contact being configured such that the first contacting portion slides on the first pad in a first direction while the second contacting portion slides on the second pad in a second direction opposite to the first direction, when the first contact and the second contact are pushed toward the first pad and the second pad, respectively, while the connector is being placed on and fixed to the substrate.

    摘要翻译: 要安装在基板上的连接器包括形成在表面上的第一焊盘和第二焊盘,包括第一接触件,当第一接触件包括第一接触部分以在接头安装在基板上时与第一焊盘接触; 以及第二触点,当所述连接器安装在所述基板上时,所述第二触点包括与所述第二焊盘接触的第二接触部分,所述第一触点和所述第二触点被构造成使得所述第一接触部分在所述第一焊盘上沿第一方向 而第二接触部分在与第一方向相反的第二方向上在第二焊盘上滑动,当第一接触件和第二接触件分别被推向第一焊盘和第二焊盘时,同时连接器被放置并固定 到基底。

    CONNECTOR, PROBE, AND METHOD OF MANUFACTURING PROBE
    2.
    发明申请
    CONNECTOR, PROBE, AND METHOD OF MANUFACTURING PROBE 有权
    连接器,探头和制造方法

    公开(公告)号:US20120194173A1

    公开(公告)日:2012-08-02

    申请号:US13353377

    申请日:2012-01-19

    IPC分类号: G01R1/06

    摘要: A connector includes multiple probes and a first insulator part and a second insulator part joined to cover the probes. Each of the probes has a monolithic structure of a single bent metal plate.Each of the probes includes an end part configured to come into contact with an electrode terminal; a spring part having a meandering shape and connected to the end part; a housing part bent to enclose the spring part; and a bent part provided between the spring part and the housing part. The end parts of the probes are at least partially projecting outward from first openings provided in the first insulator part, and the bent parts of the probes are at least partially projecting outward from second openings provided in the second insulator part.

    摘要翻译: 连接器包括多个探针和连接以覆盖探针的第一绝缘体部分和第二绝缘体部分。 每个探针具有单个弯曲金属板的整体结构。 每个探针包括构造成与电极端子接触的端部; 具有弯曲形状并连接到端部的弹簧部分; 弯曲以包围弹簧部分的壳体部分; 以及设置在弹簧部和壳体部之间的弯曲部。 探针的端部至少部分地从设置在第一绝缘体部分中的第一开口向外突出,并且探针的弯曲部分至少部分地从设置在第二绝缘体部分中的第二开口向外突出。

    PROBE AND METHOD OF MANUFACTURING PROBE
    3.
    发明申请
    PROBE AND METHOD OF MANUFACTURING PROBE 有权
    探索和制造探针的方法

    公开(公告)号:US20110252657A1

    公开(公告)日:2011-10-20

    申请号:US13084801

    申请日:2011-04-12

    IPC分类号: G01B7/00 H01R43/16

    摘要: A probe used for electrical measurement includes first and second internal electrically-conductive parts; first and second terminal contact parts configured to contact first and second external electrode terminals, respectively; first and second spring parts each having a meandering pattern; a housing part configured to surround the first and second internal electrically-conductive parts. The first internal electrically-conductive part, the first terminal contact part, the first spring part, the housing part, the second spring part, the second terminal contact part, and the second internal electrically-conductive part are successively connected in a single metal plate from a first end to a second end thereof. The first and second terminal contact parts are in first and second bent portions, respectively, of the single metal plate. The first and second internal electrically-conductive parts are configured to contact each other at the time of performing the electrical measurement.

    摘要翻译: 用于电测量的探针包括第一和第二内部导电部件; 分别与第一和第二外部电极端子接触的第一和第二端子接触部分; 第一和第二弹簧部件各自具有曲折图案; 壳体部分,其构造成围绕所述第一和第二内部导电部件。 第一内部导电部分,第一端子接触部分,第一弹簧部分,壳体部分,第二弹簧部分,第二端子接触部分和第二内部导电部分连续地连接在单个金属板 从第一端到第二端。 第一和第二端子接触部分分别在单个金属板的第一和第二弯曲部分中。 第一和第二内部导电部件被配置为在执行电测量时彼此接触。

    Connector, circuit board and electronic apparatus
    4.
    发明申请
    Connector, circuit board and electronic apparatus 有权
    连接器,电路板和电子设备

    公开(公告)号:US20080108235A1

    公开(公告)日:2008-05-08

    申请号:US12005321

    申请日:2007-12-27

    IPC分类号: H01R13/62

    摘要: The present invention improves a buffer function of a connector (22) against impact from a plug (36). A connector that is connected with uniting to a plug has a first housing (an inner shell 24) that is connected to the plug and a second housing (an outer shell 26) that surrounds the first housing (the inner shell 24) with being installed on a member to be attached (a circuit board 48). The first housing (the inner shell 24) is elastically supported inside the second housing (the outer shell 26).

    摘要翻译: 本发明改进了抵抗来自插头(36)的冲击的连接器(22)的缓冲功能。 连接到插头上的连接器具有连接到插头的第一壳体(内壳24)和围绕第一壳体(内壳24)的第二壳体(外壳26),其被安装 在要连接的构件上(电路板48)。 第一壳体(内壳体24)弹性地支撑在第二壳体(外壳26)的内部。

    Keyboard
    5.
    发明授权
    Keyboard 失效

    公开(公告)号:US07135647B2

    公开(公告)日:2006-11-14

    申请号:US11226239

    申请日:2005-09-15

    申请人: Koki Takahashi

    发明人: Koki Takahashi

    IPC分类号: H01H9/26 H01H13/72 H01H13/76

    摘要: A keyboard has a base plate, a membrane sheet, a housing, a key-top, a link mechanism disposed between the housing and the key-top, and a switch operating member disposed under the key-top and operated by the key-top. The housing, the membrane sheet and the base plate have slits at a position corresponding to a surrounding portion of the key-top. Consequently, the distance between the key-top and the housing can be decreased even if the skirt part of the key-top is long. Furthermore, the slit of the housing is formed as a discontinuous annular shape to surround the link mechanism, and the surrounding portion of the key-top has a slit corresponding to the bridge shaped portion of the housing.

    Connector, probe, and method of manufacturing probe
    6.
    发明授权
    Connector, probe, and method of manufacturing probe 有权
    连接器,探头和探头制造方法

    公开(公告)号:US08901920B2

    公开(公告)日:2014-12-02

    申请号:US13353377

    申请日:2012-01-19

    摘要: A connector includes multiple probes and a first insulator part and a second insulator part joined to cover the probes. Each of the probes has a monolithic structure of a single bent metal plate. Each of the probes includes an end part configured to come into contact with an electrode terminal; a spring part having a meandering shape and connected to the end part; a housing part bent to enclose the spring part; and a bent part provided between the spring part and the housing part. The end parts of the probes are at least partially projecting outward from first openings provided in the first insulator part, and the bent parts of the probes are at least partially projecting outward from second openings provided in the second insulator part.

    摘要翻译: 连接器包括多个探针和连接以覆盖探针的第一绝缘体部分和第二绝缘体部分。 每个探针具有单个弯曲金属板的整体结构。 每个探针包括构造成与电极端子接触的端部; 具有弯曲形状并连接到端部的弹簧部分; 弯曲以包围弹簧部分的壳体部分; 以及设置在弹簧部和壳体部之间的弯曲部。 探针的端部至少部分地从设置在第一绝缘体部分中的第一开口向外突出,并且探针的弯曲部分至少部分地从设置在第二绝缘体部分中的第二开口向外突出。

    Probe and method of manufacturing probe
    7.
    发明授权
    Probe and method of manufacturing probe 有权
    探头和探头的制造方法

    公开(公告)号:US08471578B2

    公开(公告)日:2013-06-25

    申请号:US12870895

    申请日:2010-08-30

    IPC分类号: G01R31/20

    摘要: A probe is made to contact an electrode terminal in an electric circuit or an electronic part for an electric measurement of the electric circuit or the electronic part. The probe includes a terminal portion which is brought in contact with the electrode terminal at one end of the probe, a spring portion in which U-shaped unit portions are arrayed in a zigzag formation, and a housing portion which surrounds the spring portion. The probe is formed of a sheet of a sheet-metal plate which is bent multiple times, the sheet-metal plate having a predetermined configuration in which a portion corresponding to the terminal portion, a portion corresponding to the spring portion, and a portion corresponding to the housing portion are continuously linked together.

    摘要翻译: 探针用于接触电路或电子部件中的电极端子,用于电路或电子部件的电测量。 探针包括在探针的一端与电极端子接触的端子部分,其中U形单元部分以锯齿形阵列排列的弹簧部分和围绕弹簧部分的壳体部分。 探针由多次弯曲的片状金属板形成,片状金属板具有预定的构造,其中对应于端子部分的部分,对应于弹簧部分的部分和对应于该部分的部分 连接到壳体部分。

    CONTACT MECHANISM, CARD DETECTING APPARATUS, AND CARD DETECTING METHOD
    8.
    发明申请
    CONTACT MECHANISM, CARD DETECTING APPARATUS, AND CARD DETECTING METHOD 审中-公开
    联系机构,卡检测设备和卡检测方法

    公开(公告)号:US20100327851A1

    公开(公告)日:2010-12-30

    申请号:US12785293

    申请日:2010-05-21

    申请人: Koki TAKAHASHI

    发明人: Koki TAKAHASHI

    IPC分类号: G01R1/20 H01R4/48

    摘要: A contact mechanism includes a movable contact unit to be positionally changed in accordance with insertion of a detachable member; and a fixed contact pair to include a first fixed contact unit and a second fixed contact unit, the positionally changed movable contact unit coming into slidable contact with the first fixed contact unit and the second fixed contact unit to make the first fixed contact unit and the second fixed contact unit conductive through the movable contact unit.

    摘要翻译: 接触机构包括根据可拆卸构件的插入而位置改变的可动接触单元; 以及固定接触对,其包括第一固定接触单元和第二固定接触单元,所述位置改变的可动接触单元与所述第一固定接触单元和所述第二固定接触单元滑动接触,以使所述第一固定接触单元和所述第二固定接触单元 第二固定接触单元通过可动接触单元导电。

    Magnetic head slider assembly
    9.
    发明授权
    Magnetic head slider assembly 失效
    磁头滑块组件

    公开(公告)号:US5644449A

    公开(公告)日:1997-07-01

    申请号:US631120

    申请日:1996-04-12

    IPC分类号: G11B5/60 G11B21/21

    CPC分类号: G11B5/6005

    摘要: A magnetic head slider assembly for a magnetic recording and reproducing apparatus. A first slide surface and a second slide surface, which are comparatively wide, are formed on the surface of the assembly which will face a recording medium. A first air groove intervenes between the first and second slide surfaces. Part of the first slide surface is formed by a magnetic core. A third slide surface adjoins the first slide surface via a second air groove at the side opposite to the first air groove. The third slide surface is slightly remoter from the medium than the first and second slide surfaces.

    摘要翻译: 一种用于磁记录和再现装置的磁头滑块组件。 第一滑动表面和第二滑动表面相对较宽地形成在组件的面对记录介质的表面上。 第一气槽介于第一和第二滑动表面之间。 第一滑动表面的一部分由磁芯形成。 第三滑动表面在与第一空气槽相对的一侧经由第二空气槽邻接第一滑动表面。 与第一和第二滑动表面相比,第三滑动面从介质略微偏离。

    Probe and method of manufacturing probe
    10.
    发明授权
    Probe and method of manufacturing probe 有权
    探头和探头的制造方法

    公开(公告)号:US08587333B2

    公开(公告)日:2013-11-19

    申请号:US13084801

    申请日:2011-04-12

    IPC分类号: G01R31/00 G01R31/20

    摘要: A probe used for electrical measurement includes first and second internal electrically-conductive parts; first and second terminal contact parts configured to contact first and second external electrode terminals, respectively; first and second spring parts each having a meandering pattern; a housing part configured to surround the first and second internal electrically-conductive parts. The first internal electrically-conductive part, the first terminal contact part, the first spring part, the housing part, the second spring part, the second terminal contact part, and the second internal electrically-conductive part are successively connected in a single metal plate from a first end to a second end thereof. The first and second terminal contact parts are in first and second bent portions, respectively, of the single metal plate. The first and second internal electrically-conductive parts are configured to contact each other at the time of performing the electrical measurement.

    摘要翻译: 用于电测量的探针包括第一和第二内部导电部件; 分别与第一和第二外部电极端子接触的第一和第二端子接触部分; 第一和第二弹簧部件各自具有曲折图案; 壳体部分,其构造成围绕所述第一和第二内部导电部件。 第一内部导电部分,第一端子接触部分,第一弹簧部分,壳体部分,第二弹簧部分,第二端子接触部分和第二内部导电部分连续地连接在单个金属板 从第一端到第二端。 第一和第二端子接触部分分别在单个金属板的第一和第二弯曲部分中。 第一和第二内部导电部件被配置为在执行电测量时彼此接触。