Invention Grant
US09147451B2 Memory device and method of controlling leakage current within such a memory device
有权
存储器件和控制这种存储器件内的漏电流的方法
- Patent Title: Memory device and method of controlling leakage current within such a memory device
- Patent Title (中): 存储器件和控制这种存储器件内的漏电流的方法
-
Application No.: US13847743Application Date: 2013-03-20
-
Publication No.: US09147451B2Publication Date: 2015-09-29
- Inventor: Yew Keong Chong , Sanjay Mangal , Hsin-Yu Chen
- Applicant: ARM Limited
- Applicant Address: GB Cambridge
- Assignee: ARM Limited
- Current Assignee: ARM Limited
- Current Assignee Address: GB Cambridge
- Agency: Pramudji Law Group PLLC
- Agent Ari Pramudji
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C7/18 ; G11C16/10 ; G11C16/24 ; G11C16/26

Abstract:
A memory device includes an array of memory cells arranged as a plurality of rows and columns, each row being coupled to an associated read word line, and each column forming at least one column group, where the memory cells of each column group are coupled to an associated read bit line. Each column group includes circuitry to precharge the associated read bit line to a first voltage level prior to the read operation. Each memory cell has coupling circuitry connected between the associated read bit line and a second voltage level different to the first voltage level. During read operation the coupling circuitry associated with the activated memory cell selectively discharges the associated read bit line towards the second voltage level dependent on the data value stored within that activated memory cell. The clamping circuitry connects the associated read bit line to the second voltage level.
Public/Granted literature
- US20140286096A1 MEMORY DEVICE AND METHOD OF CONTROLLING LEAKAGE CURRENT WITHIN SUCH A MEMORY DEVICE Public/Granted day:2014-09-25
Information query