Invention Grant
- Patent Title: Specimen analyzing method and specimen analyzing apparatus
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Application No.: US14677170Application Date: 2015-04-02
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Publication No.: US09316583B2Publication Date: 2016-04-19
- Inventor: Norimasa Yamamoto , Takashi Yamato , Naohiko Matsuo , Satoshi Iguchi
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe-shi, Hyogo
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-shi, Hyogo
- Agency: Sughrue Mion, PLLC
- Priority: JP2005-093692 20050329
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/59 ; G01N35/02 ; G01N21/17 ; G01N21/03 ; G01N21/31 ; G01N35/00

Abstract:
A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.
Public/Granted literature
- US20150211995A1 SPECIMEN ANALYZING METHOD AND SPECIMEN ANALYZING APPARATUS Public/Granted day:2015-07-30
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