公开(公告)号：US09316583B2

公开(公告)日：2016-04-19

申请号：US14677170

申请日：2015-04-02

Applicant: SYSMEX CORPORATION

Inventor： Norimasa Yamamoto ,  Takashi Yamato ,  Naohiko Matsuo ,  Satoshi Iguchi

IPC: G01N21/00 ,  G01N21/59 ,  G01N35/02 ,  G01N21/17 ,  G01N21/03 ,  G01N21/31 ,  G01N35/00

CPC classification number: G01N35/00594 ,  G01N21/0332 ,  G01N21/17 ,  G01N21/31 ,  G01N21/59 ,  G01N33/5302 ,  G01N33/86 ,  G01N35/00603 ,  G01N35/025 ,  G01N2035/00465 ,  G01N2201/0231 ,  G01N2201/062 ,  Y10S436/815 ,  Y10S436/817 ,  Y10T436/11 ,  Y10T436/112499 ,  Y10T436/113332 ,  Y10T436/146666

Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.

公开(公告)号：US09028756B2

公开(公告)日：2015-05-12

申请号：US14015358

申请日：2013-08-30

Applicant: Sysmex Corporation

Inventor： Norimasa Yamamoto ,  Takashi Yamato ,  Naohiko Matsuo ,  Satoshi Iguchi

IPC: G01N21/00 ,  G01N21/17 ,  G01N35/02 ,  G01N35/00

CPC classification number: G01N35/00594 ,  G01N21/0332 ,  G01N21/17 ,  G01N21/31 ,  G01N21/59 ,  G01N33/5302 ,  G01N33/86 ,  G01N35/00603 ,  G01N35/025 ,  G01N2035/00465 ,  G01N2201/0231 ,  G01N2201/062 ,  Y10S436/815 ,  Y10S436/817 ,  Y10T436/11 ,  Y10T436/112499 ,  Y10T436/113332 ,  Y10T436/146666

Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.

Abstract translation: 一种能够在分析试样之前测量干扰物质的试样分析方法和试样分析装置。 该方法包括：将存储在样本容器（150）中的样本抽吸并在第一容器（153）中取样的步骤，用于光学测量第一容器中的样本的步骤，将第二容器 （154），并通过将试样与第二容器中的试剂混合来制备测量样本，以及根据样品的光学测量结果分析测量样本的步骤。

公开(公告)号：US10261016B2

公开(公告)日：2019-04-16

申请号：US15070597

申请日：2016-03-15

Applicant: SYSMEX CORPORATION

Inventor： Norimasa Yamamoto ,  Takashi Yamato ,  Naohiko Matsuo ,  Satoshi Iguchi

IPC: G01N21/00 ,  G01N21/59 ,  G01N35/02 ,  G01N21/17 ,  G01N21/03 ,  G01N21/31 ,  G01N33/53 ,  G01N33/86 ,  G01N35/00

Abstract: A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.