Invention Grant
- Patent Title: Bad memory unit detection in a solid state drive
- Patent Title (中): 在固态驱动器中存储单元检测不良
-
Application No.: US14263189Application Date: 2014-04-28
-
Publication No.: US09443616B2Publication Date: 2016-09-13
- Inventor: Zhengang Chen , Earl T. Cohen , Erich F. Haratsch , Jeremy Werner
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Agency: Christopher P. Maiorana, PC
- Main IPC: G11C29/44
- IPC: G11C29/44 ; G11C29/26 ; G11C29/38 ; G11C29/00 ; G11C29/04 ; G06F11/07 ; G11C29/42 ; G11C29/52 ; G11C16/34

Abstract:
An apparatus comprising a memory and a controller. The memory is configured to process a plurality of read/write operations. The memory comprises a plurality of memory unit granularities each having a size less than a total size of the memory. The controller is configured to process a plurality of I/O requests to the memory units of the memory that are not marked as bad on a memory unit list. The controller is configured to track a plurality of bad blocks of the memory. The controller is configured to determine which of the memory units to mark as bad based on a test of whether a unit of memory larger than a block of the memory has failed. The test is based on a threshold of the bad blocks in the unit of memory.
Public/Granted literature
- US20150287478A1 BAD MEMORY UNIT DETECTION IN A SOLID STATE DRIVE Public/Granted day:2015-10-08
Information query