Invention Grant
US09505607B2 Methods of forming sensor integrated packages and structures formed thereby
有权
形成传感器集成封装和由此形成的结构的方法
- Patent Title: Methods of forming sensor integrated packages and structures formed thereby
- Patent Title (中): 形成传感器集成封装和由此形成的结构的方法
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Application No.: US14671549Application Date: 2015-03-27
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Publication No.: US09505607B2Publication Date: 2016-11-29
- Inventor: Kyu Oh Lee , Zheng Zhou , Islam A. Salama , Feras Eid , Sasha N. Oster , Lay Wai Kong , Javier Soto Gonzalez
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Alpine Technology Law Group LLC
- Main IPC: B81B3/00
- IPC: B81B3/00 ; B81C1/00

Abstract:
Methods of forming sensor integrated package devices and structures formed thereby are described. An embodiment includes providing a substrate core, wherein a first conductive trace structure and a second conductive trace structure are disposed on the substrate core, forming a cavity between the first conductive trace structure and the second conductive trace structure, and placing a magnet on a resist material disposed on a portion of each of the first and second conductive trace structures, wherein the resist material does not extend over the cavity.
Public/Granted literature
- US20160280535A1 METHODS OF FORMING SENSOR INTEGRATED PACKAGES AND STRUCTURES FORMED THEREBY Public/Granted day:2016-09-29
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