Invention Grant
US09583343B2 Method of forming non-continuous line pattern and non-continuous line pattern structure
有权
形成非连续线条图案和非连续线条图案结构的方法
- Patent Title: Method of forming non-continuous line pattern and non-continuous line pattern structure
- Patent Title (中): 形成非连续线条图案和非连续线条图案结构的方法
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Application No.: US14753019Application Date: 2015-06-29
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Publication No.: US09583343B2Publication Date: 2017-02-28
- Inventor: Yu-Te Chen , En-Chiuan Liou , Chia-Hsun Tseng , Shin-Feng Su , Yu-Ting Hung , Meng-Lin Tsai
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Priority: CN201510258199 20150520
- Main IPC: H01L23/528
- IPC: H01L23/528 ; H01L21/027 ; H01L21/311

Abstract:
A method of forming a non-continuous line pattern includes forming a DSA material layer on a substrate, performing a phase separation of the DSA material layer to form an ordered periodic pattern including a plurality of first polymer structures and the second polymer structures arranged alternately, forming a first mask to cover a first portion of the ordered periodic pattern, performing a first etching process to remove a portion of the first polymer structures exposed by the first mask, removing the first mask, forming a second mask to cover a second portion of the ordered periodic pattern, with an interval to the first portion of the ordered periodic pattern, performing a second etching process to remove a portion of the second polymer structures exposed by the second mask, and removing the second mask. The remaining first polymer structures and the remaining second polymer structures are not connected to each other.
Public/Granted literature
- US20160343567A1 METHOD OF FORMING NON-CONTINUOUS LINE PATTERN AND NON-CONTINUOUS LINE PATTERN STRUCTURE Public/Granted day:2016-11-24
Information query
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