Invention Grant
- Patent Title: Resistive memory device with temperature compensation, resistive memory system, and operating method thereof
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Application No.: US14796131Application Date: 2015-07-10
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Publication No.: US09728252B2Publication Date: 2017-08-08
- Inventor: Yong-kyu Lee , Yeong-taek Lee , Dae-seok Byeon , In-gyu Baek , Man Chang , Lijie Zhang , Hyun-kook Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2014-0133554 20141002
- Main IPC: G11C7/04
- IPC: G11C7/04 ; G11C13/00 ; G11C11/56 ; G11C11/16

Abstract:
A method for operating a memory device includes sensing a change in temperature of the memory device, adjusting a level of a reference current for a read operation, and reading data from memory cells of the memory device based on the adjusted level of the reference current. The level of the reference current is adjusted from a reference value to a first value when the temperature of the memory device increases and is adjusted from the reference value to a second value when the temperature of the memory device decreases. A difference between the reference value and the first value is different from a difference the reference value and the second value.
Public/Granted literature
- US20160099049A1 RESISTIVE MEMORY DEVICE, RESISTIVE MEMORY SYSTEM, AND OPERATING METHOD THEREOF Public/Granted day:2016-04-07
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