发明授权
- 专利标题: Sample analyzer
-
申请号: US14603923申请日: 2015-01-23
-
公开(公告)号: US09816983B2公开(公告)日: 2017-11-14
- 发明人: Daigo Fukuma , Takaaki Nagai , Masaharu Shibata
- 申请人: SYSMEX CORPORATION
- 申请人地址: JP Kobe-shi
- 专利权人: SYSMEX CORPORATION
- 当前专利权人: SYSMEX CORPORATION
- 当前专利权人地址: JP Kobe-shi
- 代理机构: MetroLexis Law Group, PLLC
- 优先权: JP2008-276637 20081028
- 主分类号: G01N33/48
- IPC分类号: G01N33/48 ; G01N33/50 ; G01N33/49 ; G01N15/14 ; G01N21/17 ; G01N27/00 ; G01N15/06 ; G01N15/10 ; G01N15/12 ; G01N15/00
摘要:
A sample analyzer comprising: a sample preparing section for preparing first and second measurement sample including reagent and sample; a first detector for detecting a predetermined component in the first measurement sample prepared by the sample preparing section; a second detector for detecting the predetermined component in the second measurement sample prepared by the sample preparing section; and a controller configured for performing operations, comprising: (a) controlling the first detector to detect the predetermined component in the first measurement sample prepared by the sample preparing section; (b) determining the reliability of the result detected by the first detector; (c) controlling the sample preparing section to prepare the second measurement sample from the same sample when the result has been determined to be unreliable; and (d) controlling the second detector to detect the predetermined component in the second measurement sample, is disclosed.
公开/授权文献
- US20150192573A1 SAMPLE ANALYZER 公开/授权日:2015-07-09
信息查询