METHOD FOR MONITORING AND MEASURING OPTICAL PROPERTIES OF DEVICE IN POLARIZATION MAINTAINING FIBERS BY USING REFERENCE FIBER BRAGG GRATING AND FIBER COMPONENTS MANUFACTURED THEREBY
    93.
    发明公开
    METHOD FOR MONITORING AND MEASURING OPTICAL PROPERTIES OF DEVICE IN POLARIZATION MAINTAINING FIBERS BY USING REFERENCE FIBER BRAGG GRATING AND FIBER COMPONENTS MANUFACTURED THEREBY 审中-公开
    程序用于监视和测量装置,保偏光纤的光学特性使用参考光纤光栅和这样制作的纤维成分

    公开(公告)号:EP2024718A2

    公开(公告)日:2009-02-18

    申请号:EP07719826.5

    申请日:2007-05-23

    CPC classification number: G02B6/02109 G01D5/35303 G01M11/3181

    Abstract: This invention provides a method for measuring and monitoring the state of polarization (SOP) of a polarization maintaining (PM) fiber and the like using a narrowband fiber Bragg grating (FBG) written on the same. The PM fiber therefore comprises a first narrowband reference FBG which is used as a reference to measure and monitor the SOP of the PM fiber. Due to the birefringence properties of the PM fiber, the reference FBG will generally reflect two narrowband spectra, each having a central wavelength; one in the slow axis and one in the fast axis. By measuring the intensity of the reflected spectra in each axis and by tuning the fiber with a polarization controller, it is possible to adjust the fiber to a predetermined SOP. After having adjusted the PM fiber to a predetermined SOP, it is possible to accurately measure the optical properties of a second grating, or of another optical device, according to the predetermined SOP. The method of the present invention can also be advantageously used for accurate measurement of reflectivity.

    POLARIZATION BASED INTERFEROMETRIC DETECTOR
    94.
    发明公开
    POLARIZATION BASED INTERFEROMETRIC DETECTOR 有权
    偏振干涉基于探测器

    公开(公告)号:EP2010877A2

    公开(公告)日:2009-01-07

    申请号:EP07760723.2

    申请日:2007-04-16

    Applicant: Bioptix, LLC

    Abstract: A sensor and method for determining the optical properties of a sample material is disclosed. The sensor comprises a light source that generates a linearly polarized light beam having a predetermined polarization orientation with respect to the plane of incidence. The linearly polarized light beam is reflected off the sample and is split into second and third light beams where the second and third light beam consist of the combined projections of mutually orthogonal components of the first light beam. A signal processor measures the intensity difference between the second and third light beams to calculate the phase difference induced by the sample material.

    OPTO-ELECTRONIC SYSTEM AND METHOD FOR DETECTING PERTURBATIONS
    96.
    发明公开
    OPTO-ELECTRONIC SYSTEM AND METHOD FOR DETECTING PERTURBATIONS 审中-公开
    亚光电子系统和检测方法的问题的

    公开(公告)号:EP1969323A1

    公开(公告)日:2008-09-17

    申请号:EP05820442.1

    申请日:2005-12-28

    Applicant: Bioscan Ltd.

    CPC classification number: G01J1/4228 G01D5/35383 G01J1/04 G01J1/0425

    Abstract: A method for detecting and measuring physical perturbations sensed by a multi-mode waveguide, through which a number of modes of a coherent electromagnetic wave propagates through and exit from. The method comprises irradiating the exiting electromagnetic wave on one or more two-dimensional sensing arrays comprising a plurality of sensing elements that are sensitive to the irradiated electromagnetic wave; determining, simultaneously, in a parallel manner, absolute values of sensed changes across different zones of the two-dimensional sensing arrays, each zone comprising one or more sensing elements; and summing the absolute values of different groups of different zones to obtain a representation of the perturbations.

    CARACTERISATION METROLOGIQUE DE CIRCUITS DE MICROELECTRONIQUE
    98.
    发明授权
    CARACTERISATION METROLOGIQUE DE CIRCUITS DE MICROELECTRONIQUE 有权
    麦德龙合理定位微电路的电子

    公开(公告)号:EP1828712B1

    公开(公告)日:2008-07-23

    申请号:EP05848201.9

    申请日:2005-12-22

    CPC classification number: G01N21/211 G01B11/0641 G01N2021/213

    Abstract: The invention relates to a method and device for the polarimetric measurement of a flat object with regularly repeating patterns forming lines of a network. According to the invention, a first zero order measurement is carried out with an angle of incidence (1) for a first azimuthal angle (1), a second zero order measurement is made, with an angle of incidence (2) for a second azimuthal angle (2), the polarisation of the incident beam is modulated and the polarisation of the reflected beam analysed for each measurement, the theoretical polarimetric data for an object model of the real object are calculated, the object model having parameters which may be adjusted by means of a formalism of the electromagnetism. The object is characterised by making an iterative comparison of measured with the theoretical polarimetric data for different values for the adjustable parameters.

    Exposure apparatus and method, measuring apparatus, and device manufacturing method
    99.
    发明公开
    Exposure apparatus and method, measuring apparatus, and device manufacturing method 审中-公开
    曝光装置及曝光方法,装置的测量装置及其制造方法

    公开(公告)号:EP1698939A3

    公开(公告)日:2008-04-16

    申请号:EP06004225.6

    申请日:2006-03-02

    Abstract: An exposure apparatus includes an illumination optical (IO) system for illuminating the reticle (MK) using the ultraviolet light from the light source, and a polarization measuring unit (1) measuring the polarization state of the ultraviolet light, the polarization measuring unit including an optical unit for providing at least three different phase differences to the ultraviolet light that has passed at least part of the illumination optical system, a polarization element for providing a different transmittance in accordance with a polarization state of the ultraviolet light that has passed the optical unit, and an image pickup device (22) for detecting a light intensity of the ultraviolet light that has passed the polarization element, the polarization measuring unit measuring the polarization state of the ultraviolet light that has passed the at least part of the illumination optical system based on a detection result of the image pickup device.

    METHOD AND DEVICE FOR MEASURING POLARISATION STATE AND POLARISATION MODE DISPERSION IN PHOTONIC TRANSMISSION SYSTEMS
    100.
    发明公开
    METHOD AND DEVICE FOR MEASURING POLARISATION STATE AND POLARISATION MODE DISPERSION IN PHOTONIC TRANSMISSION SYSTEMS 审中-公开
    方法和设备测量光的偏振态和偏振模色散光子传输系统

    公开(公告)号:EP1865302A1

    公开(公告)日:2007-12-12

    申请号:EP06725797.2

    申请日:2006-03-03

    Abstract: A method and device capable of evaluating the specific values of the polarization state of the signal transmitted in a photonic transmission system for a number of frequencies of one or more of the pulses extracted from the optical signal by means of the translation of the frequential components of polarization state of one or more pulses to the time domain by means of the use of an optical Fourier transformer, and their sampling, quantification and subsequent analysis.
    From the analysis the variation in the polarization state versus frequency is calculated, as well as its associate PMD vector and the DGD present in the signal transmitted. This information may be used as a control signal for a PMD compensator device in order to upgrade the quality of communication in the system.

    Abstract translation: 通过的frequential组分的翻译的手段的方法,并且可在光子传输系统的数的一个或多个从所述光信号中提取的脉冲的频率的评估信号反式mitted的偏振状态的特定值的设备 一个或多个脉冲,以通过使用光学傅立叶变换器的手段随后的分析时域中,及其取样,量化和的偏振状态。 从分析中的偏振状态相对于频率的变化被计算,以及其关联PMD矢量和DGD信号中存在的反式mitted。 该信息可以以提升沟通的品质在系统中用作用于PMD补偿装置的控制信号。

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