Abstract:
In embodiments of the present invention, systems and methods of a non-invasive imaging device may comprise an illumination source comprising an incident light source to direct light upon skin, and a detector for detecting the degree of polarization of light reflected from the skin. A system and method of determining a skin state may be based on an aspect of the polarization of the reflected light.
Abstract:
This invention provides a method for measuring and monitoring the state of polarization (SOP) of a polarization maintaining (PM) fiber and the like using a narrowband fiber Bragg grating (FBG) written on the same. The PM fiber therefore comprises a first narrowband reference FBG which is used as a reference to measure and monitor the SOP of the PM fiber. Due to the birefringence properties of the PM fiber, the reference FBG will generally reflect two narrowband spectra, each having a central wavelength; one in the slow axis and one in the fast axis. By measuring the intensity of the reflected spectra in each axis and by tuning the fiber with a polarization controller, it is possible to adjust the fiber to a predetermined SOP. After having adjusted the PM fiber to a predetermined SOP, it is possible to accurately measure the optical properties of a second grating, or of another optical device, according to the predetermined SOP. The method of the present invention can also be advantageously used for accurate measurement of reflectivity.
Abstract:
A sensor and method for determining the optical properties of a sample material is disclosed. The sensor comprises a light source that generates a linearly polarized light beam having a predetermined polarization orientation with respect to the plane of incidence. The linearly polarized light beam is reflected off the sample and is split into second and third light beams where the second and third light beam consist of the combined projections of mutually orthogonal components of the first light beam. A signal processor measures the intensity difference between the second and third light beams to calculate the phase difference induced by the sample material.
Abstract:
A combined ellipsometer and oscillator system applied to a chamber (CH) for containing fluid, and method of decorrelated determination of thickness and optical constants of depositable materials present in a fluid. In use the ellipsometer determines the product of thickness and optical constant, and the oscillator system changes frequency of oscillation proportional to the thickness of material deposited upon a surface of an element therein.
Abstract:
A method for detecting and measuring physical perturbations sensed by a multi-mode waveguide, through which a number of modes of a coherent electromagnetic wave propagates through and exit from. The method comprises irradiating the exiting electromagnetic wave on one or more two-dimensional sensing arrays comprising a plurality of sensing elements that are sensitive to the irradiated electromagnetic wave; determining, simultaneously, in a parallel manner, absolute values of sensed changes across different zones of the two-dimensional sensing arrays, each zone comprising one or more sensing elements; and summing the absolute values of different groups of different zones to obtain a representation of the perturbations.
Abstract:
Low aberration relay systems modified to perform as spatial filters in reflectometer, spectrophotometer, ellipsometer, polarimeter and the like systems.
Abstract:
The invention relates to a method and device for the polarimetric measurement of a flat object with regularly repeating patterns forming lines of a network. According to the invention, a first zero order measurement is carried out with an angle of incidence (1) for a first azimuthal angle (1), a second zero order measurement is made, with an angle of incidence (2) for a second azimuthal angle (2), the polarisation of the incident beam is modulated and the polarisation of the reflected beam analysed for each measurement, the theoretical polarimetric data for an object model of the real object are calculated, the object model having parameters which may be adjusted by means of a formalism of the electromagnetism. The object is characterised by making an iterative comparison of measured with the theoretical polarimetric data for different values for the adjustable parameters.
Abstract:
An exposure apparatus includes an illumination optical (IO) system for illuminating the reticle (MK) using the ultraviolet light from the light source, and a polarization measuring unit (1) measuring the polarization state of the ultraviolet light, the polarization measuring unit including an optical unit for providing at least three different phase differences to the ultraviolet light that has passed at least part of the illumination optical system, a polarization element for providing a different transmittance in accordance with a polarization state of the ultraviolet light that has passed the optical unit, and an image pickup device (22) for detecting a light intensity of the ultraviolet light that has passed the polarization element, the polarization measuring unit measuring the polarization state of the ultraviolet light that has passed the at least part of the illumination optical system based on a detection result of the image pickup device.
Abstract:
A method and device capable of evaluating the specific values of the polarization state of the signal transmitted in a photonic transmission system for a number of frequencies of one or more of the pulses extracted from the optical signal by means of the translation of the frequential components of polarization state of one or more pulses to the time domain by means of the use of an optical Fourier transformer, and their sampling, quantification and subsequent analysis. From the analysis the variation in the polarization state versus frequency is calculated, as well as its associate PMD vector and the DGD present in the signal transmitted. This information may be used as a control signal for a PMD compensator device in order to upgrade the quality of communication in the system.