公开(公告)号：EP3161433A2

公开(公告)日：2017-05-03

申请号：EP15735749.2

申请日：2015-06-17

Applicant: Sony Corporation

Inventor： OZAWA, Ken

IPC: G01J3/02 ,  G01J3/28 ,  G01J3/453 ,  G01N21/35 ,  G01J4/04 ,  G01J4/00

CPC classification number: G01J1/42 ,  G01J1/0411 ,  G01J1/0429 ,  G01J1/0488 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0224 ,  G01J3/027 ,  G01J3/2823 ,  G01J3/4531 ,  G01J4/04 ,  G01J2004/005 ,  G01N2021/3595

Abstract: An imaging device and method are provided. Light from an object is provided as a plurality of sets of light beams to a phase difference array having a plurality of elements. The phase difference array is configured to provide different optical paths for light included within at least some of a plurality of sets of light beams. The light from the phase difference array is received at an imaging element array. The imaging element array includes a plurality of imaging elements. Information obtained from hyperspectral imaging data based on output signals of the imaging element array can be displayed.

Abstract translation: 提供了一种成像装置和方法。 来自物体的光被提供为具有多个元件的相位差阵列的多组光束。 相位差阵列被配置为为包括在多组光束中的至少一些光束内的光提供不同的光路。 来自相位差阵列的光在成像元件阵列处被接收。 成像元件阵列包括多个成像元件。 可以显示从基于成像元件阵列的输出信号的高光谱成像数据获得的信息。

公开(公告)号：EP3019841A1

公开(公告)日：2016-05-18

申请号：EP14749880.2

申请日：2014-06-20

Applicant: Université de Strasbourg ,  CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE - CNRS

Inventor： ZALLAT, Jihad ,  TORZYNSKI, Marc ,  LALLEMENT, Alex ,  HEINRICH, Christian

IPC: G01J4/00 ,  G02B27/28 ,  G01N21/21

CPC classification number: G01N21/23 ,  G01J4/00 ,  G01N21/21 ,  G01N2201/0636 ,  G01N2201/0683 ,  G02B5/3016 ,  G02B5/3083 ,  G02B27/0025 ,  G02B27/286

Abstract: The invention relates to a device for analyzing and/or generating a polarization state of a measurement point of a target object; the device includes: a polarizer suitable for selecting, in an incident light wave, a light beam which is linearly polarized in a predefined direction; a first birefringent element suitable for having said light beam pass therethrough; a second birefringent element identical to the first element and suitable for having said light beam pass therethrough, said light beam then being directly or indirectly directed toward said object in order to be reflected in the form of a reflected beam. In addition, the optical assembly consisting of one or more optical elements is located in an optical path between the first element and the second element, the optical assembly consisting of: an odd number of mirrors, or, an odd number of half-wave plates, or, an odd number of a mix of mirrors and half-wave plates.

公开(公告)号：EP2798322A4

公开(公告)日：2015-06-17

申请号：EP12861672

申请日：2012-04-06

Applicant: J A WOOLLAM CO INC

Inventor： HERZINGER CRAIG M

IPC: G01J4/00 ,  G01N21/21 ,  G01N21/3581

CPC classification number: G01J4/00 ,  G01N21/211 ,  G01N21/3581

Abstract: A terahertz ellipsometer, the basic preferred embodiment being a sequential system having a backward wave oscillator (BWO); a first rotatable polarizer that includes a wire grid (WGP1); a rotating polarizer that includes a wire grid (RWGP); a stage (STG) for supporting a sample (S); a rotating retarder (RRET) comprising first (RP), second (RM1), third (RM2) and fourth (RM3) elements; a second rotatable polarizer that includes a wire grid (WGP2); and a Golay cell detector (DET).

公开(公告)号：EP2738545A1

公开(公告)日：2014-06-04

申请号：EP13156249.8

申请日：2013-02-21

Applicant: Industrial Technology Research Institute

Inventor： Liu, Chih-Shang ,  Yang, Fu-Cheng

IPC: G01N21/21 ,  A61B3/00 ,  A61B5/00 ,  A61B5/145 ,  A61B5/1455 ,  G01J4/00 ,  G01J4/04 ,  G01N33/483

CPC classification number: G01B9/00 ,  A61B3/10 ,  A61B5/14532 ,  A61B5/14558 ,  A61B5/6821 ,  G01J4/04 ,  G01N21/21

Abstract: A system for measuring the rotation angle of optical active substances (15) has a light source (10), a polarization generation unit (11), a polarization analyzing unit (12), a signal generating unit (13), respectively and electrically coupled to the polarization generation unit (11) and the polarization analyzing unit (12), a signal processing unit (14), electrically coupled to the electric signal generating unit (13), wherein the light source (10) is enabled to emit a beam (100) toward the polarization generation unit (11) for enabling the beam (100) to be polarized into an incident polarized beam (110) while being projected and travelled in an optical path passing through an optical active substance (15) so as to be converted into a emerging beam (150); and the polarization analyzing unit (12) is positioned to receive and analyze the emerging beam (150) so as to generate a signal to be received and processed by the signal processing unit (14).

Abstract translation: 用于测量光学活性物质（15）的旋转角度的系统具有光源（10），偏振光生成单元（11），偏振分析单元（12），信号发生单元（13），并且电耦合 向所述偏振光生成单元（11）和所述偏振光分析单元（12）提供电耦合到所述电信号发生单元（13）的信号处理单元（14），其中所述光源（10）能够发射光束 （100）朝向极化发生单元（11），用于使光束（100）在通过光学活性物质（15）的光路中被投射和行进时被极化成入射偏振光束（110），以便 转换成新兴的梁（150）; 并且偏振分析单元（12）被定位成接收和分析出射光束（150），以便产生要由信号处理单元（14）接收和处理的信号。

公开(公告)号：EP2612158A1

公开(公告)日：2013-07-10

申请号：EP11749458.3

申请日：2011-09-02

Applicant: Centre national de la recherche scientifique

Inventor： RIKKEN, Geert ,  BATTESTI, Rémi ,  BEN-AMAR BARANGA, Andrei ,  FOUCHE, Mathilde ,  RIZZO, Carlo

IPC: G01R33/032 ,  G01J4/00 ,  G01J1/42 ,  H01S3/00

CPC classification number: G01R33/1215 ,  G01J1/4257 ,  G01J4/00 ,  G01R33/032 ,  H01S3/0014

Abstract: The invention relates to a device (1) and a method for measuring a magnetization generated within an active medium (10) or characterizing a linearly polarized electromagnetic wave when said active medium exhibits an inverse Cotton-Mouton effect, characterized in that it includes, in combination, at least one of the following elements: an active medium (10) in which a linearly polarized electromagnetic wave propagates; a means (11, 12) for producing a transverse magnetic field B
t relative to the propagation direction D
1 of said electromagnetic wave; and a device (2) for measuring the electrical signal appropriate for translating the magnetization generated within said active medium (10) by said electromagnetic wave.

Abstract translation: 本发明涉及一种用于测量在活性介质（10）内产生的磁化或者当所述活性介质显示出逆棉花 - 木顿效应时表征线性极化电磁波的方法，其特征在于，所述装置（1）包括： 结合至少一个以下元件：其中线偏振电磁波传播的有源介质（10） 一个用于产生相对于所述电磁波的传播方向D 1的横向磁场B t的装置（11,12） 以及用于测量适合于通过所述电磁波来平移在所述活性介质（10）内产生的磁化的电信号的装置（2）。

公开(公告)号：EP1902281A4

公开(公告)日：2013-01-09

申请号：EP06784936

申请日：2006-06-15

Applicant: J A WOOLLAM CO INC

Inventor： LIPHARDT MARTIN M

IPC: G01J4/00

CPC classification number: G01N21/211

公开(公告)号：EP2439716A3

公开(公告)日：2012-10-31

申请号：EP11180655.0

申请日：2011-09-09

Applicant: Ricoh Company, Ltd.

Inventor： Xue, Li ,  Hirai, Hideaki

IPC: G08G1/16 ,  G01J4/00 ,  G06K9/20 ,  G01N21/21 ,  G06T5/00 ,  G01J3/453 ,  G01J3/447 ,  G01J9/02 ,  G01J3/28

CPC classification number: G08G1/16 ,  G01J3/0229 ,  G01J3/28 ,  G01J3/447 ,  G01J3/453 ,  G01J9/0246 ,  G01N21/314 ,  G06K9/00798 ,  G06K9/00805 ,  G06K9/00825 ,  G06K9/2018 ,  G06T5/002 ,  G06T5/50 ,  G08G1/165 ,  G08G1/166 ,  G08G1/167

Abstract: An object identification device includes an image capturing device to capture images polarized in different directions for an object; a noise removal unit to remove noise in the polarized images using a noise removing parameter; an index value computing unit to compute an object identification index value for identification-processing areas in the polarized images using noise removed polarized images data; an object identification processing unit that conducts an object identification by determining identification processing areas corresponding to an identification target object based on the object identification index value; an environment information obtaining unit to obtain environment information of the object; an environmental condition determination unit to determine an environmental condition of the object based on the environment information; and a parameter storage unit to store noise removing parameters prepared for mutually exclusive environmental conditions. The noise removal unit reads a noise removing parameter from the parameter storage unit to conduct a noise removing.

公开(公告)号：EP2480869A1

公开(公告)日：2012-08-01

申请号：EP10818498.7

申请日：2010-09-21

Applicant: VOROTEC LTD.

Inventor： VOROVITCHIK, Shlomo

IPC: G01J4/00

CPC classification number: G01J4/04 ,  G01C17/34 ,  G01C21/02 ,  G01J2004/005

Abstract: An apparatus and system for use in determining location of a celestial body are presented. The apparatus comprises: a polarizer comprising an array of polarized light filter cells and a light sensor array. The array of polarized light filter cells comprises at least a first polarization direction and a second polarization direction different from said first polarization direction. And the polarizer thereby produces polarized light of at least first and second different polarizations. The light sensor array is configured to receive the polarized light from the polarizer and produce data indicative of a pattern of at least one of light polarization intensity and direction. The pattern is indicative of at least one of azimuth and elevation of the celestial body to be located.

Abstract translation: 1。一种包括偏振光滤波器单元阵列的设备，每个单元具有第一偏振方向的第一偏振滤波器和具有第二偏振方向的第二偏振滤波器，第二偏振方向不同于第一偏振方向; 将光引导到偏振滤光器阵列上的光学系统; 以及第一和第二光传感器，用于分别从通过第一和第二偏振滤光器接收的光产生数据。 另外，一种将光引导到偏振光滤波器单元阵列上的方法，每个单元具有具有第一偏振方向的第一偏振滤波器和具有不同于第一偏振方向的第二偏振方向的第二偏振滤波器; 从各自的第一和第二光传感器通过第一和第二偏振滤光器接收的光产生数据; 并基于该数据导出偏振图案。

公开(公告)号：EP2425217A1

公开(公告)日：2012-03-07

申请号：EP10770435.5

申请日：2010-04-30

Applicant: Oclaro (North America), Inc.

Inventor： YUE, Xuefeng ,  LIN, Christopher ,  SUN, Ruipeng ,  WANG, Ruibo

IPC: G01J4/00

CPC classification number: G02F1/31 ,  G02B6/3524 ,  G02F1/1396 ,  G02F2203/06 ,  G02F2203/58

Abstract: An optical device has the structure to perform switching and attenuation of an optical beam with reduced polarization dependent loss (PDL). The optical device includes a birefringent displacer and two liquid crystal (LC) structures. The first LC structure is used to condition s-polarized components of the optical beam and the second LC structure is used to condition p-polarized components of the optical beam. Each LC structure has a separate control electrode so that the s-polarized components of the optical beam and the p-polarized components of the optical beam can be conditioned differently and in such a manner that reduces PDL. The optical device may be configured for processing multiple input light beams, such as the multiple wavelength channels de-multiplexed from a wavelength division multiplexed (WDM) optical signal.

公开(公告)号：EP2399105A1

公开(公告)日：2011-12-28

申请号：EP10744347.5

申请日：2010-02-19

Applicant: International Business Machines Corporation

Inventor： BRUNNER, Timothy, A. ,  MCINTYRE, Gregory, R.

IPC: G01J4/00

CPC classification number: G06F17/50 ,  G01J4/04 ,  G03F1/44 ,  G03F7/70466 ,  G03F7/70566

Abstract: This invention relates to the manufacture of semiconductor substrates such as wafers and to a method for monitoring the state of polarization incident on a photomask in projection printing using a specially designed polarization monitoring reticle for high numerical aperture lithographic scanners. The reticle measures 25 locations across the slit and is designed for numerical apertures above 0.85. The monitors provide a large polarization dependent signal which is more sensitive to polarization. A double exposure method is also provided using two reticles where the first reticle contains the polarization monitors, clear field reference regions and low dose alignment marks. The second reticle contains the standard alignment marks and labels. For a single exposure method, a tri-PSF low dose alignment mark is used. The reticles also provide for electromagnetic bias wherein each edge is biased depending on that edge's etch depth.