摘要:
The invention relates to a method for examining an object with respect to information that is present on the object in the form of a relief-like structure. According to the inventive method, an initial height representation of the object is provided (10) which reflects the height profile of the object. The initial height representation of the object is processed using height changes in order to bring into prominence the relief-like structure in a processed representation (12, 14). The processed representation is then evaluated (16) for example by optical character recognition methods in order to extract the information that is given by the relief-like structure. The invention makes it thus possible to automatically and reliably detect information that is applied by means of relief-like structures on an object, for example a vehicle tire.
摘要:
A device for detecting a plant against a background includes a provider for providing a plurality of different photographs of the plant leaf against the background, the photographs differing in that image points of the different photographs relating to the same location of the plant leaf are illuminated with different levels of brightness, a selector for selecting such image points, from the different photographs, whose levels of brightness are within a predetermined range, an image point of a first photograph being selected for a first location of the plant leaf, and an image point of a second, different photograph being selected for a different location of the plant leaf to obtain a representation of the plant leaf against the background, the representation being composed of and/or merged from different photographs, and a segmenter for segmenting the composite photograph to obtain a segment representation having the plant leaf without the background or the background without the plant leaf.
摘要:
A device (100) for measuring a plant (105) comprises a plurality of light-section measuring devices (110), a rotator for causing a rotation (120) between the plant (105) and the plurality of light-section measuring devices (110) around a rotation axis (101), wherein each of the plurality of light-section measuring devices (110) is configured to generate a respective fan beam (130) in a respective fan plane, wherein the fan planes are arranged such that the rotation axis (101) extends within each of the fan planes, wherein the plurality of light-section measuring devices (110) is configured such that the fan beams (130) are directed to the plant (105) from different fan directions (135) which, when projected into a common plane (115) through which the rotation axis extends, by rotation around the rotation axis, differ from each other.
摘要:
Position errors of the flat-panel detector in the system of axes of the irradiation system relative to a predefined position which remain after, for example, a basic construction of the irradiation system are compensated, and thus the accuracy of the irradiation system is brought close, with almost any desired accuracy, to that accuracy that would have resulted if the flat-panel detector had subsequently also been precisely accurately adjusted mechanically, by a geometric correction of the irradiation raw image being carried out, such that a change in a projection of the irradiated object in the irradiation raw image owing to the position error is reduced or corrected.
摘要:
The aim of the invention is to advantageously monitor the production of objects composed of several layers of material that are successively applied on top of each other. Said aim is achieved by generating a vertical profile of a circumference of the object after applying a layer of material such that a comparison with a piece of reference data after applying each layer of material can be used for assessing whether the previous production step yielded a result that leads to the conclusion that the layer of material has been applied correctly.
摘要:
According to a method for characterising a surface which has a localised unevenness, a contour line of the surface is first generated as a function of a location variable (10). The localised unevenness is then detected in the contour line (12) and eliminated from the same (14), resulting in an incomplete contour line as a function of the location variable which characterises the surface without the localised unevenness. The incomplete contour line can be used either to assess the surface without the localised unevenness, for example in order to determine the lateral or radial runout of a tyre if the surface is a side flank or a bearing surface of a vehicle tyre, or to classify localised unevenness without the influence of the surface.