摘要:
A semiconductor memory device and operational method having reduced well noise are provided. The memory device includes a plurality of memory cells arranged in rows and columns within an array well and addressable by a plurality of word lines and bit lines. The array well is biased to a desired potential and a sense amplifier is employed to read bit line states during a predefined bit line signal development period. Array well biasing is removed during at least a portion of this signal development, so that the well potential floats (ideally remaining stable) as signals are being developed on the bit lines. This temporary, floating well technique is particularly important for open bit line architectures.
摘要:
A high density substrate plate trench DRAM cell memory device and process are described in which a buried region (32) is formed adjacent to deep trench capacitors such that the substrate region of DRAM transfer FETs can be electrically isolated from other FETs on a semiconductor substrate (10). The buried region (32) is partially formed by ion implantation and diffusion to intersect the walls of the deep trenches (22). The buried region (32) is contacted along its perimeter by a reach through region to complete the isolation. The combined regions reduce charge loss due to better control of device parasitics.
摘要:
A new interdigitated folded bit line (IFBL) architecture for a future generation high density semiconductor memory design is disclosed. In the architecture, the basic cross-point memory cells are organized orthogonally in rows and columns to form an array matrix. The bit lines run in a row direction while the word lines run in a column direction. Transfer transistors are designed to be shared with the same drain junction and the same bit line contact in order to save area. A choice of at least two described embodiments are provided. In one embodiment, referred to as the offset bit line structure, the bit lines are constructed by using two layers of interconnection lines to connect the interdigitated cells associated to it. By connecting the bit line contacts with two different interconnecting layers in an alternating row order, the true and complement bit lines will run parallel to both sides of the memory array. In another embodiment, referred to as the side wall bit line structure, the bit lines are constructed by using the conductive side wall spacer rails to connect the interdigitated cells associated to it. By connecting the side wall bit line contacts with two sided-side wall spacer rails in an alternating row order, the true and complement bit lines will run parallel to both sides of the memory array.
摘要:
A wordline driver circuit is shown for a DRAM, the circuit comprising a PMOS transistor structure (58) having one contact coupled to a wordline (60), a second contact coupled to a negative voltage supply and a gate coupled to a control input, the transistor having an N-well (64) about the gate, first and second contacts. An isolating structure (66) is positioned about the N-well (64) to enable it to be a separately controlled from surrounding N-well structures (64). Pulse circuits (52) are coupled to the transistor (58) for applying, when activated, a potential that enables the wordline (60) to transition to a more negative potential. A bias circuit is also provided for biasing the N-well (64) at a first potential and a second lower potential, the second lower potential applied when the pulse circuits (52) are activated. As a result, body effects in the PMOS transistor (58) are minimized while at the same time enabling a boost potential to be applied to the wordline (60).
摘要:
A DRAM is described including a plurality of operable storage cells (50), each cell (50) including a capacitance for storing a charge indicative of data. The charge tends to dissipate below an acceptable level after a predetermined time interval T1 for a majority of the operable cells and for a minority of the operable cells, it dissipates below the acceptable level after a shorter time interval T2. The time between DRAM refresh cycles is adjusted so as to be greater than time interval T2. In addition to the plurality of redundant storage cells (50) the DRAM comprises: a decoder (64) for receiving the address of an operable memory cell and providing a first output if the address indicates one of the operable cells of the minority of cells and a second output if the address indicates one of the operable cells of the majority. A switching circuit (56, 58, 72) is responsive to the first output to enable access of a redundant storage cell and to prevent access of the minority storage cell. In a preferred embodiment, the redundant storage cells (50) are configured as static storage circuits.
摘要:
A computer system is described which includes a DRAM having a plurality of memory cells (10, 12) arranged in rows and columns. The system includes a row address buffer (18), and circuitry (24) for generating a row address strobe signal that exhibits both active and inactive levels during each DRAM memory cycle and first and second transitions between those levels. A read-in circuit causes read-in of a row address to the DRAM's row address buffer (18). A delay circuit (54) is responsive to a delayed lagging transition of a row address strobe signal to provide an extended duration control signal which delays an output from the row address buffer (18). A reset/precharge circuit (33) is active during both the inactive row address strobe signal and the extended duration control signal to reset and precharge circuits and memory cells in the DRAM.
摘要:
A processor and method of fetching an instruction from a memory are disclosed. According to the method of the present invention, a plurality of target addresses are determined utilizing a plurality of previously fetched instructions, and a sequential address is determined utilizing a last of the plurality of previously fetched instructions. Concurrently with the determination of the target addresses and the sequential address, a select signal specifying one of the plurality of target addresses or the sequential address is generated. The select signal is used to select one of the plurality of target addresses or the sequential address as a memory request address. The memory request address is then transmitted from the processor to the memory so that the memory will supply at least one instruction to the processor. By generating the target addresses and sequential address concurrently with the generation of the selection signal, instruction fetch latency is reduced.
摘要:
A DRAM is described including a plurality of operable storage cells (50), each cell (50) including a capacitance for storing a charge indicative of data. The charge tends to dissipate below an acceptable level after a predetermined time interval T1 for a majority of the operable cells and for a minority of the operable cells, it dissipates below the acceptable level after a shorter time interval T2. The time between DRAM refresh cycles is adjusted so as to be greater than time interval T2. In addition to the plurality of redundant storage cells (50) the DRAM comprises: a decoder (64) for receiving the address of an operable memory cell and providing a first output if the address indicates one of the operable cells of the minority of cells and a second output if the address indicates one of the operable cells of the majority. A switching circuit (56, 58, 72) is responsive to the first output to enable access of a redundant storage cell and to prevent access of the minority storage cell. In a preferred embodiment, the redundant storage cells (50) are configured as static storage circuits.