摘要:
In one aspect, this document provides an implementation of a system for characterizing an oscillator. This system includes an input port that receives an oscillation signal from an oscillator under test; an input port signal splitter that splits the received oscillation signal into a first oscillation signal and a second oscillation signal; a first photonic signal processing branch circuit that processes the first oscillation signal to produce a first branch output signal; a second photonic signal processing branch circuit that processes the second oscillation signal to produce a second branch output signal; a dual channel signal analyzer that receives the first and second branch output signals to measure noise in the received oscillation signal; and a computer controller that controls the first and second photonic signal processing branch circuits and the dual channel signal analyzer to control measurements of the noise in the received oscillation signal.
摘要:
Testing device for testing a phase locked loop having a power supply input, said testing device comprising: a power supply unit for providing a power supply signal VDD having a variation profile to the power supply input of the phase locked loop, wherein a width and height of said variation profile are formed in such a way, that the voltage controlled oscillator is prevented from outputting an oscillating output signal U,,„ t a means for disabling a feedback signal to a phase comparator of the phase locked loop such that said phase locked loop is operated in an open loop mode, and a meter for measuring a measurement signal of the phase locked loop, while said power supply signal is provided to the power supply input.
摘要:
A high frequency component is disclosed in which the characteristics of a high frequency circuit that cannot be measured only by an outwardly led-out terminal electrode can be easily measured at the final-product stage. In the high frequency component, on a substrate (1) there is formed an electrode pattern including a signal measuring electrode pad (3). Additionally, chip components are mounted on the substrate (1). A metal cover (2) has a hole (4) formed near the signal measuring electrode pad (3). Through the hole (4), a probe of a measuring apparatus is inserted from the outside to abut with the electrode pad (3). With the arrangement, a voltage signal obtained at a predetermined point of the high frequency circuit can be measured.
摘要:
A clock signal monitor is described having a detector (24-34) responsive to a radio frequency input clock signal to provide a detected signal representative of the amplitude of the input signal. A threshold detector (36, 38, 40) detects whether or not the detected signal represents an amplitude below a threshold. A sounder (42) gives an alarm indication if amplitude below the threshold is detected. If the laboratory reference clock signal becomes weak or fails the alarm indication is given. Equipment's internal reference clock signal generator is generally sufficiently accurate that if incorrectly configured equipment is connected to the laboratory supply, resulting in amplitude modulation of the signal, the beat frequency would normally be around 1Hz. An intermittent alarm indication is thus given at the same frequency as the amplitude of the modulated signal falls below the threshold.