公开(公告)号：EP3117181A1

公开(公告)日：2017-01-18

申请号：EP15709471.5

申请日：2015-03-10

Applicant: VIT

Inventor： PERRIOLLAT, Mathieu ,  GERBELOT, Rémi

IPC: G01B11/25 ,  G06T7/00

CPC classification number: G01B11/2545 ,  G01B11/2513 ,  G01B11/2536

Abstract: The invention relates to a method for determining three-dimensional images of an object (Board), comprising projection of several images onto the object by at least one projector (P), each image being determined by modulation of first light patterns; acquisition, for each projected image, of at least one two-dimensional image of the object by at least one image sensor (C), preferably at least two image sensors; and determination of the height of each point of the object from the acquired two-dimensional images as if only the first patterns had been projected, the modulation being selected in such a way that the errors in determination are less than those obtained in the absence of modulation.

Abstract translation: 本发明涉及一种用于确定物体（板）的三维图像的方法，包括通过至少一个投影仪（P）将若干图像投射到物体上，每个图像通过调制第一光图案来确定; 对于每个投影图像，通过至少一个图像传感器（C），优选地至少两个图像传感器获取对象的至少一个二维图像; 并且从所获取的二维图像中确定对象的每个点的高度，如同仅投影了第一图案一样，调制被选择为使得确定中的错误小于在不存在 调制。

公开(公告)号：EP3115743A1

公开(公告)日：2017-01-11

申请号：EP15758032.5

申请日：2015-01-22

Applicant: Panasonic Intellectual Property Corporation of America

Inventor： FUCHIKAMI, Ryuji

IPC: G01B11/25

CPC classification number: G01B11/2509 ,  G01B11/2513 ,  G01B11/2536

Abstract: A measurement system (100) includes: a projection apparatus (102) that projects, onto a subject, first pattern light indicating a first pattern projection image including a first pattern image corresponding to a certain bit in gray code obtained by gray coding projection coordinates stipulated by a projection coordinate system, and a second pattern image having the same cycle as the first pattern image, but having a different phase from the first pattern image, following a projection sequence where projections of the first and second pattern images coexist; and at least one imaging apparatus (101) that images the first pattern light and generates an imaged image.

Abstract translation: 一种测量系统，其特征在于，包括：投影装置，向被摄体投影表示第一图案投影图像的第一图案光，该第一图案投影图像包括与通过规定的灰度编码投影坐标获得的格雷码中的某个比特对应的第一图案图像 以及第二图案图像，其具有与第一图案图像相同的周期，但具有与第一图案图像不同的相位，遵循第一图案图像和第二图案图像的投影共存的投影序列; 以及至少一个成像装置（101），其对第一图案光成像并产生成像的图像。

公开(公告)号：EP3101383A1

公开(公告)日：2016-12-07

申请号：EP16001151.6

申请日：2016-05-20

Applicant: Canon Kabushiki Kaisha

Inventor： Yamazaki, Tsuyoshi

IPC: G01B11/25 ,  G06T7/00 ,  G06T1/00 ,  G01N21/958

CPC classification number: B23P19/04 ,  B25J19/023 ,  G01B11/25 ,  G01B11/2513 ,  G06T1/0014 ,  G06T7/521

Abstract: The present invention provides a measurement apparatus for measuring a shape of an object to be measured, including a processing unit configured to obtain information on the shape of the object to be measured based on an image obtained by imaging the object to be measured onto which pattern light alternately including a bright portion and a dark portion along a first direction is projected, wherein the processing unit obtains a plurality of first signals different from each other and indicating a light intensity distribution in a second direction intersecting the first direction, from a region of the image, which corresponds to the dark portion.

Abstract translation: 本发明提供了一种用于测量被测量物体的形状的测量装置，包括：处理单元，被配置为基于通过将待测对象成像获得的图像获得关于被测量物体的形状的信息， 投影沿着第一方向交替地包括亮部和暗部的光，其中处理单元从第一方向的区域获得彼此不同的多个第一信号，并且指示与第一方向相交的第二方向上的光强度分布 该图像对应于暗部分。

公开(公告)号：EP3088839A1

公开(公告)日：2016-11-02

申请号：EP14873247.2

申请日：2014-10-31

Applicant: Sony Corporation

Inventor： NAGATA, Masaharu ,  MATSUI, Yasuhiro

IPC: G01B11/25

CPC classification number: H04N13/204 ,  G01B11/2513 ,  G01B11/2545 ,  G06T5/50 ,  G06T2207/10012 ,  G06T2207/10028 ,  G06T2207/10048 ,  G06T2207/20221 ,  H04N5/33 ,  H04N13/239 ,  H04N13/254 ,  H04N13/257 ,  H04N13/271 ,  H04N2013/0081 ,  H04N2013/0092

Abstract: [Object] To propose an image processing device and an image processing method capable of obtaining a pattern-irradiated infrared image and a pattern-irradiation-free infrared image to obtain more accurate depth information by controlling an infrared pattern irradiation timing.
[Solution] Provided is an image processing device including: a pattern irradiation unit that irradiates an infrared pattern onto a surface of a target object; and an infrared image capturing unit that captures an infrared image. The pattern irradiation unit performs irradiation at a predetermined timing corresponding to an infrared image capturing unit's image capturing timing. The infrared image capturing unit obtains a pattern-projected infrared image in which the pattern irradiated by the pattern irradiation unit is projected on the target object, and a pattern-free infrared image in which the pattern is not projected on the target object.

Abstract translation: 提供一种图像处理装置和图像处理方法，其能够通过控制红外图案照射定时来获得图案照射的红外图像和无图案照射的红外图像，以获得更准确的深度信息。 解决方案提供了一种图像处理装置，其包括：图案照射单元，其将红外线图案照射到目标物体的表面上; 以及捕获红外图像的红外图像捕获单元。 图案照射单元以与红外图像拍摄单元的图像拍摄定时对应的预定定时执行照射。 红外图像捕获单元获得图案照射单元照射的图案投影到目标对象上的图案投影的红外图像和图案未投影到目标对象上的无图案的红外图像。

公开(公告)号：EP3084347A1

公开(公告)日：2016-10-26

申请号：EP14812464.7

申请日：2014-12-12

Applicant: EXTEND3D GmbH

Inventor： KEITLER, Peter ,  HEUSER, Nicolas ,  SCHWERDTFEGER, Björn ,  RESCH, Christoph

IPC: G01B11/25

CPC classification number: G06T7/0006 ,  G01B11/2513 ,  G01C11/025 ,  G06K9/4671 ,  G06T7/514 ,  G06T7/75 ,  G06T2207/10028 ,  G06T2207/30164 ,  G06T2207/30204 ,  G06T2207/30244 ,  H04N13/246

Abstract: A method for carrying out and checking a machining step on a workpiece, using an apparatus comprising a projector, a photogrammetry device and a control unit which knows the relative position of the projector and photogrammetry device, comprises the following steps: referencing in order to determine the positioning of the workpiece relative to the projector and the photogrammetry device in a predefined coordinate system; projection of a work instruction onto the workpiece; machining of the workpiece by a worker; and checking of the machining by scanning at least a portion of the surface of the workpiece; wherein all the steps are carried out by the apparatus at the same workstation within the context of an integrated process and with the exception of the machining by the worker.

Abstract translation: 使用具有投影仪，摄影测量装置和知道投影仪和摄影测量装置的相对位置的控制单元的系统来执行和监视工件上的处理步骤的方法包括以下步骤：参考以确定 工件相对于投影仪和摄影测量装置在预定的坐标系中; 将工作指令投影到工件上; 工人加工工件; 以及通过扫描工件的表面的至少一部分来监视处理，其中除了工作者的处理之外的所有步骤都由所述装置执行，并且其中所有步骤在框架内的相同工作站执行 的综合过程。

公开(公告)号：EP2495527A3

公开(公告)日：2016-07-27

申请号：EP12156215.1

申请日：2012-02-20

Applicant: The Boeing Company

Inventor： Ashford, Curtis M.

IPC: G01C11/02 ,  G01B11/00 ,  G01B11/25 ,  G06T7/00

CPC classification number: G01C11/02 ,  G01B11/2513 ,  G01B11/2545

Abstract: A method and apparatus for making measurements. Images of an object (304) are generated. A plurality of coordinates for a plurality of points (320,322,323) on a surface of the object is identified from the images using a number of reference points in the images. A first portion (323) of the plurality of points on the object is visible on the object in the images. A second portion (322) of the plurality of points on the object is visible on a number of mirror units (312) in the images.

Abstract translation: 一种用于进行测量的方法和设备。 生成对象（304）的图像。 使用图像中的多个参考点从图像中识别对象表面上的多个点（320,322,323）的多个坐标。 物体上的多个点的第一部分（323）在图像中的物体上可见。 物体上的多个点的第二部分（322）在图像中的多个镜单元（312）上可见。

公开(公告)号：EP2175796A4

公开(公告)日：2016-06-01

申请号：EP08776487

申请日：2008-06-25

Applicant: DENSYS LTD ,  NETA URI ,  COHEN UDI

Inventor： ERNST MAURICE MOSHE ,  RAZ URI ,  GEFFEN MICHA

IPC: A61C1/00 ,  G01B11/25

CPC classification number: G01B11/24 ,  A61B5/0073 ,  A61B5/0084 ,  A61B5/0088 ,  A61B5/706 ,  A61B2034/105 ,  A61B2090/367 ,  A61C9/004 ,  A61C9/006 ,  G01B11/2513 ,  G06T7/70 ,  G06T7/73 ,  G06T2207/30036

公开(公告)号：EP3023736A1

公开(公告)日：2016-05-25

申请号：EP14826285.0

申请日：2014-07-17

Applicant: Nikon Corporation

Inventor： NAKAMURA, Yu

IPC: G01B11/24

CPC classification number: G01B11/2513 ,  G01B11/2416 ,  G01B11/25 ,  G01B11/2518 ,  G01B2210/54

Abstract: The purpose of the present invention is to more quickly and easily measure the shape of an object to be measured. A shape measurement device includes: a probe including a projection optical system that projects a line-shaped pattern onto a surface of the object to be measured or projects a spot pattern while scanning in at least a linear scanning range, and an image capturing device that detects an image of the pattern projected onto the object to be measured; a movement mechanism that rotates the object to be measured and the probe relative to each other so that the object to be measured rotates relative to the probe around a rotation axis and moves at least one of the probe and the object to be measured relatively in a direction that intersects with a rotation direction in which the object to be measured rotates; a measurement region setting unit that sets a measurement region of the object to be measured; and an actual measurement region setting unit that sets an actual measurement region including an actual measurement start position and an actual measurement end position on the basis of the measurement region set by the measurement region setting unit. The actual measurement region setting unit sets whichever of the actual measurement start position and the actual measurement end position is closer to a rotation axis center to be closer to the rotation axis than the measurement region, or sets whichever of the actual measurement start position and the actual measurement end position is located further outward in the radial direction to be further from the rotation axis than the measurement range.

公开(公告)号：EP3002550A1

公开(公告)日：2016-04-06

申请号：EP15187756.0

申请日：2015-09-30

Applicant: Ricoh Company, Ltd.

Inventor： SEKIGUCHI, Hiroyoshi ,  KOYAMA, Terunori ,  YAMADA, Kazuyoshi

IPC: G01B11/25

CPC classification number: G06T7/44 ,  G01B11/2513 ,  G06T7/529 ,  G06T7/593 ,  H04N5/2256 ,  H04N13/128 ,  H04N13/239 ,  H04N2013/0081

Abstract: An information processing system comprises: a light emitting unit (8, 8a) that irradiates pattern light having a specific pattern to a subject (20) to form a texture on the subject (20); an imaging unit (106) that captures the subject (20) on which the texture is formed; a deriving unit (62) that derives distance information to the subject (20) based on an image captured by the imaging unit (106); an analyzing unit (200) that analyzes whether or not an image abnormality is present in either one of the captured image and an image based on the distance information; and a dimming unit (201) that performs dimming control when the analyzing unit (200) analyzes that the image abnormality is present.

Abstract translation: 一种信息处理系统，包括：发光单元（8,8a），其将具有特定图案的图案光照射到被摄体（20）以在所述被摄体（20）上形成纹理; 捕获其上形成有纹理的对象（20）的成像单元（106）; 导出单元（62），其基于由所述成像单元（106）捕获的图像将距离信息导出到所述对象（20）; 分析单元，其基于所述距离信息分析所捕获的图像和图像中的任一个中是否存在图像异常; 以及当分析单元（200）分析存在图像异常时，执行调光控制的调光单元（201）。

公开(公告)号：EP2975834A1

公开(公告)日：2016-01-20

申请号：EP15179838.6

申请日：2006-05-09

Applicant: Xenogen Corporation

Inventor： Rice, Bradley W ,  Cable, Michael D ,  Nilson, David ,  Kearney, Kevin

IPC: H04N5/222 ,  A61B5/107 ,  A61B5/00 ,  G01B11/25 ,  G01N21/64 ,  G01N21/76 ,  G06T7/00 ,  H04N13/02

CPC classification number: G01B11/2513 ,  A61B5/0059 ,  A61B5/0064 ,  A61B5/107 ,  A61B5/6888 ,  A61B2503/40 ,  G01B11/2518 ,  G01N21/6456 ,  G01N21/763 ,  G06T7/521 ,  H04N13/254

Abstract: The present invention integrates a structured light source into an imaging system for reconstructing surface topography of an object being imaged. The structured light source includes a mechanism for transmitting a set of lines onto the object from an angle. The lines are displaced, or phase shifted relative to a stage, when they encounter an object with finite height, such as a mouse. This phase shift provides structured light information for the object. A camera captures the structured light information. Using software that employs a structured light analysis, surface topography data for the object is determined from the phase shift of the lines.