公开(公告)号：EP3129592A1

公开(公告)日：2017-02-15

申请号：EP14894607.2

申请日：2014-06-13

Applicant: Halliburton Energy Services, Inc.

Inventor： GAO, Li ,  PELLETIER, Michael T. ,  PERKINS, David L.

IPC: E21B49/00 ,  E21B49/08 ,  G01N27/04 ,  G01B11/25 ,  G01N21/01

CPC classification number: E21B49/08 ,  E21B47/10 ,  G01B11/25 ,  G01J3/00 ,  G01J2003/1213 ,  G01J2003/1243 ,  G01N21/01 ,  G01N21/31 ,  G01N21/3504 ,  G01N21/3577 ,  G01N21/3581 ,  G01N22/00 ,  G01N33/2823 ,  G02B27/60 ,  H05K1/0296 ,  H05K1/09 ,  H05K3/125 ,  H05K3/1275 ,  H05K2201/0323 ,  H05K2201/0329

Abstract: An optical analysis tool includes an integrated computational element (ICE). The ICE includes a plurality of layers stacked along a first axis. Constitutive materials of the layers are electrically conductive and patterned with corresponding patterns. An arrangement of the patterns with respect to each other is related to a characteristic of a sample.

Abstract translation: 光学分析工具包括集成计算元件（ICE）。 ICE包括沿着第一轴线堆叠的多个层。 这些层的组成材料是导电的并且具有相应图案的图案。 图案相对于彼此的布置与样本的特征有关。

公开(公告)号：EP2929319A4

公开(公告)日：2016-12-21

申请号：EP14796389

申请日：2014-03-14

Applicant: HALLIBURTON ENERGY SERVICES INC

Inventor： PERKINS DAVID L ,  FREESE ROBERT PAUL ,  JONES CHRISTOPHER MICHAEL ,  GARDNER RICHARD NEAL

IPC: G01N21/00 ,  C23C14/24 ,  C23C14/50 ,  G01N21/17 ,  G01N21/84 ,  G02B5/28

CPC classification number: C23C14/547 ,  C23C14/10 ,  C23C14/24 ,  C23C14/50 ,  C23C14/505 ,  C23C14/54 ,  C23C14/542 ,  E21B47/00 ,  G01J3/00 ,  G01N21/25 ,  G01N21/31 ,  G01N2021/317 ,  G01V8/10 ,  G02B5/28 ,  G02B27/0012 ,  G05B19/418 ,  G05B2219/45031 ,  G06E3/001

Abstract: A system includes a computational system to receive a design of an integrated computational element (ICE) including specification of a substrate and a plurality of layers, their respective target thicknesses and complex indices, such that a notional ICE fabricated based on the ICE design is related to a characteristic of a sample. Additionally, the system includes a deposition chamber including a deposition source to provide a deposition plume having a plume spatial profile, and a support to support a plurality of instances of the substrate during fabrication of a plurality of instances of the ICE. The support is spaced apart from the deposition source and has a shape that corresponds to the plume spatial profile, such that when the supported instances of the substrate are distributed over the support, thicknesses of instances of each of the deposited layers are substantially uniform across the plurality of instances of the ICE.

公开(公告)号：EP2929319A1

公开(公告)日：2015-10-14

申请号：EP14796389.6

申请日：2014-03-14

Applicant: Halliburton Energy Services, Inc.

Inventor： PERKINS, David L. ,  FREESE, Robert Paul ,  JONES, Christopher Michael ,  GARDNER, Richard Neal

IPC: G01N21/00 ,  G01N21/17 ,  G01N21/84

CPC classification number: C23C14/547 ,  C23C14/10 ,  C23C14/24 ,  C23C14/50 ,  C23C14/505 ,  C23C14/54 ,  C23C14/542 ,  E21B47/00 ,  G01J3/00 ,  G01N21/25 ,  G01N21/31 ,  G01N2021/317 ,  G01V8/10 ,  G02B5/28 ,  G02B27/0012 ,  G05B19/418 ,  G05B2219/45031 ,  G06E3/001

Abstract: A system includes a computational system to receive a design of an integrated computational element (ICE) including specification of a substrate and a plurality of layers, their respective target thicknesses and complex indices, such that a notional ICE fabricated based on the ICE design is related to a characteristic of a sample. Additionally, the system includes a deposition chamber including a deposition source to provide a deposition plume having a plume spatial profile, and a support to support a plurality of instances of the substrate during fabrication of a plurality of instances of the ICE. The support is spaced apart from the deposition source and has a shape that corresponds to the plume spatial profile, such that when the supported instances of the substrate are distributed over the support, thicknesses of instances of each of the deposited layers are substantially uniform across the plurality of instances of the ICE.

公开(公告)号：EP2633368A1

公开(公告)日：2013-09-04

申请号：EP11836742.4

申请日：2011-10-25

Applicant: National University of Singapore

Inventor： HEUSSLER, Sascha Pierre ,  MOSER, Herbert O.

IPC: G03F7/20

CPC classification number: G02B5/18 ,  G01J3/00 ,  G03F7/0002 ,  G03F7/0005 ,  G03F7/0017 ,  G03F7/0037 ,  G03F7/2014 ,  G03F7/203 ,  G03F7/213 ,  G03F7/70058 ,  G03F7/70416 ,  G03F7/70466

Abstract: A lithography method and apparatus is disclosed herein. In a described embodiment, the method comprises (i) providing a first mask 316 having an exposure pattern 332,334 for forming a three dimensional structure; (ii) exposing the first mask 316 to radiation to form the exposure pattern 332,334 on a radiation-sensitive resist 314; the exposure pattern 332,334 defined by irradiated areas 336 and non-irradiated areas 337 of the resist 314; (ii) providing a second mask 328; and (iii) during exposure, changing relative positions (arrows B and C) between the first mask 316 and the second mask 328 to shield selected portions of the irradiated areas 336 from radiation to enable varying depth profiles to be created in the three dimensional structure.

公开(公告)号：EP2466281A1

公开(公告)日：2012-06-20

申请号：EP11009686.4

申请日：2011-12-08

Applicant: Olympus Corporation

Inventor： Miyazono, Yuya

IPC: G01J3/02 ,  G01J3/28

CPC classification number: G01J3/00 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/28 ,  G01J3/2803

Abstract: A spectroscopic detector (110) includes a spectroscopic element (11) for dispersing light, a photodetector (12) for detecting the light dispersed by the spectroscopic element and a condensing optical system (13) for condensing the dispersed light to the photodetector and compensating for a deviation in a detected wavelength deriving from nonlinearity of the angle of emergence generated in the spectroscopic element through chromatic aberration of magnification.

Abstract translation: 分光检测器（110）包括用于分散光的分光元件（11），用于检测由分光元件分散的光的光电检测器（12）和用于将分散的光聚集到光电检测器的聚光光学系统（13） 通过色散像差从分光元件中产生的出现角度的非线性导出的检测波长的偏差。

公开(公告)号：EP0829224A2

公开(公告)日：1998-03-18

申请号：EP97114114.8

申请日：1997-08-14

Applicant: Columbus Schleif-und Zerspantechnik Hard-und Software GmbH

Inventor： Zürl, K. Dr.Ing. ,  Weiss, Armin ,  Zobel, F. ,  Boos, Karl-Siegfried Prof.

IPC: A61B5/00

CPC classification number: G01J3/00 ,  A61B5/441 ,  G01N21/1702 ,  G01N21/37

Abstract: Es wird ein differentieller Meßkopf für photoakustische Messungen zur Verfügung gestellt, der zwei oder mehrere Meßzellen enthält und wobei intensitätsmoduliertes Licht gleicher Wellenlängen in jeweils zwei benachbarten Meßzellen eingestrahlt wird. Die Vorteile der Erfindung liegen in einer höheren Empfindlichkeit für die zu messende Größe bei gleichzeitiger Immunität gegen Störungen von außen, in der Festellung und Kompensation von Inhomogenitäten in der Probenoberfläche z.B. in der Haut des Menschen und in einem vergrößerten Dynamikbereich.

Abstract translation: 用于光声学的测量头（1）具有由压力吸收器（4）连接的两个或更多个由具有相同波长的调制强度的光照射的测量单元（2）。