摘要:
According to one embodiment, a terminal control substrate includes a base plate (110, 210, 310, 410, 510) mounted on a terminal device, a first module (112, 212, 312, 412, 512) fixed to the base plate (110, 210, 310, 410, 510), an external connection terminal (113, 213a to 213c, 313, 413a to 413c, 513a to 513c) fixed to the base plate (110, 210, 310, 410, 510) and to which a component comprising a second module being a substitute for the first module (112, 212, 312, 412, 512) is attachable, a controller (111, 211, 311, 411, 511) configured to perform control in the terminal device by using the first module (112, 212, 312, 412, 512) or the second module, and a switching unit (114, 214, 314, 414, 521) configured to switch a connection destination of the controller (111, 211, 311, 411, 511) to any one of the first module (112, 212, 312, 412, 512) and the external connection terminal (113, 213a to 213c, 313, 413a to 413c, 513a to 513c) to which the second module is attached.
摘要:
An apparatus is provided. The apparatus includes a calibration circuit (200) configured to generate a reference signal (VREF) and at least one differential circuit each being configured to operate at a calibrated transconductance over process or condition variations based on the reference signal. The calibration circuit (200) may be configured to generate the reference signal (VREF) independent of the at least one differential circuit. A method for operating at least one differential circuit is provided. The method includes generating a reference signal (VREF) and operating the at least one differential circuit at a calibrated transconductance or gain over process or condition variations based on the reference signal. The reference signal (VREF) may be generated independently of the at least one differential circuit.
摘要:
An integrated circuit (IC) for sensing a current flowing through a transistor device includes a substrate and a current scaling circuit that includes first and second MOSFET devices. The first MOSFET device has a drain coupled to the switched FET at a first node and a source coupled to the substrate. The second MOSFET device has a source coupled to the substrate and a drain coupled to a second node. The first MOSFET device has a channel size that is K times larger than the second MOSFET device. Circuitry is included that equalizes a voltage across both the first MOSFET device and the second MOSFET device.
摘要:
An electronic equipment (32) is provided with a semiconductor device (10a) including an electrode joined to an electric conductor via a joint layer (20a), a calculator (58) and a controller. The semiconductor device (10a) is configured to pass current bidirectionally. The calculator (58) is configured to calculate an imbalance electromigration (EM) progression index. The imbalance EM progression index is a difference between a forward current EM progression index and a reverse current EM progression index. The controller (58) is configured to: adopt a condition to speed up an increase rate of the reverse current EM progression index in at least a part of an excessive forward current EM period; and adopt a condition to speed up an increase rate of the forward current EM progression index in at least a part of an excessive reverse current EM period.
摘要:
An "overvoltage protection device" that protects a device from an overvoltage of a signal line regardless of an ON/OFF state of a power supply is provided. A resistor (R) that is connected in series between an internal signal line (SL) connected to a communication terminal (122) of a processor (12) and a communication line (CL), a diode (D) of which a cathode is connected to the internal signal line (SL) and an anode is connected to a ground (GND), and a PNP transistor (Q) of which a base is connected to a power supply terminal (121), an emitter is connected to the internal signal line (SL), and a collector is connected to the ground (GND) are provided. When a base-emitter voltage (a junction saturation voltage) of the transistor (Q) in operation is defined as V BE and a power source (VDD) is turned on (a voltage V1) by the operation of the transistor (Q), a voltage of the internal signal line (SL) is limited to the source voltage VDD + V BE (a). When the power source (VDD) is turned off (a voltage 0 V), the voltage of the internal signal line (SL) is limited to the source voltage 0 V + V BE (b).
摘要:
A PUC (Physical Unclonable Constant) cell characterized by a very low complexity comparable to that of an SRAM cell and by much greater reliability than an SRAM cell as it is characterized by only one stable equilibrium point the position of which depends on random differences introduced during the step of manufacturing the chip. The PUC cell according to the present invention is also stable over a wide range of operating temperatures and offers considerable noise immunity, thus making the use of stabilizers adapted to ensure the correct output and which are normally used along with conventional SRAM type cells unnecessary.