摘要:
An object to be detected is illuminated by a single broadband light source or multiple light sources emitting light at different wavelengths. The light is captured by an imager, which includes a light-detecting sensor covered by a hybrid filter.
摘要:
A system for monitoring an ergonomic risk condition of a user includes a hand-held device (10) having a sensor (86) that senses a stress parameter related to the user and generates stress data in response. The system additionally includes a processing unit (50) in communication with the sensor (86). The processing unit (50) determines an ergonomic risk condition in response to the stress data.
摘要:
A semiconductor sensor (100) includes a semiconductor layer (102) having an incident surface (104) to receive incident radiant energy (110) on one side of the semiconductor layer (102) and having a corrugated surface on an opposite side of the semiconductor layer (102); and a metal layer (106) having a corrugated surface matching the corrugated surface of the semiconductor layer (102) and contacting the corrugated surface of the semiconductor layer (102) to form a corrugated interface (108) between the semiconductor layer (102) and the metal layer (106). The corrugated interface (108) is substantially parallel to the incident surface (104) of the semiconductor layer (102), and provides an energy absorption path over which the incident radiant energy (110) is absorbed.
摘要:
In one aspect, a semiconductor device (10) includes a p-region (12) and an n-region (14). The p-region (12) includes a first Group IV semiconductor that has a bandgap and is doped with a p-type dopant, and a first region (18) of local crystal modifications inducing localized strain that increases the bandgap of the first Group IV semiconductor and creates a conduction band energy barrier against transport of electrons across the p-region (12). The n-region (14) includes a second Group IV semiconductor that has a bandgap and is doped with an n-type dopant, and a second region (20) of local crystal modifications inducing localized strain that increases the bandgap of the second Group IV semiconductor and creates a valence band energy barrier against transport of holes across the n-region (14).