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    ONLINE MONITORING OF CONTAMINANTS IN CRUDE AND HEAVY FUELS, AND REFINERY APPLICATIONS THEREOF
    1.
    发明授权
    ONLINE MONITORING OF CONTAMINANTS IN CRUDE AND HEAVY FUELS, AND REFINERY APPLICATIONS THEREOF 有权
    在线监测原油和重油中的污染物及其炼油厂的应用

    公开(公告)号：EP2721396B1

    公开(公告)日：2018-04-04

    申请号：EP12802054.2

    申请日：2012-06-14

    申请人： X-Ray Optical Systems, Inc.

    发明人： BEUMER, Albertus ,  CHEN, Zewu

    IPC分类号： G01N23/223 ,  G01N33/22 ,  G01N33/28

    CPC分类号： G01N23/223 ,  G01N33/2823 ,  G01N2223/076 ,  G01N2223/1003 ,  G01N2223/637 ,  G01N2223/652

    摘要： A technique, including associated method and system, for on-line measurement of a trace element in a crude or heavy fuel stream for a refinery, including in one embodiment: providing at least one x-ray fluorescence (“XRF”) analyzer at a point for the refinery; analyzing the petroleum stream for chlorine using the analyzer; and providing results from the analyzer to refinery operators, to improve refinery operations. The analyzer may be a monochromatic wavelength XRF analyzer, wherein the analyzer focuses energy to/from the stream using an x-ray engine having at least one focusing, monochromating x-ray optic. The analyzer may be an MWDXRF or ME-EDXRF analyzer; and the trace element may be one or more of the following elements: S, Cl, P, K, Ca, V, Mn, Fe, Co, Ni, Cu, Zn, Hg, As, Pb, and Se; and in one embodiment the stream is crude, and the trace element is chlorine.

    MOVEABLE TRANSPARENT BARRIER FOR X-RAY ANALYSIS OF A PRESSURIZED SAMPLE
    3.
    发明公开
    MOVEABLE TRANSPARENT BARRIER FOR X-RAY ANALYSIS OF A PRESSURIZED SAMPLE 审中-公开
    MOVING透明阻挡用于加压探头的X射线分析

    公开(公告)号：EP1644723A1

    公开(公告)日：2006-04-12

    申请号：EP04755423.3

    申请日：2004-06-16

    申请人： X-RAY OPTICAL SYSTEMS, INC.

    发明人： GALLAGHER, Brian

    IPC分类号： G01N23/223

    摘要： A technique is disclosed for presenting a sample to a radiation interface of an analysis engine employing x-ray, neutron ray, gamma ray or particle-beam radiation to analyze the sample. A protective barrier, transparent to the radiation, and separating the sample from the engine, is moveable relative to the radiation interface, using a barrier movement system. The barrier in one embodiment is a film movable over a cavity in which the sample placed, and moveable with a system of reels to provide and retrieve a generally continuous supply of film over the cavity. The cavity may form a portion of a sample path through which the sample is moveable. If the sample path is pressurized, the film maintains the pressure during analysis of the sample by the analysis engine.

    DOUBLY CURVED OPTICAL DEVICE WITH GRADED ATOMIC PLANES
    4.
    发明公开
    DOUBLY CURVED OPTICAL DEVICE WITH GRADED ATOMIC PLANES 有权
    级配原子层双弯曲光学器件

    公开(公告)号：EP1234310A1

    公开(公告)日：2002-08-28

    申请号：EP00980804.9

    申请日：2000-11-27

    申请人： X-Ray Optical Systems Inc.

    发明人： CHEN, Zewu

    IPC分类号： G21K1/06

    CPC分类号： B82Y10/00 ,  G21K1/06 ,  G21K1/062 ,  G21K2201/064 ,  G21K2201/067

    摘要： An optically curved device is presented for use in focusing or imaging x-rays from a divergent source. The device includes a plurality of curved atomic reflection planes, at least some of which are separated by a spacing d which varies in at least one direction across the optically curved device. A doubly curved optical surface is disposed over the plurality of curved reflection planes. The spacing d varies continuously in the at least one direction for enhanced matching of incident angles of x-rays from a divergent source impinging on the optical surface with the Bragg angles on at least some points of the optical surface. The doubly curved optical surface can have an elliptic, parabolic, spheric or aspheric profile.

    CURVED OPTICAL DEVICE AND METHOD OF FABRICATION
    6.
    发明公开
    CURVED OPTICAL DEVICE AND METHOD OF FABRICATION 有权
    液晶器件对于X射线光学及相关方法

    公开(公告)号：EP1147522A1

    公开(公告)日：2001-10-24

    申请号：EP00903323.4

    申请日：2000-01-18

    申请人： X-Ray Optical Systems Inc.

    发明人： CHEN, Zewu

    IPC分类号： G21K1/06

    CPC分类号： G21K1/06 ,  G21K2201/067

    摘要： An optically curved device and method of fabrication are presented wherein a flexible layer is bonded to a thick epoxy layer which functions to conform the flexible layer to a desired shape. The thick epoxy layer undergoes high viscosity flow under pressure and conforms the flexible layer to a curved surface of a mold. The pressure on the epoxy can be created by squeezing the epoxy using a backing plate. As long as the optically smooth surface of the flexible layer has good contact with the curved surface of the mold under pressure of the epoxy flow, irregularities in the flexible layer optical surface are eliminated and the shape of the flexible layer is maintained when the epoxy is cured and the mold removed. Materials other than epoxies, such as thermal plastics, can also be used for bonding and conforming the flexible layer.

    NON-HOMOGENEOUS SAMPLE SCANNING APPARATUS, AND X-RAY ANALYZER APPLICATIONS THEREOF
    9.
    发明公开
    NON-HOMOGENEOUS SAMPLE SCANNING APPARATUS, AND X-RAY ANALYZER APPLICATIONS THEREOF 审中-公开
    VORRICHTUNG ZUR ABTASTUNG NICHTHOMOGENER PROBEN UNDRÖNTGENANALYSATORANWENDUNGENDAMIT

    公开(公告)号：EP3069126A1

    公开(公告)日：2016-09-21

    申请号：EP14861501.6

    申请日：2014-11-11

    申请人： X-Ray Optical Systems, Inc.

    发明人： CHEN, Zewu ,  ALLEN, George ,  LU, Peng ,  SPINAZOLA, Joseph

    IPC分类号： G01N23/00 ,  G01N23/223

    CPC分类号： G01N23/223 ,  G01N2223/3306 ,  G01N2223/3307 ,  G01N2223/3308

    摘要： A sample scanning apparatus / technique / method for a material analyzer, including moving a sample cell containing a sample over a measurement focal area of the analyzer according to a scan pattern, thereby scanning the sample over the measurement focal area in the scan pattern, and exposing multiple areas of the sample to the focal area. A sample cell rotator for rotating a sample cell is provided; along with a linear motion stage. The combined rotation and linear movement results in scanning the sample over the focal area in a scan pattern, thereby exposing multiple areas of the sample to the focal area. The sample scanning apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area.

    摘要翻译： 一种用于材料分析仪的样品扫描装置/技术/方法，包括根据扫描图案在分析仪的测量焦点区域上移动包含样品的样品池，从而在扫描图案中的测量焦点区域上扫描样品，以及 将样品的多个区域暴露于焦点区域。 提供了用于旋转样品池的样品池旋转器; 以及线性运动阶段。 组合的旋转和线性运动导致以扫描图案在焦点区域上扫描样本，从而将样本的多个区域暴露于焦点区域。 样本扫描装置可以与光学启用的X射线分析仪结合使用，该X射线分析仪包括具有x射线激发路径的x射线引擎和x射线检测路径，其中x射线 激发和/或x射线检测路径限定样本焦点区域。

    X-RAY ANALYZER HAVING MULTIPLE EXCITATION ENERGY BANDS PRODUCED USING MULTI-MATERIAL X-RAY TUBE ANODES AND MONOCHROMATING OPTICS
    10.
    发明公开
    X-RAY ANALYZER HAVING MULTIPLE EXCITATION ENERGY BANDS PRODUCED USING MULTI-MATERIAL X-RAY TUBE ANODES AND MONOCHROMATING OPTICS 审中-公开
    对于Analysis使用具有多个激励能带X射线设备进行使用多种材料和单色光学器件的X射线管涂层阳极

    公开(公告)号：EP2820666A1

    公开(公告)日：2015-01-07

    申请号：EP13754897.0

    申请日：2013-02-27

    申请人： X-Ray Optical Systems, Inc.

    发明人： CHEN, Zewu

    IPC分类号： H01J35/08 ,  G01N23/00

    CPC分类号： H01J35/08 ,  G01N23/223 ,  G21K1/062 ,  G21K1/067 ,  G21K2201/062 ,  H01J35/14 ,  H01J2235/081 ,  H01J2235/084 ,  H01J2235/088

    摘要： An x-ray tube includes a target on which electrons impinge to form a diverging x-ray beam. The target has a surface formed from first and second target materials, each tailored to emit a respective x-ray energy profile. A first x-ray optic may be provided for directing the beam toward the sample spot, the first x-ray optic monochromating the diverging x-ray beam to a first energy from the energy emitted by the first target material; and a second x-ray optic may be provided, for directing the beam toward the sample spot, the second x-ray optic monochromating the diverging x-ray beam to a second energy from the energy emitted by the second target material. Fluorescence from the sample spot induced by the first and second monochromated energies is used to measure the concentration of at least one element in the sample, or separately measure elements in a coating and underlying substrate.