摘要:
A sample scanning apparatus / technique / method for a material analyzer, including moving a sample cell containing a sample over a measurement focal area of the analyzer according to a scan pattern, thereby scanning the sample over the measurement focal area in the scan pattern, and exposing multiple areas of the sample to the focal area. A sample cell rotator for rotating a sample cell is provided; along with a linear motion stage. The combined rotation and linear movement results in scanning the sample over the focal area in a scan pattern, thereby exposing multiple areas of the sample to the focal area. The sample scanning apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area.
摘要:
An x-ray tube includes a target on which electrons impinge to form a diverging x-ray beam. The target has a surface formed from first and second target materials, each tailored to emit a respective x-ray energy profile. A first x-ray optic may be provided for directing the beam toward the sample spot, the first x-ray optic monochromating the diverging x-ray beam to a first energy from the energy emitted by the first target material; and a second x-ray optic may be provided, for directing the beam toward the sample spot, the second x-ray optic monochromating the diverging x-ray beam to a second energy from the energy emitted by the second target material. Fluorescence from the sample spot induced by the first and second monochromated energies is used to measure the concentration of at least one element in the sample, or separately measure elements in a coating and underlying substrate.
摘要:
Apparatus for detecting substantially monochromatic fluorescent x-rays in a wavelength dispersive system (110) in which substantially divergent x-rays produced by an x-ray source (112) are focused toward a sample using a focusing x-ray optic (114), comprising a semiconductor-type x-ray detector (120) having an uncooled detector active area, said active area for directly detecting said fluorescent x-rays; and means for focusing at least some of the x-ray fluorescence on the semiconductor-type x-ray detector.
摘要:
An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.
摘要:
An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x- ray excitation beam is generated by an x-ray engine and passes through an x- ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream suspended in the space and streaming through the focal area, using a laminar air flow and/or pressure to define the stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.
摘要:
X-ray fluorescence (XRF) spectroscopy systems and methods are provided. One system (100) includes a source (110) of x-ray radiation and an excitation optic (120) disposed between the x-ray radiation source (110) and the sample (130) for collecting x-ray radiation from the source and focusing the x-ray radiation to a focal point on the sample to incite at least one analyte in the sample to fluoresce. The system (100) further includes an x-ray fluorescence detector (150) and a collection optic (140) comprising a doubly curved diffracting optic disposed between the sample and the x-ray fluorescence detector for collecting x-ray fluorescence from the focal point on the sample and focusing the fluorescent x-rays towards the x-ray fluorescence detector.
摘要:
An x-ray source assembly includes an anode having a spot upon which electrons impinge based on power level supplied to the assembly, and an optic coupled to receive divergent x-rays generated at the spot and transmit output x-rays from the assembly. A control system is provided for maintaining intensity of the output x-rays dynamically during operation of the x-ray source assembly, notwithstanding a change in at least one operating condition of the x-ray source assembly, by changing the power level supplied to the assembly. The control system may include at least one actuator for effecting the change in the power level supplied to the assembly, by, e.g., controlling a power supply associated with the assembly. The control system may also change the temperature and/or the position of the anode to maintain the output intensity.
摘要:
A system comprising a novel combination of a multiple-channel monolithic capillary optic (44) and an x-ray source (30) with a spot size (42) of less than 300 microns to produce a high intensity small diameter x-ray beam is described. A system of this invention can be easily adapted for use in the analysis of small samples where an intense quasi-parallel, or converging x-ray beam is required.