Abstract:
For continuous-time multi-stage noise shaping analog-to-digital converters (CT MASH ADCs), quantization noise cancellation often requires accurate estimation of transfer functions, e.g., a noise transfer function of the front end modulator and a signal transfer function of the back end modulator. To provide quantization noise cancellation, digital quantization noise cancellation filters adaptively tracks transfer function variations due to integrator gain errors, flash-to-DAC timing errors, as well as the inter-stage gain and timing errors. Tracking the transfer functions is performed through the direct cross-correlation between the injected maximum length linear feedback shift registers (LFSR) sequence and modulator outputs and then corrects these non-ideal effects by accurately modeling the transfer functions with programmable finite impulse response (PFIR) filters.
Abstract:
This disclosure describes techniques and methodologies of using passive continuous time (CT) delay line for high-speed CT analog-to-digital converter (ADC) applications. In a continuous-time residual producing stage common to these CT ADCs, a proper delay between the analog input and DAC output is crucial. Specifically, using an inductor-capacitor (LC) lattice based delay element to enable high-performance CT pipeline ADC and CT delta-sigma (ΔΣ) ADC. The use of an LC lattice based delay element provides wide-band group delay for continuous-time signals with well-controlled impedance. This will be an essential circuit component to build a high-performance CT ADCs especially in architectures where the generation of a low-noise and low-distortion residual between the CT signal and its digitized version is needed. LC lattice based delay element enables noise-free, distortion-free wideband delay that is required for high speed continuous-time pipeline ADC and delta-sigma ADC.
Abstract:
This disclosure describes techniques and methodologies of using passive continuous time (CT) delay line for high-speed CT analog-to-digital converter (ADC) applications. In a continuous-time residual producing stage common to these CT ADCs, a proper delay between the analog input and DAC output is crucial. Specifically, using an inductor-capacitor (LC) lattice based delay element to enable high-performance CT pipeline ADC and CT delta-sigma (ΔΣ) ADC. The use of an LC lattice based delay element provides wide-band group delay for continuous-time signals with well-controlled impedance. This will be an essential circuit component to build a high-performance CT ADCs especially in architectures where the generation of a low-noise and low-distortion residual between the CT signal and its digitized version is needed. LC lattice based delay element enables noise-free, distortion-free wideband delay that is required for high speed continuous-time pipeline ADC and delta-sigma ADC.
Abstract:
The present disclosure describes an improved multi-stage noise shaping (MASH) analogto-digital converter (ADC) for converting an analog input signal to a digital output signal. In particular, a full delta-sigma (Δ∑) modulator is provided at the front-end of the MASH ADC, and another full Δ∑ modulator is provided at the back-end of the MASH ADC. The front-end Δ∑ modulator digitizes an analog input signal, and the back-end Δ∑ modulator digitizes an error between the output of the front-end Δ∑ modulator and the (original) analog input signal. In this configuration where the back-end modulator digitizes the error of the (full) front-end modulator, some design constraints of the front-end are relaxed. These design constraints include thermal noise, digital noise cancellation filter complexity (the quantization noise of the front-end is already shaped by the noise transfer function of the front-end), and/or non-linearity.
Abstract:
Digital-to-analog converters (DACs) are used widely in electronics. The DACs are usually not ideal and typically exhibits errors, e.g., static mismatch errors. This disclosure describes a digital calibration technique for DAC static mismatch in continuous-time delta-sigma modulators (CTDSMs). The methodology utilizes the DAC unit elements (UEs) themselves to measure each other's mismatch. There are no extra circuitries except for the logic design inside DAC drivers or comparators. The methodology is an attractive calibration technique for high performance CTDSMs, especially for high speed system in multi-gigahertz range with low over-sampling rate (OSR).
Abstract:
The present disclosure describes an improved multi-stage noise shaping (MASH) analogto-digital converter (ADC) for converting an analog input signal to a digital output signal. In particular, a full delta-sigma (Δ∑) modulator is provided at the front-end of the MASH ADC, and another full Δ∑ modulator is provided at the back-end of the MASH ADC. The front-end Δ∑ modulator digitizes an analog input signal, and the back-end Δ∑ modulator digitizes an error between the output of the front-end Δ∑ modulator and the (original) analog input signal. In this configuration where the back-end modulator digitizes the error of the (full) front-end modulator, some design constraints of the front-end are relaxed. These design constraints include thermal noise, digital noise cancellation filter complexity (the quantization noise of the front-end is already shaped by the noise transfer function of the front-end), and/or non-linearity.