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    VERFAHREN ZUR AUTHENTIZITÄTSPRÜFUNG VON WAREN
    2.
    发明公开
    VERFAHREN ZUR AUTHENTIZITÄTSPRÜFUNG VON WAREN 审中-公开
    方法商品真伪验证

    公开(公告)号：EP1839277A1

    公开(公告)日：2007-10-03

    申请号：EP05850046.3

    申请日：2005-12-14

    申请人： BASF AKTIENGESELLSCHAFT

    发明人： SENS, Rüdiger ,  THIEL, Erwin

    IPC分类号： G07D7/00

    CPC分类号： G07D7/004 ,  G07D7/20

    摘要： The invention relates to a method for checking the authenticity of goods, comprising marking and identifying the goods. According to the inventive method, (i) a mark is applied to the surface of an article in the form of a pattern with a pattern function M(x, y) in a marking step, said mark creating a local modification of the physically measurable properties of the surface of the article in the area of the mark which cannot be perceived by the eye; (ii) the transmission, reflection, or scattering of analytical radiation by the surface of the article is detected in accordance with the location coordinates (x, y) and the wavelength λ of the analytical radiation, a response function A(x, y, λ) that reflects the intensity of the transmitted, reflected, or scattered analytical radiation is determined in accordance with the local coordinates (x, y) and the wavelength λ, and the correlation of the response function A(x, y, λ) with the previously known pattern function M(x, y) is determined by means of a correlation analysis in an identification step, the mark being detected using the correlation.

    HOCHEMPFINDLICHES VERFAHREN ZUR DETEKTION VON UNTERSCHIEDEN ZWISCHEN DEN PHYSIKALISCH MESSBAREN EIGENSCHAFTEN EINER PROBE UND EINER REFERENZ
    3.
    发明公开
    HOCHEMPFINDLICHES VERFAHREN ZUR DETEKTION VON UNTERSCHIEDEN ZWISCHEN DEN PHYSIKALISCH MESSBAREN EIGENSCHAFTEN EINER PROBE UND EINER REFERENZ 有权
    高灵敏度方法检测样品和物理测量的性能基准间的差异

    公开(公告)号：EP1831669A1

    公开(公告)日：2007-09-12

    申请号：EP05850316.0

    申请日：2005-12-21

    申请人： BASF Aktiengesellschaft

    发明人： SENS, Rüdiger ,  THIEL, Erwin

    IPC分类号： G01N17/00 ,  G01J3/50

    CPC分类号： G01N17/004 ,  G01J3/50

    摘要： The invention relates to a high-sensitivity method for detecting differences between the physically measurable properties of a sample P and a reference R. Said method is characterized by carrying out the following steps: (i) providing a sample P, (ii) providing a reference sample R, (iii) providing a two-dimensional reference field RF, (iv) producing a first two-dimensional pattern from areas of reference sample R and reference field RF and a second two-dimensional pattern from areas of sample P and reference field RF, the first and the second pattern being described by a location-dependent and wavelength-dependent pattern function M(x, y, ?), (v) detecting, while using a detector, for the first pattern at a freely selectable point in time t0 and for the second pattern at a point in time t, the transmission, reflection or scattering of analytical radiation through the first pattern or the second pattern depending on the position coordinates (x, y) of the first or second pattern and the wavelength ? of the analytical radiation, thereby determining, for the first pattern, a first pattern response function M0(x, y, ?, t0), comprising spatially separate areas of a reference response function R0(x, y, ?, t0) and a first reference field response function RF0(x, y, ?, t0), determining, for the second pattern, a second pattern response function Mt(x, y, ?, t), comprising spatially separate areas of a sample response function Pt(x, y, ?, t) and a second reference field response function RFt(x, y, ?, t), the functions M0 and Mt each reflecting the intensity of the transmitted, reflected or scattered analytical radiation depending on the position coordinates (x, y) for the first or second pattern and the wavelength ? at different points in time of detection t0 or t, (vi) correcting the sample response function in such a manner that the location, time and wavelength-dependent variations caused by the detector are eliminated from the sample response function Pt, by using the first and second reference field response function RF0 and RFt, thereby obtaining a corrected sample response function Pt, korr, (vii) using the corrected sample response function Pt, korr and the reference response function R0 to determine a change in the physically measurable property.

    NAPHTHOLACTAMFARBSTOFFE
    10.
    发明公开
    NAPHTHOLACTAMFARBSTOFFE 失效

    公开(公告)号：EP0777704A1

    公开(公告)日：1997-06-11

    申请号：EP95929798.0

    申请日：1995-08-04

    申请人： BASF AKTIENGESELLSCHAFT

    发明人： GRUND, Clemens ,  SCHEFCZIK, Ernst ,  LAMM, Gunther ,  MERGER, Roland ,  SENS, Rüdiger

    IPC分类号： C07D401 ,  C07D495 ,  C09B57

    CPC分类号： C07D401/04 ,  C07D495/06 ,  C09B57/06

    摘要： The invention concerns naphtholactam derivatives of formula (I), in which: R1 represents hydrogen, optionally substituted C¿1?-C6 alkyl, C5-C6 cycloalkyl or substituted phenyl; R?2 and R3¿ represent hydrogen, C¿1?-C8 alkanoyl, optionally substituted benzoyl, optionally substituted C2-C4 alkyl, optionally substituted C2-C4 alkenyl, optionally substituted C2-C4 alkinyl, a halogen, nitro, sulphamoyl, optionally substituted hydroxy, optionally substituted mercapto, C1-C6 alkylsulphonyl or optionally substituted phenylsulphonyl; R?4¿ represents hydrogen or, with R3, a group of formula (II); R5 represents hydrogen or C¿1?-C6 alkyl; R?6¿ represents cyano, carbamoyl, C¿1?-C4 mono- or dialkylcarbamoyl, carboxyl or C1-C4 alkoxycarbonyl; and R?7¿ represents substituted C¿1?-C4 alkyl, optionally substituted C5-C13 alkyl or benzoyl. Also disclosed is the use of these derivatives for dyeing or printing textiles.

    摘要翻译： 本发明涉及式（I）的萘内酰胺衍生物，其中：R 1表示氢，任选取代的C 1 -C 6烷基，C 5 -C 6环烷基或取代的苯基; R 2和R 3代表氢，C 1 -C 8烷酰基，任选取代的苯甲酰基，任选取代的C 2 -C 4烷基，任选取代的C 2 -C 4烯基，任选取代的C 2 -C 4炔基，卤素，硝基，氨磺酰基 取代的羟基，任选取代的巯基，C 1 -C 6烷基磺酰基或任选取代的苯基磺酰基; R 4表示氢，或者与R 3一起表示式（II）的基团; R5代表氢或C1-C6烷基; R 6'代表氰基，氨基甲酰基，C 1 -C 4单或二烷基氨基甲酰基，羧基或C 1 -C 4烷氧基羰基; R 7'代表取代的C 1 -C 4烷基，任选取代的C 5 -C 13烷基或苯甲酰基。 还公开了这些衍生物用于染色或印花纺织品的用途。