OPTICAL MEMBER PROVIDED WITH ANTI-REFLECTION FILM
    1.
    发明公开
    OPTICAL MEMBER PROVIDED WITH ANTI-REFLECTION FILM 审中-公开
    具有抗REFLEX薄膜光学元

    公开(公告)号:EP3006969A4

    公开(公告)日:2016-06-08

    申请号:EP14807159

    申请日:2014-05-26

    Applicant: FUJIFILM CORP

    CPC classification number: G02B1/115 B32B7/02 B32B2307/412 G02B1/118 G02B3/0087

    Abstract: Provided is an optical member that is appropriate for manufacturing and is provided with an anti-reflection film with sufficient optical characteristics. An optical member (1) includes a transparent substrate (30) and an anti-reflection film (40) that is formed on a surface of the transparent substrate (30). The anti-reflection film (40) includes a refractive index gradient structure layer (10) of which a refractive index gradually becomes larger at a position closer to the transparent substrate (30) in a thickness direction, and an interference layer (20) which is disposed between the refractive index gradient structure layer (10) and the transparent substrate (30) in order to prevent light from being reflected by an interference effect. A refractive index of the transparent substrate (30) is different from a refractive index of the refractive index gradient structure layer (10) on a side closest to the transparent substrate. A refractive index of the interference layer (20) changes in the thickness direction, and has values which are discrete from both refractive indexes of the refractive index gradient structure layer (10) and the transparent substrate (30) at a boundary between the interference layer and the refractive index gradient structure layer and at a boundary between the interference layer and the transparent substrate, and a value thereof on a side close to the refractive index gradient structure layer is different from a value thereof on a side close to the transparent substrate.

    SEMICONDUCTOR LIGHT-EMITTING ELEMENT
    3.
    发明公开

    公开(公告)号:EP2819183A4

    公开(公告)日:2015-10-07

    申请号:EP13751177

    申请日:2013-02-08

    Applicant: FUJIFILM CORP

    CPC classification number: H01L33/46 H01L33/105 H01S5/18383

    Abstract: In a surface emission-type semiconductor light-emitting element including a DBR layer, a variation in light intensity due to a temperature change in the formation of a large number of elements manufactured from one wafer is suppressed while maintaining a light intensity enhancement effect. In the semiconductor light-emitting element that outputs emitted light having a predetermined emission peak wavelength », including at least a substrate 10, a lower distributed Bragg reflective layer 12 provided on the substrate 10, and a light-emitting layer 20 provided on a lower distributed Bragg reflective layer 12, the light-emitting layer 20 includes one or more sets of two active layers 22 arranged at a distance of (1+2m) »/4n in an inactive layer 21, » is the emission peak wavelength, n is a refractive index of the light-emitting layer 20, and m is an integer of 0 or greater.

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