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1.发明公开KONTAKT-ABSTANDSTRANSFORMER, ELEKTRISCHE PRÜFEINRICHTUNG SOWIE VERFAHREN ZUR HERSTELLUNG EINES KONTAKT-ABSTANDSTRANSFORMERS 审中-公开接触距离变压器，用于产生联系ABSTANDSTRANSFORMERS电气试验设备和方法
公开(公告)号：EP3126851A1
公开(公告)日：2017-02-08
申请号：EP15713895.9
申请日：2015-04-02
申请人： Feinmetall GmbH
发明人： EKIN, Cetin
IPC分类号： G01R1/04 , G01R31/28 , G01R1/073 , H01R12/71 , H01R12/91 , H05K3/12 , H05K3/46 , H05K1/16 , H05K1/11 , G01R1/067
CPC分类号： G01R1/07371 , G01R1/0491 , G01R1/06761 , G01R1/07342 , G01R1/07357 , G01R3/00 , G01R31/2889 , H01L21/67288 , H01R12/714 , H01R12/91 , H05K1/0296 , H05K1/112 , H05K1/162 , H05K1/165 , H05K1/167 , H05K3/1241 , H05K3/4038 , H05K3/4614 , H05K3/4664 , H05K3/4673 , H05K2201/0187 , H05K2201/09236 , H05K2201/09263 , H05K2201/10189 , H05K2201/10265 , H05K2201/1031 , H05K2201/10378 , H05K2203/0126 , H05K2203/159
摘要： The invention relates to a contact-distance transformer (4) of an electrical testing device (1) for testing an electrical test item (7), in particular wafers (8), said contact-distance transformer (4) being suitable for reducing the distance between electrical contacts (16, 19) arranged next to one another, and having a non-electrically conductive carrier structure (28) occupying a first side (17) and a second side (18), wherein first electrical contacts (16) are arranged on the first side (17) at a contact distance (a) to one another, and second electrical contacts (19) are arranged on the second side (18) at a smaller contact distance (b) to one another in relation to the first contacts (16) of the first side (17), wherein the first contacts (16) are connected to the second contacts (19) via electrical connections (20) which are passing through the carrier structure (28) and/or which are arranged on the carrier structure (28). According to the invention, both the carrier structure (28) and the electrical connections (20) are formed as 3D-printed components (27). The invention also relates to an electrical testing device (1), and a method for producing a contact-distance transformer (4).
摘要翻译： 电检测装置的电检体的检测的接触距离变压器：诸如晶片，用于降低邻近电触头之间的距离，具有带有第一侧与第一电接触的非导电性的支撑结构的变压器定位开的 第一距离和与第二电触点的第二侧面定位开的第二，较小的距离。 所述第一触点连接到通过穿过支撑结构和/或其中的电连接的第二触点在所述支撑结构被定位。
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