摘要:
An optical system configured to apply a relative phase modulation between two orthogonal polarization modes using a double pass configuration, wherein the system is configured to act independently on each polarization state.
摘要:
Apparatus for measuring light scattering of a sample comprising a light beam source, means for collimating the beam and making it impinge on the sample in a perpendicular direction, at least one light sensor, and at least one spatial filter between the sample and the optical sensor, provided with two apertures, means for measuring the total power reaching the sensor and means for measuring the power of beams with a low k vector after the beam traverses the filter. The invention provides thus a simplified, portable and compact device for measuring different parameters like haze, turbidity, etc. can be built, for any sample and without the need of changing detectors.
摘要:
The present invention relates to an apparatus for generating light pulses, comprising a laser device configured to output the light pulses and a pulse driver configured to supply electrical pulses to the laser device to drive the laser device. Furthermore, the pulse driver is configured to supply the electrical pulses with amplitudes/intensities obeying a pre-determined probability distribution to the laser device such that quadrature values of the light pulses obey another pre-determined probability distribution.
摘要:
The present invention relates to an image cytometer for capturing and analyzing the image of a sample in the momentum domain. The cytometer is provided with a light source for illuminating a sample with a light beam, an optical transforming system positioned behind the sample in the beam propagation direction for generating the Fourier transform in the space plane, a light sensor array and a spatially selective filter positioned with respect to the optical system such that the Fourier transform is imaged onto the light sensor array.
摘要:
The present inventions relates to a substrate for a photolithographic mask comprising a coating deposited on a rear surface of the substrate, wherein the coating comprises (a) at least one electrically conducting layer, and (b) wherein a thickness of the at least one layer is smaller than 30 nm, preferably smaller than 20 nm, and most preferably smaller than 10 nm.