摘要:
In a memory system comprising a plurality of memory units (10) each of which possesses unit-level error correction capabilities (20) and each of which are tied to a system level error correction function (30), memory reliability is enhanced by providing means for fixing the output of one of the memory units at a fixed value in response to the occurrence of an uncorrectable error in one of the memory units. This counter-intuitive approach to the generation of forced hard errors nonetheless enhances overall memory system reliability since it enables the employment of the complement/recomplement algorithm which depends upon the presence of reproducible errors for proper operation. Thus, chip level error correction systems, which are increasingly desirable at high packaging densities, are employed in a way which does not interfere with system level error correction methods.
摘要:
A reduced redundancy error correction and detection code is shown for memory organized with several bits of the data word on each chip. This package error correction and detection will correct all errors on any one chip and detect errors on more than one chip. A certain arrangement of an ECC matrix is first created for a symbol size code greater than the number of bits per chip. Thereafter certain columns of the matrix are removed to create the final code having a symbol size the same as the number of bits per chip. A specific example of an 80 bit code word is shown having 66 data bits and 14 check bits for a 4-bit-per-chip memory.
摘要:
A method and apparatus is provided for producing single width barcodes in a continuous, serpentine pattern. This pattern provides continuity of operation for laser marking instruments and thereby results in the formation of more uniform and higher quality barcode indicia. The use of a continuous serpentine pattern also increases the speed at which the code may be written onto a substrate. This marking method is particularly appropriate for use in marking a wide variety of materials including semiconductors, metals, plastics and ceramics.
摘要:
In a memory system comprising a plurality of memory units (10) each of which possesses unit-level error correction capabilities (20) and each of which are tied to a system level error correction function (30), memory reliability is enhanced by providing means (Fig. 2) for disabling the unit-level error correction capability, for example, in response to the occurrence of an uncorrectable error in one of the memory units. This counter-intuitive approach which disables an error correction function nonetheless enhances overall memory system reliability since it enables the employment of the complement/recomplement algorithm which depends upon the presence of reproducible errors for proper operation. Thus, chip level error correction systems, which are increasingly desirable at high packaging densities, are employed in a way which does not interfere with system level error correction methods.
摘要:
A single width bar code exhibiting inherent self clocking characteristics is provided so as to be particularly useful in the identification of semiconductor wafers in very large scale integrated circuit manufacturing processes. The codes described herein are robust, reliable and highly readable even in the face of relatively high variations in scanning speed. The codes are also desirably dense in terms of character representations per linear centimeter, an important consideration in semiconductor manufacturing wherein space on the chips and the wafer is at a premium. Additionally, a preferred embodiment of the present invention exhibits a minimum number for the maximum number of spaces between adjacent bars in code symbol sequences.
摘要:
An extended error code particularly applicable to a code that can correct any number of errors in one sub-field but can only detect the existence of any number of errors in two sub-fields. If the initial pass of the data through the error correction code indicates an uncorrected error, the data is complemented and restored in the memory and then reread. The retrieved data is recomplemented and again passed through the error correction code. If an uncorrected error persists, then a bit-by-bit comparision is performed between the originally read data and the retrieved complemented data to isolate the hard fails in the memory. The bits in the sub-field associated with the hard fail are then sequentially changed and then the changed data word is passed through the error correction code. A wrong combination is detected by the error correction code. The sequential changing continues until the bits in the sub-field associated with the hard fail match the originally stored data, in which case the error correction code can correct the remaining errors in the remaining sub-fields.
摘要:
An error correction coding system employs a single check symbol from an arbitrary sequence of information symbols to provide single error correction at the symbol level. The sequence of information symbols may in fact also be arbitrarily long. The coding system of the present invention provides both a method and apparatus for encoding the check symbol and a method and apparatus for error correction based upon the single coded symbol character. The system is particularly applicable for use in conjunction with bar code recognition systems but is in fact applicable to a broad range of coding systems, including optical character recognition and ordinary alphanumeric codes.
摘要:
Byte or symbol organized linear block codes are optimized in terms of reducing the number of ones in their parity check matrices by means of symbol column transformations carried out by multiplication by non-singular matrices. Each optimized symbol column preferably, and probably necessarily, includes a submatrix which is the identity matrix which contributes to low weight check matrices and also to simplified decoding procedures and apparatus. Since circuit cost and layout area are proportional to the number of Exclusive-OR gates which is determined by the number of ones in the check matrix, it is seen that the reduction procedures carried out in accordance with the present invention solve significant problems that are particularly applicable in the utilization of byte organized semiconductor memory systems. Reduced weight coding systems are also generated in accordance with weight reducing procedures used in conjunction with modified Reed Solomon codes. The decoding and encoding methods and apparatus are extendable to the inclusion of any number of check symbols.
摘要:
A reduced redundancy error correction and detection code is shown for memory organized with several bits of the data word on each chip. This package error correction and detection will correct all errors on any one chip and detect errors on more than one chip. A certain arrangement of an ECC matrix is first created for a symbol size code greater than the number of bits per chip. Thereafter certain columns of the matrix are removed to create the final code having a symbol size the same as the number of bits per chip. A specific example of an 80 bit code word is shown having 66 data bits and 14 check bits for a 4-bit-per-chip memory.