摘要:
A DRAM cell is dislosed which can compensate for the reduction of storage voltage caused by the threshold voltage loss of a cell transistor without using word line boost. The memory cell has a capacitor for charge pumping which is connected to a common junction between a MOS cell transistor and a cell capacitor which are connected in series. The other end of the charge pump capacitor is connected to a control line which is driven during writing so as to boost the storage voltage in the cell capacitor. When the cell transistor is PMOS, the control line is driven by a positive voltage pulse such that the storage voltage for a low level is boosted in negative direction.
摘要:
A data transfer system for DRAM operates in a burst transfer mode, wherein the OE line is employed to start the burst transfer mode with change of its potential as a start signal. The burst transfer toggles CAS or RAS to synchronize it with data output as if it were a clock signal. This eliminates the necessity to uniquely provide a clock circuit for the DRAM. In addition, OE maintains the function as a switch for determining whether or not data can be output as in the background art by switching the operation mode from the burst transfer mode. Thus, it maintains high compatibility with the conventional DRAM transfer system.
摘要:
A DRAM cell is dislosed which can compensate for the reduction of storage voltage caused by the threshold voltage loss of a cell transistor without using word line boost. The memory cell has a capacitor for charge pumping which is connected to a common junction between a MOS cell transistor and a cell capacitor which are connected in series. The other end of the charge pump capacitor is connected to a control line which is driven during writing so as to boost the storage voltage in the cell capacitor. When the cell transistor is PMOS, the control line is driven by a positive voltage pulse such that the storage voltage for a low level is boosted in negative direction.
摘要:
A sensing technique uses a variable precharge voltage sensing with a single bitline swing in a DRAM cell or array of DRAM cells so that the power dissipation is reduced. The bitline precharge voltage varies from one RAS cycle to the next RAS cycle depending upon the level of the data in the accessed cells. Such an arrangement eliminates the need for a reference voltage generator since the precharge voltage is not the same voltage for each RAS cycle.
摘要:
A sensing circuit for dynamic random access memory is disclosed including a pair of bitlines precharged to a first voltage before sensing. A sense amplifier circuit is provided having one node thereof being connected to an external power supply via a switching means including pulsed sense clocks. Control means is provided and is connected to the switching means for controlling the switching means such that the voltage of the power supply is coupled to the node of the sense amplifier for activation for a predetermined period of time, thereby limiting the swing for the high-going bitline to a second voltage lower than said power supply voltage and higher than said first voltage. The reduced bitline swings are achieved by means of the pulsed sense clocks and the pulse widths for sense clocks are determined by means of a reference bitlines connected to the control means.
摘要:
A sensing circuit for dynamic random access memory is disclosed including a pair of bitlines precharged to a first voltage before sensing. A sense amplifier circuit is provided having one node thereof being connected to an external power supply via a switching means including pulsed sense clocks. Control means is provided and is connected to the switching means for controlling the switching means such that the voltage of the power supply is coupled to the node of the sense amplifier for activation for a predetermined period of time, thereby limiting the swing for the high-going bitline to a second voltage lower than said power supply voltage and higher than said first voltage. The reduced bitline swings are achieved by means of the pulsed sense clocks and the pulse widths for sense clocks are determined by means of a reference bitlines connected to the control means.
摘要:
A sensing technique uses a variable precharge voltage sensing with a single bitline swing in a DRAM cell or array of DRAM cells so that the power dissipation is reduced. The bitline precharge voltage varies from one RAS cycle to the next RAS cycle depending upon the level of the data in the accessed cells. Such an arrangement eliminates the need for a reference voltage generator since the precharge voltage is not the same voltage for each RAS cycle.
摘要:
A DRAM system that can prevent a substantial reduction in bandwidth with respect to a clock pulse frequency even when banks are accessed in no specific order so that a seamless operation is assured not only for reading but also for writing. A prefetch mechanism is used for reading and writing data to a separate memory array at an early stage, so that the activation and precharge operation, which must be performed before reading the next set of data from the memory array, does not affect nor cause any deterioration of access speed. The amount of data prefetched is twice as much as that fetched in the period represented by an array time constant so that in a single bank structure a seamless operation can be performed both for reading and for writing, even when row accesses are performed.
摘要:
A DRAM system that can prevent a substantial reduction in bandwidth with respect to a clock pulse frequency even when banks are accessed in no specific order so that a seamless operation is assured not only for reading but also for writing. A prefetch mechanism is used for reading and writing data to a separate memory array at an early stage, so that the activation and precharge operation, which must be performed before reading the next set of data from the memory array, does not affect nor cause any deterioration of access speed. The amount of data prefetched is twice as much as that fetched in the period represented by an array time constant so that in a single bank structure a seamless operation can be performed both for reading and for writing, even when row accesses are performed.
摘要:
A DRAM macro cell 14 integrated together with a logic cell on the same chip comprises a guard ring 26 surrounding the memory forming area, memory cell arrays 42, a power supply line 34, a ground line 36, additional ground lines 38, and by-pass capacitors 70 connected between the power supply line 34 and the ground line 36. The power supply line 34 is connected to a power supply pad different from the power supply pad to which the power supply line of the logic cell is connected, and the ground line 36 and the ground line of the logic cell are connected to common ground pads or proximate grounding pads interconnected by low-impedance lines. The additional ground lines 38 are connected to the substrate to stabilize substrate potential. This provides a high-density semiconductor integrated circuit device which is reliable and enables high-speed operation by forming DRAM macro cells and logic cell on the same chip.