摘要:
A circuit and method for correcting a sense signal of a sensor (100) where the sense signal is reduced by a negative nonlinear error component introduced by membrane stress in a sensor structure (101). A first transducer (103) is disposed at a location (203) having substantial bending stress to produce a sense signal having a linear component and the nonlinear error component. A second transducer (102) is disposed at a location (202) with substantially zero bending stress to produce a sense signal having the nonlinear error component but a substantially zero linear component. The sense signal from the second transducer (102) is added to the sense signal from the first transducer (103) to correct the nonlinear error for producing a linear output sense signal (V OUT ) of the sensor (100) which is representative of the physical condition.
摘要:
A method and a structure for terminating or endpointing an electrochemical etch that allows integration of a sensor circuit (16 1 ) with a diaphragm (14 1 ). The addition of a sensor diode (41 1 ) and a bias diode (51 1 ) block current from the sensor circuit (16 1 ) from interfering with the reverse bias current in a diaphragm diode (15 1 ). The reverse bias current in the diaphragm diode (15 1 ) is used to determine when to terminate the etch that controls the thickness of diaphragm (14 1 ). The diaphragm (14 1 ) is a portion of a semiconductor material that remains after an electrochemical etch.
摘要:
A three state gate having an output capable of assuming an active high, an active low, or a high impedance state is disclosed that has circuitry for removing the inherent Miller capacitive charge from an output transistor during the high impedance state. A phase-splitter means is responsive to an input signal and an output enable signal and drives a push-pull output means. The circuitry for removing the capacitive charge maintains a node in said phase-splitting portion at substantially the same voltage whether the tri-state gate is providing a high impedance output or an active low output so that transitions between said impedance output and said active low output can occur at a faster rate.
摘要:
A method and a structure for terminating or endpointing an electrochemical etch that allows integration of a sensor circuit (16 1 ) with a diaphragm (14 1 ). The addition of a sensor diode (41 1 ) and a bias diode (51 1 ) block current from the sensor circuit (16 1 ) from interfering with the reverse bias current in a diaphragm diode (15 1 ). The reverse bias current in the diaphragm diode (15 1 ) is used to determine when to terminate the etch that controls the thickness of diaphragm (14 1 ). The diaphragm (14 1 ) is a portion of a semiconductor material that remains after an electrochemical etch.
摘要:
A piezoresistive pressure sensor (30) has four resistive diffused regions (32) coupled into a bridge configuration (33) with four junctions (36). Each of the diffused regions has a first end connected to one of the four junctions and a second end connected to a different one of the four junctions. There are four contact diffusion terminals (34) disposed in contact with the bridge configuration, and each of the diffusion terminals is disposed at one of the four junctions such that the diffused regions are electrically connected essentially only by the contact diffusion terminals. Thus, no tap is required to electrically connect the contact diffusion terminals to the resistive diffused regions of the bridge, which results in increased sensor sensitivity.
摘要:
A method of etching a semiconductor wafer (20) includes providing a wafer (20) having a portion thereof to be etched. A highly doped region is formed in the periphery (24) of the wafer (20) which is subsequently etched. The highly doped region of the wafer (20) is substantially etch resistant to an etchant relative to the portion of the wafer (20) being etched.
摘要:
A circuit and method for correcting a sense signal of a sensor (100) where the sense signal is reduced by a negative nonlinear error component introduced by membrane stress in a sensor structure (101). A first transducer (103) is disposed at a location (203) having substantial bending stress to produce a sense signal having a linear component and the nonlinear error component. A second transducer (102) is disposed at a location (202) with substantially zero bending stress to produce a sense signal having the nonlinear error component but a substantially zero linear component. The sense signal from the second transducer (102) is added to the sense signal from the first transducer (103) to correct the nonlinear error for producing a linear output sense signal (V OUT ) of the sensor (100) which is representative of the physical condition.
摘要:
A monolithically integrated logic circuit is provided that is programmed by an optical input. A plurality of input/output pads 22 are provided on a semiconductor substrate 21 having a planar surface. A plurality of semiconductor devices 29 and a plurality of light sensitive devices 25, 31 are formed with selected patterns in the surface. At least one metallic layer is formed on the substrate for coupling selected ones of the semiconductor devices, light sensitive devices, and input/output pads for forming a logic circuit, wherein an output of the logic circuit is determined by programming selected ones of the plurality of light sensitive devices by applying light thereto.