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17 条记录 (耗时 0.016 秒)

    ACTUATOR MODULE FOR ACTUATING A LOAD
    1.
    发明公开
    ACTUATOR MODULE FOR ACTUATING A LOAD 审中-公开
    AKTUATORMODUL ZUR ANSTEUERUNG EINER LAST

    公开(公告)号：EP3126849A1

    公开(公告)日：2017-02-08

    申请号：EP15719859.9

    申请日：2015-03-31

    申请人： Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO

    发明人： WITVOET, Gerrit ,  VAN DEN DOOL, Teunis Cornelis ,  CROWCOMBE, William Edward ,  DE LANGE, Theodorus Jacobus ,  PEREBOOM, Hajo Pieter

    IPC分类号： G01Q10/04 ,  G01Q30/04 ,  H01L41/053 ,  H02N2/02

    摘要： The disclosure concerns an actuator module (10) for actuating a load (14). The actuator module (10) comprises a deformable frame (1) and an actuator (2) connected to the deformable frame (1). A time-varying force distribution (F) couples to an excited state (V0) of an eigenmode (V) of the deformable frame (1). The force distribution (F), as well as a stiffness distribution (K) and/or mass distribution (M) of the deformable frame 1 are adapted such that static nodal points (11s) of the deformable frame 1 are coincided with mode nodal points (11m). The locations where the nodal points coincide can be used to connect the actuator module (10) to a base frame to reduce transfer of vibrations to the base frame and back which may otherwise undesirably influence the transfer function from actuator to load. The disclosure further concerns a method for designing and/or manufacturing the actuator module.

    摘要翻译： 本公开涉及用于致动负载（14）的致动器模块（10）。 致动器模块（10）包括可变形框架（1）和连接到可变形框架（1）的致动器（2）。 时变力分布（F）耦合到可变形框架（1）的本征模（V）的激发态（V0）。 可变形框架1的力分布（F）以及刚度分布（K）和/或质量分布（M）适于使得可变形框架1的静态节点（11s）与模式节点 （11米）。 节点重合的位置可以用于将致动器模块（10）连接到基架，以减少振动传递到基架和背部，否则可能会不利地影响从致动器到负载的传递功能。 本发明还涉及用于设计和/或制造致动器模块的方法。

    HIGH POWER ADAPTIVE MIRROR
    5.
    发明公开
    HIGH POWER ADAPTIVE MIRROR 审中-公开

    公开(公告)号：EP3391120A1

    公开(公告)日：2018-10-24

    申请号：EP16825578.4

    申请日：2016-12-16

    申请人： Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO

    发明人： VAN ZWET, Erwin John ,  VAN DEN DOOL, Teunis Cornelis ,  NIEUWKOOP, Evert

    IPC分类号： G02B26/06 ,  G02B26/08

    CPC分类号： G02B26/0825 ,  G02B26/06 ,  G02B26/0841 ,  G02B26/0866

    摘要： According to an aspect of the invention, there is provided a mirror structure for adaptive optics devices, characterized in that it comprises: an elastically deformable layer in response to an applied force, said deformable layer comprising a central portion reflective to said an incident light beam (F); a support substrate positioned spaced with respect to said deformable layer; a spacer element connected to said elastically deformable layer and support substrate and positioned there between, said spacer element being arranged so that the separation distance between said first and second inner surface is in the range between 2 and 100 micron; an inner chamber at least partially defined by said first and substrate and by said spacer element, said inner chamber containing a pressurized gas (G); an actuator system capable of causing a deformation of said central portion counteracting the pressure of said pressurized gas; wherein, in use, said central portion is deformed according to profiles such as to control said light beam. Advantages may include thermal robustness and improved dimensional scaling properties.

    AN INSTRUMENT FOR MINIMALLY INVASIVE SURGERY
    9.
    发明授权
    AN INSTRUMENT FOR MINIMALLY INVASIVE SURGERY 有权
    一种微创外科手术器械

    公开(公告)号：EP2291124B1

    公开(公告)日：2017-07-05

    申请号：EP09755089.1

    申请日：2009-05-29

    申请人： Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO ,  Vleugels Holding B.V.

    发明人： VAN DEN DOOL, Teunis Cornelis ,  KRAMER, Geerten Frans Ijsbrand ,  TABAK, Erik ,  ODERWALD, Michiel Peter

    IPC分类号： A61B17/00

    CPC分类号： A61B17/29 ,  A61B2017/2939 ,  A61B2017/294 ,  A61B2090/065

    摘要： The invention relates to an instrument, preferably for minimally invasive surgery, comprising a frame (27) having a proximal end and a distal end, a first working element (4) having a first origin located at the distal end and a second working element (5) having a second origin and being arranged at the distal end cooperating with the first working element, a force sensor for measuring a force exerted on at least one of the said the first and the second working elements, wherein the distal end of the frame comprises an opening (23) between the first origin and the second origin, the force sensor being arranged on the frame in a vicinity of the opening.

    摘要翻译： 本发明涉及一种优选用于微创手术的器械，其包括具有近端和远端的框架（27），具有位于远端的第一原点的第一工作元件（4）和位于远端的第二工作元件（ 5）具有第二原点并且布置在与第一工作元件配合的远端处;力传感器，用于测量施加在所述第一工作元件和第二工作元件中的至少一个上的力，其中，框架的远端 包括位于所述第一原点和所述第二原点之间的开口（23），所述力传感器布置在所述框架上的所述开口附近。

    METHOD OF ADVANCING A PROBE TIP OF A SCANNING MICROSCOPY DEVICE TOWARDS A SAMPLE SURFACE, AND DEVICE THEREFORE
    10.
    发明公开
    METHOD OF ADVANCING A PROBE TIP OF A SCANNING MICROSCOPY DEVICE TOWARDS A SAMPLE SURFACE, AND DEVICE THEREFORE 审中-公开
    方法背着GRID观察装置的探头尖端的探针的表面及其装置的方向

    公开(公告)号：EP3137912A1

    公开(公告)日：2017-03-08

    申请号：EP15724785.9

    申请日：2015-04-28

    申请人： Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO

    发明人： SADEGHIAN MARNANI, Hamed ,  KRAMER, Geerten Frans Ijsbrand ,  VAN DEN DOOL, Teunis Cornelis

    IPC分类号： G01Q10/06

    CPC分类号： G01Q10/06 ,  B82Y35/00

    摘要： The invention is directed at a method of advancing a probe tip of a probe of a scanning microscopy device towards a sample surface. The scanning microscopy device comprises the probe for scanning the sample surface for mapping nanostructures on the sample surface. The probe tip of the probe is mounted on a cantilever arranged for bringing the probe tip in contact with the sample surface. The method comprises controlling, by a controller, an actuator system of the device for moving the probe to the sample surface, and receiving, by the controller, a sensor signal indicative of at least one operational parameter of the probe for providing feedback to perform said controlling. The method further comprises maintaining, during said controlling, an electric field between the sample surface and the probe tip, and evaluating the sensor signal indicative of the at least one operational parameter for determining an influence on said probe by said electric field, for determining proximity of the sample surface relative to the probe tip. The invention is further directed at a scanning microscopy device comprising a probe for scanning a sample surface for mapping nanostructures thereon.

    摘要翻译： 本发明在向样品表面推进扫描显微镜装置的探针的探针尖端的方法定向。 扫描显微镜设备包括探针，用于扫描用于映射的纳米结构的样品表面在样品表面上。 探头的探头端部被安装在布置用于使探头尖端与样品表面接触的悬臂。 该方法包括控制，由控制器，所述设备的致动器系统的试验，用于移动到样品表面上，并接收由所述控制器，传感器信号指示所述探针的至少一个操作参数的用于提供反馈以执行所述 控制。 该方法还包括维护，在此期间所述控制，在样品表面和所述探头末端之间的电场，并且指示用于在所述探针通过所述电场的影响确定性挖掘的所述至少一个操作参数的传感器信号评估，用于确定性采矿接近 的相对于所述探针针尖在样品表面上。 本发明还涉及在扫描显微镜设备包括探针用于扫描样品表面用于在其上映射的纳米结构。