摘要:
A substrate holding device is equipped with a substrate holder (WH) that adsorbs and holds a substrate (W), and a plurality of vertical movement pin units (34 1 , 34 2 , 34 3 ) that each have, at one end, an adsorption section to adsorb a rear surface of the substrate, and are movable relative to the substrate holder (WH) in a state of adsorbing the rear surface of the substrate (W) with the adsorption section. The plurality of vertical movement pin units (34 1 , 34 2 , 34 3 ) each have at least part including the adsorption section that is displaced in at least one direction, by an action of a force received from the adsorbed substrate (W).
摘要:
An exposure apparatus for exposing a substrate with an illumination light via a projection optical system and a liquid comprises a nozzle member (32), an alignment system (AL1), a mask stage system having a first stage (RST), a base member (12) disposed below the projection optical system, a substrate stage system having a second stage (WST) and a third stage (MST) that are disposed on the base member, a measurement system having a plurality of heads arranged for respectively irradiating a plurality of scale members, and a controller configured to control the first and the second drive systems so that, in an exposure operation of the substrate, scanning exposure in which the mask and the substrate are each moved relative to the illumination light is performed.
摘要:
During the drive of a stage (WST), positional information in a movement plane of the stage (WST) is measured by three encoders (Encl, Enc2, and Enc3) that include at least one each of an X encoder and a Y encoder of an encoder system, and a controller switches the encoders used for a measurement of positional information of the stage (WST) in the movement plane from the encoders (Encl, Enc2, and Enc3) to encoders (Enc4, Enc2, and Enc3) so that the position of the stage (WST) in the movement plane is maintained before and after the switching. Therefore, although the switching of the encoders used for controlling the position of the stage is performed, the position of the stage in the movement plane is maintained before and after the switching, and a correct linkage becomes possible.
摘要:
An exposure apparatus is equipped with an encoder system which measures positional information of a wafer stage (WST1) by irradiating a measurement beam using four heads (60 1 to 60 4 ) installed on the wafer stage (WST1) on a scale plate (21) which covers the movement range of the wafer stage (WST1) except for the area right under a projection optical system (PL). Placement distances (A, B) of the heads (60 1 to 60 4 ) here are each set to be larger than width (a i , b i ) of the opening of the scale plates (21), respectively. This allows the positional information of the wafer stage to be measured, by switching and using the three heads facing the scale plate out of the four heads according to the position of the wafer stage.
摘要:
A drive device drives a wafer stage in a Y-axis direction based on a measurement value of an encoder (62A) that measures position information of the wafer stage in the Y-axis direction and based on information on the flatness of a scale (39Y 1 ) that is measured by the encoder. In this case, the drive device can drive the wafer stage in a predetermined direction based on a measurement value after correction in which a measurement error caused by the flatness of the scale included in the measurement value of the encoder is corrected based on the information on the flatness of the scale. Accordingly, the wafer stage can be driven with high accuracy in a predetermined direction using the encoder, without being affected by the unevenness of the scale.
摘要:
During the drive of a stage (WST), positional information in a movement plane of the stage (WST) is measured by three encoders (Enc1 Enc2, and Enc3) that include at least one each of an X encoder and a Y encoder of an encoder system, and a controller switches the encoders used for a measurement of positional information of the stage (WST) in the movement plane from the encoders (Enc1 Enc2, and Enc3) to encoders (Enc4, Enc2, and Enc3) so that the position of the stage (WST) in the movement plane is maintained before and after the switching. Therefore, although the switching of the encoders used for controlling the position of the stage is performed, the position of the stage in the movement plane is maintained before and after the switching, and a correct linkage becomes possible.
摘要:
When a transition from a first state where one stage (WST1 (or WST2)) is positioned at a first area directly below projection optical system (PL) to which liquid (Lq) is supplied to a state where the other stage (WST2 (or WST1)) is positioned at the first area, both stages are simultaneously driven while a state where both stages are close together in the X-axis direction is maintained. Therefore, it becomes possible to make a transition from the first state to the second state in a state where liquid is supplied in the space between the projection optical system and the specific stage directly under the projection optical system. Accordingly, the time from the completion of exposure operation on one stage side until the exposure operation begins on the other stage side can be reduced, which allows processing with high throughput. Further, because the liquid can constantly exist on the image plane side of the projection optical system, generation of water marks on optical members of the projection optical system on the image plane side is prevented.
摘要:
A drive device drives a wafer stage (WST) in a Y-axis direction based on a measurement value of an encoder (62A) that measures position information of the wafer stage in the Y-axis direction and based on information on the flatness of a scale (39Y 1 ) that is measured by the encoder. In this case, the drive device can drive the wafer stage in a predetermined direction based on a measurement value after correction in which a measurement error caused by the flatness of the scale included in the measurement value of the encoder is corrected based on the information on the flatness of the scale. Accordingly, the wafer stage can be driven with high accuracy in a predetermined direction using the encoder, without being affected by the unevenness of the scale.
摘要:
An exposure apparatus that has an illumination optical system configured to illuminate a mask with illumination light and a projection optical system configured to project a pattern image of the mask onto a substrate, and is configured to perform a scanning exposure of the substrate by moving each of the mask and the substrate relative to the illumination light, the apparatus comprising: a first base member arranged above the projection optical system and having a first opening section through which the illumination light is arranged to pass; a first stage system that has a slider, a movable member and a first drive system, the slider being arranged on the first base member, the slider having a second opening section through which the illumination light is arranged to pass and a support member for supporting the mask in the second opening section, the movable member being arranged on the first base member and being provided with the slider inside, the first drive system having a first motor and being configured to move the slider inside the movable member, and the first motor having a movable element provided at the slider and a stator provided at the movable member; a second base member arranged below the projection optical system; a second stage system that has a stage and a second drive system, the stage being arranged on the second base member and having a holder for holding the substrate, the second drive system having a second motor configured to drive the stage, and the second drive system being configured to move the stage on the second based member; and a controller configured to control the first and the second drive systems so that the mask and the substrate are each moved relative to the illumination light in a first direction orthogonal to an optical axis of the projection optical system, during the scanning exposure, wherein the movable member can be moved by a reaction force generated by a movement of the slider by the first drive system.